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Georgiou R, Dazzi A, Mathurin J, Duce C, Dietemann P, Thoury M, Bonaduce I. Nanoscale Probing of the Organic Binder in Artists' Paint Layers: Organic Phases and Chemical Heterogeneity. ACS APPLIED MATERIALS & INTERFACES 2025; 17:8464-8473. [PMID: 39855638 PMCID: PMC11803564 DOI: 10.1021/acsami.4c16430] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/25/2024] [Revised: 12/14/2024] [Accepted: 12/17/2024] [Indexed: 01/27/2025]
Abstract
Understanding paint structures at the nanoscopic level can address key questions related to artistic techniques, paint formulation, and long-term preservation of artworks. This involves examining spatial chemical complexity, the formation of molecular networks, and interactions between organic and inorganic constituents. Depending on the paint preparation methods, proteins and drying oils, the most common binders in traditional artistic practices, can be integrated to produce paints with diverse structures and nanoscale chemical intricacies. In this study, we utilize atomic force microscopy-based infrared spectroscopy (AFM-IR) to investigate the spatial chemical complexity and reaction pathways of organic species in artists' paints, including oil, tempera, and mixed-media tempera grassa. By analyzing these paints at the nanoscale, we established connections between their structural organization, chemistry, and formulation.
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Affiliation(s)
- Rafaella Georgiou
- Department
of Chemistry and Industrial Chemistry, Università
di Pisa, via Moruzzi 13, 56124 Pisa, Italy
- Department
of Physics, University of Wisconsin-Madison, 1150 University Avenue, 53706 Madison, Wisconsin, United States
| | - Alexandre Dazzi
- Institut
de Chimie Physique, UMR8000, Université Paris-Saclay,
CNRS, 91405 Orsay, France
| | - Jeremie Mathurin
- Institut
de Chimie Physique, UMR8000, Université Paris-Saclay,
CNRS, 91405 Orsay, France
| | - Celia Duce
- Department
of Chemistry and Industrial Chemistry, Università
di Pisa, via Moruzzi 13, 56124 Pisa, Italy
| | - Patrick Dietemann
- Bayerische
Staatsgemäldesammlungen, Doerner Institut, Richard-Wagner-Str. 1, 80333 Munich, Germany
| | - Mathieu Thoury
- CNRS,
ministère de la Culture, UVSQ, MNHN, UAR3461, Université
Paris-Saclay, Institut photonique d’analyse non-destructive
européen des matériaux anciens, 91192 Saint-Aubin, France
| | - Ilaria Bonaduce
- Department
of Chemistry and Industrial Chemistry, Università
di Pisa, via Moruzzi 13, 56124 Pisa, Italy
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2
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Jakob DS, Schwartz JJ, Pavlidis G, Grutter KE, Centrone A. Understanding AFM-IR Signal Dependence on Sample Thickness and Laser Excitation: Experimental and Theoretical Insights. Anal Chem 2024; 96:16195-16202. [PMID: 39365177 DOI: 10.1021/acs.analchem.4c02834] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/05/2024]
Abstract
Photothermal induced resonance (PTIR), also known as atomic force microscopy-infrared (AFM-IR), enables nanoscale IR absorption spectroscopy by transducing the local photothermal expansion and contraction of a sample with the tip of an atomic force microscope. PTIR spectra enable material identification at the nanoscale and can measure sample composition at depths >1 μm. However, implementation of quantitative, multivariate, nanoscale IR analysis requires an improved understanding of PTIR signal transduction and of the intensity dependence on sample characteristics and measurement parameters. Here, PTIR spectra measured on three-dimensional printed conical structures up to 2.5 μm tall elucidate the signal dependence on sample thickness for different IR laser repetition rates and pulse lengths. Additionally, we develop a model linking sample thermal expansion dynamics to cantilever excitation amplitudes that includes samples that do not fully thermalize between consecutive pulses. Remarkable qualitative agreement between experiments and theory demonstrates a monotonic increase in the PTIR signal intensity with thickness, with decreasing sensitivities at higher repetition rates, while signal intensity is nearly unaffected by laser pulse length. Although we observe slight deviations from linearity over the entire 2.5 μm thickness range, the signal's approximate linearity for bands of sample thicknesses up to ≈500 nm suggests that samples with comparably low topographic variations are most amenable to quantitative analysis. Importantly, we measure absorptive undistorted profiles in PTIR spectra for strongly absorbing modes, up to ≈1650 nm, and >2500 nm for other modes. These insights are foundational toward quantitative nanoscale PTIR analyses and material identification, furthering their impact across many applications.
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Affiliation(s)
- Devon S Jakob
- Nanoscale Devices Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Jeffrey J Schwartz
- Nanoscale Devices Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Laboratory for Physical Sciences, College Park, Maryland 20740, United States
- Department of Electrical and Computer Engineering, University of Maryland, College Park, Maryland 20742, United States
| | - Georges Pavlidis
- Nanoscale Devices Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Department of Mechanical Engineering, University of Connecticut, Storrs, Connecticut 06269, United States
| | - Karen E Grutter
- Laboratory for Physical Sciences, College Park, Maryland 20740, United States
- Department of Electrical and Computer Engineering, University of Maryland, College Park, Maryland 20742, United States
| | - Andrea Centrone
- Nanoscale Devices Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
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3
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Wang M, Ramer G, Perez-Morelo DJ, Pavlidis G, Schwartz JJ, Yu L, Ilic R, Aksyuk VA, Centrone A. High Throughput Nanoimaging of Thermal Conductivity and Interfacial Thermal Conductance. NANO LETTERS 2022; 22:4325-4332. [PMID: 35579622 DOI: 10.1021/acs.nanolett.2c00337] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
Thermal properties of materials are often determined by measuring thermalization processes; however, such measurements at the nanoscale are challenging because they require high sensitivity concurrently with high temporal and spatial resolutions. Here, we develop an optomechanical cantilever probe and customize an atomic force microscope with low detection noise ≈1 fm/Hz1/2 over a wide (>100 MHz) bandwidth that measures thermalization dynamics with ≈10 ns temporal resolution, ≈35 nm spatial resolution, and high sensitivity. This setup enables fast nanoimaging of thermal conductivity (η) and interfacial thermal conductance (G) with measurement throughputs ≈6000× faster than conventional macroscale-resolution time-domain thermoreflectance acquiring the full sample thermalization. As a proof-of-principle demonstration, 100 × 100 pixel maps of η and G of a polymer particle are obtained in 200 s with a small relative uncertainty (<10%). This work paves the way to study fast thermal dynamics in materials and devices at the nanoscale.
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Affiliation(s)
- Mingkang Wang
- Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20742, United States
| | - Georg Ramer
- Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20742, United States
- Nanoscale Devices Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Institute of Chemical Technologies and Analytics, TU Wien, Getreidemarkt 9, 1060 Vienna, Austria
| | - Diego J Perez-Morelo
- Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20742, United States
| | - Georges Pavlidis
- Nanoscale Devices Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Department of Mechanical Engineering, University of Connecticut, Storrs, Connecticut 06269, United States
| | - Jeffrey J Schwartz
- Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20742, United States
- Nanoscale Devices Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Liya Yu
- Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Robert Ilic
- Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Vladimir A Aksyuk
- Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Andrea Centrone
- Nanoscale Devices Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
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4
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Lin YT, He H, Kaya H, Liu H, Ngo D, Smith NJ, Banerjee J, Borhan A, Kim SH. Photothermal Atomic Force Microscopy Coupled with Infrared Spectroscopy (AFM-IR) Analysis of High Extinction Coefficient Materials: A Case Study with Silica and Silicate Glasses. Anal Chem 2022; 94:5231-5239. [PMID: 35312271 DOI: 10.1021/acs.analchem.1c04398] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/08/2023]
Abstract
Photothermal atomic force microscopy coupled with infrared spectroscopy (AFM-IR) brings significant value as a spatially resolved surface analysis technique for disordered oxide materials such as glasses, but additional development and fundamental understanding of governing principles is needed to interpret AFM-IR spectra, since the existing theory described for organic materials does not work for materials with high extinction coefficients for infrared (IR) absorption. This paper describes theoretical calculation of a transient temperature profile inside the IR-absorbing material considering IR refraction at the interface as well as IR adsorption and heat transfer inside the sample. This calculation explains the differences in peak positions and amplitudes of AFM-IR spectra from those of specular reflectance and extinction coefficient spectra. It also addresses the information depth of the AFM-IR characterization of bulk materials. AFM-IR applied to silica and silicate glass surfaces has demonstrated novel capability of characterizing subsurface structural changes and surface heterogeneity due to mechanical stresses from physical contacts, as well as chemical alterations manifested in surface layers through aqueous corrosion.
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Affiliation(s)
- Yen-Ting Lin
- Department of Chemical Engineering and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Hongtu He
- Department of Chemical Engineering and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.,Key Laboratory of Testing Technology for Manufacturing Process, Ministry of Education, Southwest University of Science and Technology, Mianyang, Sichuan 621010, China
| | - Huseyin Kaya
- Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Hongshen Liu
- Department of Chemical Engineering and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Dien Ngo
- Department of Chemical Engineering and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Nicholas J Smith
- Science & Technology Division, Corning Incorporated, Corning, New York 14831, United States
| | - Joy Banerjee
- Science & Technology Division, Corning Incorporated, Corning, New York 14831, United States
| | - Ali Borhan
- Department of Chemical Engineering and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Seong H Kim
- Department of Chemical Engineering and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.,Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States
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5
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Beltran V, Marchetti A, Nuyts G, Leeuwestein M, Sandt C, Borondics F, De Wael K. Nanoscale Analysis of Historical Paintings by Means of O-PTIR Spectroscopy: The Identification of the Organic Particles in L'Arlésienne (Portrait of Madame Ginoux) by Van Gogh. Angew Chem Int Ed Engl 2021; 60:22753-22760. [PMID: 34165241 DOI: 10.1002/anie.202106058] [Citation(s) in RCA: 11] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/05/2021] [Indexed: 11/06/2022]
Abstract
Optical-photothermal infrared (O-PTIR) spectroscopy is a recently developed technique that provides spectra comparable to traditional transmission FTIR spectroscopy with nanometric spatial resolution. Hence, O-PTIR is a promising candidate for the analysis of historical paintings, as well as other cultural heritage objects, but its potential has not yet been evaluated. This work presents the first application of O-PTIR to the analysis of cultural heritage, and in particular to an extremely small fragment from Van Gogh's painting L'Arlésienne (portrait of Madame Ginoux). The striking results obtained, including the detection of geranium lake pigments as well as the complete analysis of the stratigraphy, failed with other state-of-the-art techniques, highlight the potential of this method. The integration of O-PTIR to the study of cultural heritage opens to the possibility of decreasing the amount of sample extracted, therefore contributing to the preservation of the integrity of artworks while providing a complete characterization of the materials.
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Affiliation(s)
- Victoria Beltran
- AXES research group, University of Antwerp, Groenenborgerlaan 171, 2020, Antwerp, Belgium.,NanoLab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020, Antwerp, Belgium
| | - Andrea Marchetti
- AXES research group, University of Antwerp, Groenenborgerlaan 171, 2020, Antwerp, Belgium.,NanoLab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020, Antwerp, Belgium
| | - Gert Nuyts
- AXES research group, University of Antwerp, Groenenborgerlaan 171, 2020, Antwerp, Belgium.,NanoLab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020, Antwerp, Belgium
| | | | | | | | - Karolien De Wael
- AXES research group, University of Antwerp, Groenenborgerlaan 171, 2020, Antwerp, Belgium.,NanoLab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020, Antwerp, Belgium
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6
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Beltran V, Marchetti A, Nuyts G, Leeuwestein M, Sandt C, Borondics F, De Wael K. Nanoscale Analysis of Historical Paintings by Means of O‐PTIR Spectroscopy: The Identification of the Organic Particles in
L′Arlésienne (Portrait of Madame Ginoux)
by Van Gogh. Angew Chem Int Ed Engl 2021. [DOI: 10.1002/ange.202106058] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
Affiliation(s)
- Victoria Beltran
- AXES research group University of Antwerp Groenenborgerlaan 171 2020 Antwerp Belgium
- NanoLab Center of Excellence University of Antwerp Groenenborgerlaan 171 2020 Antwerp Belgium
| | - Andrea Marchetti
- AXES research group University of Antwerp Groenenborgerlaan 171 2020 Antwerp Belgium
- NanoLab Center of Excellence University of Antwerp Groenenborgerlaan 171 2020 Antwerp Belgium
| | - Gert Nuyts
- AXES research group University of Antwerp Groenenborgerlaan 171 2020 Antwerp Belgium
- NanoLab Center of Excellence University of Antwerp Groenenborgerlaan 171 2020 Antwerp Belgium
| | | | | | | | - Karolien De Wael
- AXES research group University of Antwerp Groenenborgerlaan 171 2020 Antwerp Belgium
- NanoLab Center of Excellence University of Antwerp Groenenborgerlaan 171 2020 Antwerp Belgium
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7
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Izzo FC, Kratter M, Nevin A, Zendri E. A Critical Review on the Analysis of Metal Soaps in Oil Paintings. ChemistryOpen 2021; 10:904-921. [PMID: 34532965 PMCID: PMC8446710 DOI: 10.1002/open.202100166] [Citation(s) in RCA: 15] [Impact Index Per Article: 3.8] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/10/2021] [Revised: 07/20/2021] [Indexed: 12/14/2022] Open
Abstract
Up to 70 % of the oil paintings conserved in collections present metal soaps, which result from the chemical reaction between metal ions present in the painted layers and free fatty acids from the lipidic binders. In recent decades, conservators and conservation scientists have been systematically identifying various and frequent conservation problems that can be linked to the formation of metal soaps. It is also increasingly recognized that metal soap formation may not compromise the integrity of paint so there is a need for careful assessment of the implications of metal soaps for conservation. This review aims to critically assess scientific literature related to commonly adopted analytical techniques for the analysis of metal soaps in oil paintings. A comparison of different analytical methods is provided, highlighting advantages associated with each, as well as limitations identified through the analysis of reference materials and applications to the analysis of samples from historical paintings.
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Affiliation(s)
- Francesca Caterina Izzo
- Sciences and Technologies for the Conservation of Cultural Heritage, Department ofEnvironmental Sciences, Informatics and StatisticsCa' Foscari University of VeniceVia Torino 155/b30173VeniceItaly
| | - Matilde Kratter
- Sciences and Technologies for the Conservation of Cultural Heritage, Department ofEnvironmental Sciences, Informatics and StatisticsCa' Foscari University of VeniceVia Torino 155/b30173VeniceItaly
| | - Austin Nevin
- Head of Conservation The Courtauld Institute of ArtVernon Square, Penton RiseKings CrossWC1X 9EWLondonUnited Kingdom
| | - Elisabetta Zendri
- Sciences and Technologies for the Conservation of Cultural Heritage, Department ofEnvironmental Sciences, Informatics and StatisticsCa' Foscari University of VeniceVia Torino 155/b30173VeniceItaly
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