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For: Murdey R, Sato N. Voltage stress induced reversible diode behavior in pentacene thin films. J Chem Phys 2012;137:234703. [DOI: 10.1063/1.4770003] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
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