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Rammal A, Ezukwoke K, Hoayek A, Batton-Hubert M. Root cause prediction for failures in semiconductor industry, a genetic algorithm-machine learning approach. Sci Rep 2023;13:4934. [PMID: 36973298 PMCID: PMC10043275 DOI: 10.1038/s41598-023-30769-8] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/05/2022] [Accepted: 02/28/2023] [Indexed: 03/29/2023]  Open
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