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For: Eckardt I, Schröter T, Tiedtke K, Wagner N. Photoemission Studies of Ultrathin Sn-Layers on TiO2—x (rutile). Cryst Res Technol 1998. [DOI: 10.1002/(sici)1521-4079(1998)33:1<129::aid-crat129>3.0.co;2-4] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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