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For: Comin M, Fratini S, Blase X, D'Avino G. Doping-Induced Dielectric Catastrophe Prompts Free-Carrier Release in Organic Semiconductors. Adv Mater 2022;34:e2105376. [PMID: 34647372 DOI: 10.1002/adma.202105376] [Citation(s) in RCA: 7] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/13/2021] [Revised: 09/27/2021] [Indexed: 06/13/2023]

For:	Comin M, Fratini S, Blase X, D'Avino G. Doping-Induced Dielectric Catastrophe Prompts Free-Carrier Release in Organic Semiconductors. Adv Mater 2022;34:e2105376. [PMID: 34647372 DOI: 10.1002/adma.202105376] [Citation(s) in RCA: 7] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/13/2021] [Revised: 09/27/2021] [Indexed: 06/13/2023]

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(The first 100,000 artilces are displayed in RCA.)