1
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Hönicke P, Wählisch A, Unterumsberger R, Beckhoff B, Bogdanowicz J, Charley AL, Mertens H, Rochat N, Hartmann JM, Giambacorti N. Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam. NANOTECHNOLOGY 2024; 35:285702. [PMID: 38579688 DOI: 10.1088/1361-6528/ad3aff] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/07/2023] [Accepted: 04/05/2024] [Indexed: 04/07/2024]
Abstract
Spatially resolved x-ray fluorescence (XRF) based analysis employing incident beam sizes in the low micrometer range (μXRF) is widely used to study lateral composition changes of various types of microstructured samples. However, up to now the quantitative analysis of such experimental datasets could only be realized employing adequate calibration or reference specimen. In this work, we extent the applicability of the so-called reference-free XRF approach to enable reference-freeμXRF analysis. Here, no calibration specimen are needed in order to derive a quantitative and position sensitive composition of the sample of interest. The necessary instrumental steps to realize reference-freeμXRF are explained and a validation of ref.-freeμXRF against ref.-free standard XRF is performed employing laterally homogeneous samples. Finally, an application example from semiconductor research is shown, where the lateral sample features require the usage of ref.-freeμXRF for quantitative analysis.
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Affiliation(s)
- Philipp Hönicke
- Physikalisch-Technische Bundesanstalt (PTB) Abbestr. 2-12 D-10587 Berlin, Germany
| | - André Wählisch
- Physikalisch-Technische Bundesanstalt (PTB) Abbestr. 2-12 D-10587 Berlin, Germany
| | | | - Burkhard Beckhoff
- Physikalisch-Technische Bundesanstalt (PTB) Abbestr. 2-12 D-10587 Berlin, Germany
| | | | | | | | - Névine Rochat
- Univ. Grenoble Alpes CEA, Leti F-38000 Grenoble, France
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2
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Saadeh Q, Naujok P, Wu M, Philipsen V, Thakare D, Scholze F, Buchholz C, Stadelhoff C, Wiesner T, Soltwisch V. Nested Sampling aided determination of tantalum optical constants in the EUV spectral range. APPLIED OPTICS 2022; 61:10032-10042. [PMID: 36606836 DOI: 10.1364/ao.472556] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/09/2022] [Accepted: 10/19/2022] [Indexed: 06/17/2023]
Abstract
We report on determining the optical constants of Ta in the sub-extreme ultraviolet (EUV) spectral range 5.0-24.0 nm from the angle-dependent reflectance (ADR) measured using monochromatized synchrotron radiation. Two sputtered samples with differing thicknesses were investigated. Complementarily x-ray reflectance was measured at shorter wavelengths and evaluated by Fourier transform to facilitate an unambiguous selection of a model for the data evaluation based on an inverse solution of the Fresnel's equations for a layered system. Bayesian inferences coupled with a Nested Sampling (NS) algorithm were utilized to derive the optical constants with their corresponding uncertainties. This report further emphasizes the applicability of an acclaimed NS algorithm on a high-dimensional inverse problem. We explore the possibility of addressing the correlations between the optical constants of thin films and their structural parameters based on other established studies.
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3
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Azuma Y, Kurokawa A. Development of x-ray reflectivity measurement system under N 2 to prevent surface contamination. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2020; 91:075112. [PMID: 32752824 DOI: 10.1063/5.0008877] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/25/2020] [Accepted: 06/28/2020] [Indexed: 06/11/2023]
Abstract
In this study, a method to prevent surface contamination on an SiO2 film/Si substrate system was used to improve thickness determination by x-ray reflectometry (XRR). XRR profiles can be significantly affected by the growth of a surface contamination layer, originating from the organic matter present in the measurement environment. An N2 spray method that enables XRR measurement under high-purity N2 has been developed to keep the surface free of contaminants. The method was adopted due to its high applicability to an existing XRR instrument and the ease of system construction. The system mainly consists of an outlet for N2 spray that is positioned in front of the sample and an N2 gas purifier. The high-purity N2 is sprayed on the sample until the measurements are complete. It was revealed that the measured XRR profiles were stable for 115 h, and the evaluated thicknesses were obtained with high reproducibility (±0.05 nm for 10 nm thickness) by adopting the analysis model for clean surfaces.
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Affiliation(s)
- Yasushi Azuma
- Research Institute for Material and Chemical Measurement, National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Ibaraki 305-8565, Japan
| | - Akira Kurokawa
- Research Institute for Material and Chemical Measurement, National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Ibaraki 305-8565, Japan
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5
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Pflüger M, Soltwisch V, Probst J, Scholze F, Krumrey M. Grazing-incidence small-angle X-ray scattering (GISAXS) on small periodic targets using large beams. IUCRJ 2017; 4:431-438. [PMID: 28875030 PMCID: PMC5571806 DOI: 10.1107/s2052252517006297] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/03/2017] [Accepted: 04/26/2017] [Indexed: 06/07/2023]
Abstract
Grazing-incidence small-angle X-ray scattering (GISAXS) is often used as a versatile tool for the contactless and destruction-free investigation of nano-structured surfaces. However, due to the shallow incidence angles, the footprint of the X-ray beam is significantly elongated, limiting GISAXS to samples with typical target lengths of several millimetres. For many potential applications, the production of large target areas is impractical, and the targets are surrounded by structured areas. Because the beam footprint is larger than the targets, the surrounding structures contribute parasitic scattering, burying the target signal. In this paper, GISAXS measurements of isolated as well as surrounded grating targets in Si substrates with line lengths from 50 µm down to 4 µm are presented. For the isolated grating targets, the changes in the scattering patterns due to the reduced target length are explained. For the surrounded grating targets, the scattering signal of a 15 µm × 15 µm target grating structure is separated from the scattering signal of 100 µm × 100 µm nanostructured surroundings by producing the target with a different orientation with respect to the predominant direction of the surrounding structures. As virtually all litho-graphically produced nanostructures have a predominant direction, the described technique allows GISAXS to be applied in a range of applications, e.g. for characterization of metrology fields in the semiconductor industry, where up to now it has been considered impossible to use this method due to the large beam footprint.
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Affiliation(s)
- Mika Pflüger
- Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany
| | - Victor Soltwisch
- Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany
| | - Jürgen Probst
- Helmholtz-Zentrum Berlin (HZB), Albert-Einstein-Straße 15, 12489 Berlin, Germany
| | - Frank Scholze
- Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany
| | - Michael Krumrey
- Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany
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7
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Shard AG, Havelund R, Spencer SJ, Gilmore IS, Alexander MR, Angerer TB, Aoyagi S, Barnes JP, Benayad A, Bernasik A, Ceccone G, Counsell JDP, Deeks C, Fletcher JS, Graham DJ, Heuser C, Lee TG, Marie C, Marzec MM, Mishra G, Rading D, Renault O, Scurr DJ, Shon HK, Spampinato V, Tian H, Wang F, Winograd N, Wu K, Wucher A, Zhou Y, Zhu Z. Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study. J Phys Chem B 2015. [DOI: 10.1021/acs.jpcb.5b05625] [Citation(s) in RCA: 48] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Affiliation(s)
- Alexander G. Shard
- National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Rasmus Havelund
- National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Steve J. Spencer
- National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Ian S. Gilmore
- National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Morgan R. Alexander
- Laboratory
of Biophysics and Surface Analysis, University of Nottingham, Nottingham NG7 2RD, United Kingdom
| | - Tina B. Angerer
- Department
of Chemistry and Molecular Biology, University of Gothenburg, Gothenburg 40530, Sweden
| | - Satoka Aoyagi
- Department
of Materials and Life Science, Seikei University, Tokyo 180-8633, Japan
| | - Jean-Paul Barnes
- Université Grenoble Alpes, F-38000 Grenoble, France
- CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
| | - Anass Benayad
- Université Grenoble Alpes, F-38000 Grenoble, France
- CEA-LITEN/DTNM, F-38054 Grenoble, France
| | - Andrzej Bernasik
- AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Kraków, Poland
| | - Giacomo Ceccone
- Institute for Health and Consumer Protection, Via E. Fermi 2749, TP125, 21027 Ispra (VA), Italy
| | | | - Christopher Deeks
- Thermo Fisher Scientific, East
Grinstead, West Sussex RH19 1UB, United Kingdom
| | - John S. Fletcher
- Department
of Chemistry and Molecular Biology, University of Gothenburg, Gothenburg 40530, Sweden
| | - Daniel J. Graham
- Department
of Bioengineering, University of Washington, Seattle, Washington 98195, United States
| | - Christian Heuser
- Faculty
of Physics, University Duisburg-Essen, Lotharstraße 1, 47048 Duisburg, Germany
| | - Tae Geol Lee
- Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu, Daejeon 305-340, Republic of Korea
| | - Camille Marie
- Université Grenoble Alpes, F-38000 Grenoble, France
- CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
| | - Mateusz M. Marzec
- AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Kraków, Poland
| | - Gautam Mishra
- Corporate
Research Analytical Laboratory (CRAL), 3M Deutschland GmbH, Carl-Schurz-Straße
1, Neuss 41460, Germany
| | - Derk Rading
- ION-TOF GmbH, Heisenberg Straße
15, D-48149 Münster, Germany
| | - Olivier Renault
- Université Grenoble Alpes, F-38000 Grenoble, France
- CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
| | - David J. Scurr
- Laboratory
of Biophysics and Surface Analysis, University of Nottingham, Nottingham NG7 2RD, United Kingdom
| | - Hyun Kyong Shon
- Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu, Daejeon 305-340, Republic of Korea
| | - Valentina Spampinato
- Istituto di Fisica dei Plasmi, Consiglio Nazionale delle Ricerche, Via R. Cozzi 53, 20125 Milano, Italy
| | - Hua Tian
- Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, United States
| | - Fuyi Wang
- CAS
Key Laboratory of Analytical Chemistry for Living Biosystems, Chinese Academy of Sciences, Beijing 100190, China
| | - Nicholas Winograd
- Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, United States
| | - Kui Wu
- CAS
Key Laboratory of Analytical Chemistry for Living Biosystems, Chinese Academy of Sciences, Beijing 100190, China
| | - Andreas Wucher
- Faculty
of Physics, University Duisburg-Essen, Lotharstraße 1, 47048 Duisburg, Germany
| | - Yufan Zhou
- EMSL, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
| | - Zihua Zhu
- EMSL, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
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8
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Wernecke J, Okuda H, Ogawa H, Siewert F, Krumrey M. Depth-Dependent Structural Changes in PS-b-P2VP Thin Films Induced by Annealing. Macromolecules 2014. [DOI: 10.1021/ma500642d] [Citation(s) in RCA: 32] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/28/2023]
Affiliation(s)
- Jan Wernecke
- Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany
| | - Hiroshi Okuda
- Department
of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyoku, Kyoto, 606-8501, Japan
| | - Hiroki Ogawa
- SPring-8, Japan Synchrotron Radiation Research Institute , 1-1-1, Kouto,
Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
| | - Frank Siewert
- Institute
Nanometre Optics and Technology, Helmholtz Zentrum Berlin (HZB), Albert-Einstein-Strasse 15, 12489 Berlin, Germany
| | - Michael Krumrey
- Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany
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