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Ji S, Guo J, Li Z, Tong L, Guo J, Liu J, Deng Y, Liu C, Sun Z, Chen X, Gao C, Liu F, Feng M, Fu X. Development of a femtosecond analytical electron microscopy based on a Schottky field emission transmission electron microscope. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2025; 96:033701. [PMID: 40029127 DOI: 10.1063/5.0226913] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/05/2024] [Accepted: 02/10/2025] [Indexed: 03/05/2025]
Abstract
Ultrafast transmission electron microscopy (UTEM) has gained wide applications in the nanoscale dynamics with femtosecond, even attosecond, resolution. The instrument development is still in progress to satisfy the various applications. At Nankai University, we built an UTEM with a laser-driven Schottky field emitter based on a field emission TEM (Talos200i) of Thermo Fisher Scientific. This study comprehensively examines the performance of the UTEM, including the continuous mode and ultrafast photoemission mode. The investigation focuses on optimizing brightness, temporal resolution, energy dispersion, and stability in ultrafast photoemission mode, achieving a temporal resolution of ∼200 fs and an energy dispersion of 0.7 eV with excellent stability through careful adjustments of laser parameters and equipment settings. In scanning transmission electron microscopy mode, the beam size of the photoemission mode is ∼1.4 nm at specific settings with potential for further improvement. As application examples, we illustrate the results of photoinduced structural dynamics of gold film and MoS2 thin flake by ultrafast electron diffraction. We also report the polarization dependent optical interference pattern characterized by the photoinduced near field microscopy effect in a silicon thin film sample prepared by the focused ion beam method. These findings provide valuable insights for researchers aiming to leverage the UTEM's capabilities for advanced electron microscopy applications and pave the way for future advancements in UTEM technology.
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Affiliation(s)
- Shaozheng Ji
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Jiangteng Guo
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Zefang Li
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Ling Tong
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Junqing Guo
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Jingchao Liu
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Ying Deng
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Can Liu
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Zepeng Sun
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Xiang Chen
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Cuntao Gao
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Fang Liu
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Min Feng
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
| | - Xuewen Fu
- Ultrafast Electron Microscopy Laboratory, MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics, Nankai University, Tianjin 300071, China
- School of Materials Science and Engineering, Smart Sensing Interdisciplinary Science Center, Nankai University, Tianjin 300350, China
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Cheng D, Hong J, Lee D, Lee SY, Zheng H. In Situ TEM Characterization of Battery Materials. Chem Rev 2025; 125:1840-1896. [PMID: 39902621 DOI: 10.1021/acs.chemrev.4c00507] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/05/2025]
Abstract
Transmission electron microscopy (TEM) is an indispensable analytical technique in materials research as it probes material information down to the atomic level and can be utilized to examine dynamic phenomena during material transformations. In situ TEM resolves transient metastable states via direct observation of material dynamics under external stimuli. With innovative sample designs developed over the past decades, advanced in situ TEM has enabled emulation of battery operation conditions to unveil nanoscale changes within electrodes, at interfaces, and in electrolytes, rendering it a unique tool to offer unequivocal insights of battery materials that are beam-sensitive, air-sensitive, or that contain light elements, etc. In this review, we first briefly outline the history of advanced electron microscopy along with battery research, followed by an introduction to various in situ TEM sample cell configurations. We provide a comprehensive review on in situ TEM studies of battery materials for lithium batteries and beyond (e.g., sodium batteries and other battery chemistries) via open-cell and closed-cell in situ TEM approaches. At the end, we raise several unresolved points regarding sample preparation protocol, imaging conditions, etc., for in situ TEM experiments. We also provide an outlook on the next-stage development of in situ TEM for battery material study, aiming to foster closer collaboration between in situ TEM and battery research communities for mutual progress.
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Affiliation(s)
- Diyi Cheng
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States
| | - Jinseok Hong
- Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea
| | - Daewon Lee
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States
- Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States
| | - Seung-Yong Lee
- Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea
- Department of Battery Engineering, Hanyang University, Seoul 04763, Republic of Korea
| | - Haimei Zheng
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States
- Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States
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Han Z, Zhang J, Ma H, Xing F, Qi Y, Wei J, He G, Zhang Y, Xin Y, Wang Q, Shi Z. Defect Chemistry Engineering to Regulate the Excellent ZTave Value of Nonstoichiometric Ca 3-xCo 4O 9 (0 ≤ x ≤ 0.06) Ceramics. ACS APPLIED MATERIALS & INTERFACES 2025; 17:5114-5123. [PMID: 39791863 DOI: 10.1021/acsami.4c19212] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/12/2025]
Abstract
Cobalt-based oxides have attracted significant attention as p-type thermoelectric materials due to their wide operational temperature range. However, their low average figure of merit (ZTave) value has hindered service performance. A series of cation vacancies as Ca-active sites were introduced into Ca3-xCo4O9 (0 ≤ x ≤ 0.06) by defect chemistry engineering to regulate the excellent ZTave value. The Ca-active sites of Ca3-xCo4O9 ceramics induced lattice distortion and point defects, which were unequivocally confirmed by the iDPC-STEM results. The power factor from 0.18 mW/(m·K2) to 0.38 mW/(m·K2) and the electrical conductivity from 54.8 to 108.3 S/cm were achieved for the Ca2.96Co4O9 sample. A notable ZT value of 0.32 was obtained at 1073 K. Furthermore, the high ZTave of approximately 0.166 reached within the temperature range of 323-1073 K, representing a 3.25 times improvement compared to pure Ca3Co4O9 ceramics. This study highlights defect chemistry engineering as an effective strategy for optimizing the thermoelectric performance of nonstoichiometric Ca3Co4O9 ceramics, offering promising prospects for the development of Ca3Co4O9-based thermoelectric materials.
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Affiliation(s)
- Zhen Han
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
| | - Junzhan Zhang
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
| | - Haolin Ma
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
| | - Fei Xing
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
| | - Yuqing Qi
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
| | - Jian Wei
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
- Shaanxi Key Laboratory of Nano Materials and Technology, Xi'an 710055, P. R. China
| | - Geping He
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
| | - Ying Zhang
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
| | - Yalou Xin
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
| | - Qing Wang
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, P. R. China
| | - Zongmo Shi
- College of Materials Science and Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, P. R. China
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, P. R. China
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Jílek Z, Radlička T, Krzyžánek V. Simulation Study of Low-Dose 4D-STEM Phase Contrast Techniques at the Nanoscale in SEM. NANOMATERIALS (BASEL, SWITZERLAND) 2025; 15:70. [PMID: 39791828 PMCID: PMC11722761 DOI: 10.3390/nano15010070] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/04/2024] [Revised: 12/25/2024] [Accepted: 01/03/2025] [Indexed: 01/12/2025]
Abstract
Phase contrast imaging is well-suited for studying weakly scattering samples. Its strength lies in its ability to measure how the phase of the electron beam is affected by the sample, even when other imaging techniques yield low contrast. In this study, we explore via simulations two phase contrast techniques: integrated center of mass (iCOM) and ptychography, specifically using the extended ptychographical iterative engine (ePIE). We simulate the four-dimensional scanning transmission electron microscopy (4D-STEM) datasets for specific parameters corresponding to a scanning electron microscope (SEM) with an immersive objective and a given pixelated detector. The performance of these phase contrast techniques is analyzed using a contrast transfer function. Simulated datasets from a sample consisting of graphene sheets and carbon nanotubes are used for iCOM and ePIE reconstructions for two aperture sizes and two electron doses. We highlight the influence of aperture size, showing that for a smaller aperture, the radiation dose is spent mostly on larger sample features, which may aid in imaging sensitive samples while minimizing radiation damage.
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Affiliation(s)
| | - Tomáš Radlička
- Institute of Scientific Instruments of the Czech Academy of Sciences, Kralovopolska 147, 61200 Brno, Czech Republic; (Z.J.); (V.K.)
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Liu Y, Liu X, Su A, Gong C, Chen S, Xia L, Zhang C, Tao X, Li Y, Li Y, Sun T, Bu M, Shao W, Zhao J, Li X, Peng Y, Guo P, Han Y, Zhu Y. Revolutionizing the structural design and determination of covalent-organic frameworks: principles, methods, and techniques. Chem Soc Rev 2024; 53:502-544. [PMID: 38099340 DOI: 10.1039/d3cs00287j] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/03/2024]
Abstract
Covalent organic frameworks (COFs) represent an important class of crystalline porous materials with designable structures and functions. The interconnected organic monomers, featuring pre-designed symmetries and connectivities, dictate the structures of COFs, endowing them with high thermal and chemical stability, large surface area, and tunable micropores. Furthermore, by utilizing pre-functionalization or post-synthetic functionalization strategies, COFs can acquire multifunctionalities, leading to their versatile applications in gas separation/storage, catalysis, and optoelectronic devices. Our review provides a comprehensive account of the latest advancements in the principles, methods, and techniques for structural design and determination of COFs. These cutting-edge approaches enable the rational design and precise elucidation of COF structures, addressing fundamental physicochemical challenges associated with host-guest interactions, topological transformations, network interpenetration, and defect-mediated catalysis.
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Affiliation(s)
- Yikuan Liu
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Xiaona Liu
- National Engineering Research Center of Lower-Carbon Catalysis Technology, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China.
| | - An Su
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Chengtao Gong
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Shenwei Chen
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Liwei Xia
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Chengwei Zhang
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Xiaohuan Tao
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Yue Li
- Institute of Intelligent Computing, Zhejiang Lab, Hangzhou 311121, China
| | - Yonghe Li
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Tulai Sun
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Mengru Bu
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Wei Shao
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Jia Zhao
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Xiaonian Li
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Yongwu Peng
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Peng Guo
- National Engineering Research Center of Lower-Carbon Catalysis Technology, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China.
- University of Chinese Academy of Sciences, Beijing 100049, China.
| | - Yu Han
- School of Emergent Soft Matter, South China University of Technology, Guangzhou, China.
- King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia.
| | - Yihan Zhu
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
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Vlasov E, Denisov N, Verbeeck J. Low-cost electron detector for scanning electron microscope. HARDWAREX 2023; 14:e00413. [PMID: 36969750 PMCID: PMC10031140 DOI: 10.1016/j.ohx.2023.e00413] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Indexed: 06/18/2023]
Abstract
Electron microscopy is an indispensable tool for the characterization of (nano) materials. Electron microscopes are typically very expensive and their internal operation is often shielded from the user. This situation can provide fast and high quality results for researchers focusing on e.g. materials science if they have access to the relevant instruments. For researchers focusing on technique development, wishing to test novel setups, however, the high entry price can lead to risk aversion and deter researchers from innovating electron microscopy technology further. The closed attitude of commercial entities about how exactly the different parts of electron microscopes work, makes it even harder for newcomers in this field. Here we propose an affordable, easy-to-build electron detector for use in a scanning electron microscope (SEM). The aim of this project is to shed light on the functioning of such detectors as well as show that even a very modest design can lead to acceptable performance while providing high flexibility for experimentation and customization.
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Affiliation(s)
- Evgenii Vlasov
- Electron Microscopy for Materials Science, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
| | - Nikita Denisov
- Electron Microscopy for Materials Science, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
| | - Johan Verbeeck
- Electron Microscopy for Materials Science, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
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