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Cheng D, Hong J, Lee D, Lee SY, Zheng H. In Situ TEM Characterization of Battery Materials. Chem Rev 2025; 125:1840-1896. [PMID: 39902621 DOI: 10.1021/acs.chemrev.4c00507] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/05/2025]
Abstract
Transmission electron microscopy (TEM) is an indispensable analytical technique in materials research as it probes material information down to the atomic level and can be utilized to examine dynamic phenomena during material transformations. In situ TEM resolves transient metastable states via direct observation of material dynamics under external stimuli. With innovative sample designs developed over the past decades, advanced in situ TEM has enabled emulation of battery operation conditions to unveil nanoscale changes within electrodes, at interfaces, and in electrolytes, rendering it a unique tool to offer unequivocal insights of battery materials that are beam-sensitive, air-sensitive, or that contain light elements, etc. In this review, we first briefly outline the history of advanced electron microscopy along with battery research, followed by an introduction to various in situ TEM sample cell configurations. We provide a comprehensive review on in situ TEM studies of battery materials for lithium batteries and beyond (e.g., sodium batteries and other battery chemistries) via open-cell and closed-cell in situ TEM approaches. At the end, we raise several unresolved points regarding sample preparation protocol, imaging conditions, etc., for in situ TEM experiments. We also provide an outlook on the next-stage development of in situ TEM for battery material study, aiming to foster closer collaboration between in situ TEM and battery research communities for mutual progress.
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Affiliation(s)
- Diyi Cheng
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States
| | - Jinseok Hong
- Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea
| | - Daewon Lee
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States
- Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States
| | - Seung-Yong Lee
- Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea
- Department of Battery Engineering, Hanyang University, Seoul 04763, Republic of Korea
| | - Haimei Zheng
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States
- Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States
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2
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Li H, Xu Z, Li J, Siria A, Ma M. Evolution of Interfacial Hydration Structure Induced by Ion Condensation and Correlation Effects. Angew Chem Int Ed Engl 2025; 64:e202418029. [PMID: 39648812 DOI: 10.1002/anie.202418029] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/19/2024] [Revised: 11/23/2024] [Accepted: 12/06/2024] [Indexed: 12/10/2024]
Abstract
Interfacial hydration structures are crucial in wide-ranging applications, including battery, colloid, lubrication. Multivalent ions like Mg2+ and La3+ show irreplaceable roles in these applications, which are hypothesized due to their unique interfacial hydration structures. However, this hypothesis lacks experimental supports. Here, we provide the first observation for their interfacial hydration structures with molecular resolution using atomic force microscopy. We observed the evolution of layered hydration structures at La(NO3)3 solution-mica interfaces. As concentration increases from 25 mM to 2 M, the layer number varies from 2 to 1 and back to 2, and the interlayer thickness rises from 0.25±0.05 to 0.34±0.03 nm, with hydration force increasing from 0.27±0.07 to 1.04±0.24 nN. Theory and molecular simulation reveal that the cations form inner-sphere complexes. Multivalence induces concentration-dependent ion condensation and correlation effects, resulting in compositional and structural evolution within interfacial hydration structures. Additional experiments at seven different solid-liquid interfaces together with literature comparison confirm the universality of this mechanism for both multivalent and monovalent ions. New factors affecting interfacial hydration structures are revealed, including concentration and solvent dielectric constant. This insight provides guidance for designing interfacial hydration structures to optimize solid-liquid-interphase for battery life extension, modulate colloid stability and develop efficient lubricants.
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Affiliation(s)
- Han Li
- Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment (SKLT), Tsinghua University, Beijing, 100084, China
- Institute of Superlubricity Technology, Research Institute of Tsinghua University in Shenzhen, Shenzhen, 518118, China
- Center for Nano and Micro Mechanics, Tsinghua University, Beijing, 100084, China
| | - Zhi Xu
- Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment (SKLT), Tsinghua University, Beijing, 100084, China
- Center for Nano and Micro Mechanics, Tsinghua University, Beijing, 100084, China
| | - Jiacheng Li
- Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment (SKLT), Tsinghua University, Beijing, 100084, China
- Center for Nano and Micro Mechanics, Tsinghua University, Beijing, 100084, China
| | - Alessandro Siria
- Laboratoire de Physique de l'Ecole normale Supérieure,., ENS, Université PSL, CNRS, Sorbonne Université, Université de Paris, Paris, France
| | - Ming Ma
- Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment (SKLT), Tsinghua University, Beijing, 100084, China
- Institute of Superlubricity Technology, Research Institute of Tsinghua University in Shenzhen, Shenzhen, 518118, China
- Center for Nano and Micro Mechanics, Tsinghua University, Beijing, 100084, China
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3
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Smith J, Tran H, Roccapriore KM, Shen Z, Zhang G, Chi M. Advanced Compressive Sensing and Dynamic Sampling for 4D-STEM Imaging of Interfaces. SMALL METHODS 2025; 9:e2400742. [PMID: 39324310 DOI: 10.1002/smtd.202400742] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/20/2024] [Revised: 07/28/2024] [Indexed: 09/27/2024]
Abstract
Interfaces in energy materials and devices often involve beam-sensitive materials such as fast ionic, soft, or liquid phases. 4D scanning transmission electron microscopy (4D-STEM) offers insights into local lattice, strain charge, and field distributions, but faces challenges in analyzing beam-sensitive interfaces at high spatial resolutions. Here, a 4D-STEM compressive sensing algorithm is introduced that significantly reduces data acquisition time and electron dose. This method autonomously allocates probe positions on interfaces and reconstructs missing information from datasets acquired via dynamic sampling. This algorithm allows for the integration of various scanning schemes and electron probe conditions to optimize data integrity. Its data reconstruction employs a neural network and an autoencoder to correlate diffraction pattern features with measured properties, significantly reducing training costs. The accuracy of the reconstructed 4D-STEM datasets is verified using a combination of explicitly and implicitly trained parameters from atomic resolution datasets. This method is broadly applicable for 4D-STEM imaging of any local features of interest and will be available on GitHub upon publication.
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Affiliation(s)
- Jacob Smith
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Hoang Tran
- Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Kevin M Roccapriore
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Zhaiming Shen
- Department of Mathematics, Georgia Institute of Technology, Atlanta, GA, 30332, USA
| | - Guannan Zhang
- Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Miaofang Chi
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Thomas Lord Department of Mechanical Engineering & Materials Science, Duke University, Durham, NC, 27708, USA
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4
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Li T, Li Y, Guo C, Hu Y. Dual-defect semiconductor photocatalysts for solar-to-chemical conversion: advances and challenges. Chem Commun (Camb) 2024; 60:2320-2348. [PMID: 38314591 DOI: 10.1039/d3cc06102g] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/06/2024]
Abstract
Among the renewable energy technologies to deal with increasing energy crisis and environmental concerns, solar-to-chemical conversion via photocatalysis holds great promise for sustainable energy supply. To date, a variety of modification strategies with different types of semiconducting materials have been proposed to boost photocatalytic efficiency. Recently, dual-defect semiconductor photocatalysts have emerged as an advantageous candidate with superior performance in improving photocatalytic activity compared to their defect-free or single-defect counterparts. In this review, focus is laid on the advances of dual-defect semiconductor photocatalysts for energy photocatalysis. Possible schemes for two different defects within a single semiconductor are firstly sorted based on the types of defects, and synthesis strategies to achieve various defect schemes as well as techniques to characterize different defects are then introduced. In particular, the effect of different defects on photocatalytic performance is emphasized, and the advances in dual-defect semiconductors for solar-to-chemical conversions are summarized based on different defect schemes. Finally, the future challenges and opportunities of dual-defect semiconductors for photocatalysis are discussed. This article is expected to provide an overall insight into existing dual-defect semiconductor photocatalysts and inspire the development of new defect-rich materials for photocatalytic energy production.
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Affiliation(s)
- Tianqi Li
- Key Laboratory of the Ministry of Education for Advanced Catalysis Materials, Department of Chemistry, Zhejiang Normal University, Jinhua, 321004, China.
| | - Yufeng Li
- Key Laboratory of the Ministry of Education for Advanced Catalysis Materials, Department of Chemistry, Zhejiang Normal University, Jinhua, 321004, China.
| | - Changfa Guo
- Key Laboratory of the Ministry of Education for Advanced Catalysis Materials, Department of Chemistry, Zhejiang Normal University, Jinhua, 321004, China.
| | - Yong Hu
- College of Chemistry and Materials Engineering, Zhejiang A&F University, Hangzhou, 311300, China.
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5
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Unocic RR, Wang J, Tsai WY, Gogotsi Y, Boebinger MG, Yu H, Cullen DA, Veith GM, Williams AN, Zachman MJ. Understanding Interfacial Electrochemical Reactions through in situ ec-STEM and IL-Cryo-STEM. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2023; 29:671. [PMID: 37613279 DOI: 10.1093/micmic/ozad067.330] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
Affiliation(s)
- Raymond R Unocic
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
| | - John Wang
- A.J Drexel Nanomaterials Institute, Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, United States
| | - Wan-Yu Tsai
- Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States
| | - Yury Gogotsi
- A.J Drexel Nanomaterials Institute, Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, United States
| | - Matthew G Boebinger
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
| | - Haoran Yu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
| | - David A Cullen
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
| | - Gabriel M Veith
- Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States
| | - Alexis N Williams
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
| | - Michael J Zachman
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
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6
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Beach JM, Kryuchkova M, Fakhrullin R, Mazurova K, Stavitskaya A, Cheatham BJ, Fakhrullin R. Size-Dependent Oscillation in Optical Spectra from Fly Ash Cenospheres: Particle Sizing Using Darkfield Hyperspectral Interferometry. BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN 2023. [DOI: 10.1246/bcsj.20220272] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/11/2023]
Affiliation(s)
- James M. Beach
- CytoViva Inc., 570 Devall Drive Ste 301, Auburn Alabama 36832, USA
| | - Marina Kryuchkova
- Institute of Fundamental Medicine and Biology, Kazan Federal University, Kreml uramı 18, 420008 Kazan, Republic of Tatarstan, Russian Federation
| | - Ramil Fakhrullin
- Institute of Fundamental Medicine and Biology, Kazan Federal University, Kreml uramı 18, 420008 Kazan, Republic of Tatarstan, Russian Federation
| | - Kristina Mazurova
- Department of Physical and Colloid Chemistry, Gubkin University, Moscow, 119991, Russian Federation
| | - Anna Stavitskaya
- Department of Physical and Colloid Chemistry, Gubkin University, Moscow, 119991, Russian Federation
| | | | - Rawil Fakhrullin
- Institute of Fundamental Medicine and Biology, Kazan Federal University, Kreml uramı 18, 420008 Kazan, Republic of Tatarstan, Russian Federation
- Department of Physical and Colloid Chemistry, Gubkin University, Moscow, 119991, Russian Federation
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7
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Jeong JH, Kang S, Kim N, Joshi RK, Lee GH. Recent trends in covalent functionalization of 2D materials. Phys Chem Chem Phys 2022; 24:10684-10711. [DOI: 10.1039/d1cp04831g] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Covalent functionalization of the surface is more crucial in 2D materials than in conventional bulk materials because of their atomic thinness, large surface-to-volume ratio, and uniform surface chemical potential. Because...
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8
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Wang HQ, Xu J, Lin X, Li Y, Kang J, Zheng JC. Determination of the embedded electronic states at nanoscale interface via surface-sensitive photoemission spectroscopy. LIGHT, SCIENCE & APPLICATIONS 2021; 10:153. [PMID: 34315859 PMCID: PMC8316467 DOI: 10.1038/s41377-021-00592-9] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/14/2020] [Revised: 06/24/2021] [Accepted: 07/06/2021] [Indexed: 05/18/2023]
Abstract
The fabrication of small-scale electronics usually involves the integration of different functional materials. The electronic states at the nanoscale interface plays an important role in the device performance and the exotic interface physics. Photoemission spectroscopy is a powerful technique to probe electronic structures of valence band. However, this is a surface-sensitive technique that is usually considered not suitable for the probing of buried interface states, due to the limitation of electron-mean-free path. This article reviews several approaches that have been used to extend the surface-sensitive techniques to investigate the buried interface states, which include hard X-ray photoemission spectroscopy, resonant soft X-ray angle-resolved photoemission spectroscopy and thickness-dependent photoemission spectroscopy. Especially, a quantitative modeling method is introduced to extract the buried interface states based on the film thickness-dependent photoemission spectra obtained from an integrated experimental system equipped with in-situ growth and photoemission techniques. This quantitative modeling method shall be helpful to further understand the interfacial electronic states between functional materials and determine the interface layers.
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Affiliation(s)
- Hui-Qiong Wang
- Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen, 361005, China.
- Department of Physics, Xiamen University Malaysia, Sepang, 43900, Malaysia.
- Department of New Energy Science and Engineering, Xiamen University Malaysia, Sepang, 43900, Malaysia.
| | - Jiayi Xu
- Department of New Energy Science and Engineering, Xiamen University Malaysia, Sepang, 43900, Malaysia
| | - Xiaoyuan Lin
- Department of New Energy Science and Engineering, Xiamen University Malaysia, Sepang, 43900, Malaysia
| | - Yaping Li
- Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen, 361005, China
- College of Science, Henan University of Technology, Zhengzhou, 450001, China
| | - Junyong Kang
- Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen, 361005, China
| | - Jin-Cheng Zheng
- Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen, 361005, China.
- Department of Physics, Xiamen University Malaysia, Sepang, 43900, Malaysia.
- Department of New Energy Science and Engineering, Xiamen University Malaysia, Sepang, 43900, Malaysia.
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9
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Zheng J, Archer LA. Controlling electrochemical growth of metallic zinc electrodes: Toward affordable rechargeable energy storage systems. SCIENCE ADVANCES 2021; 7:eabe0219. [PMID: 33523975 PMCID: PMC7787491 DOI: 10.1126/sciadv.abe0219] [Citation(s) in RCA: 115] [Impact Index Per Article: 28.8] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/26/2020] [Accepted: 11/12/2020] [Indexed: 05/19/2023]
Abstract
Scalable approaches for precisely manipulating the growth of crystals are of broad-based science and technological interest. New research interests have reemerged in a subgroup of these phenomena-electrochemical growth of metals in battery anodes. In this Review, the geometry of the building blocks and their mode of assembly are defined as key descriptors to categorize deposition morphologies. To control Zn electrodeposit morphology, we consider fundamental electrokinetic principles and the associated critical issues. It is found that the solid-electrolyte interphase (SEI) formed on Zn has a similarly strong influence as for alkali metals at low current regimes, characterized by a moss-like morphology. Another key conclusion is that the unique crystal structure of Zn, featuring high anisotropy facets resulting from the hexagonal close-packed lattice with a c/a ratio of 1.85, imposes predominant influences on its growth. In our view, precisely regulating the SEI and the crystallographic features of the Zn offers exciting opportunities that will drive transformative progress.
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Affiliation(s)
- Jingxu Zheng
- Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA
| | - Lynden A Archer
- Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA.
- Robert Frederick Smith School of Chemical and Biomolecular Engineering, Cornell University, Ithaca, NY 14853, USA
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10
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Jung HJ, Lim Y, Choi BU, Bae HB, Jung W, Ryu S, Oh J, Chung SY. Direct Identification of Antisite Cation Intermixing and Correlation with Electronic Conduction in CuBi 2O 4 for Photocathodes. ACS APPLIED MATERIALS & INTERFACES 2020; 12:43720-43727. [PMID: 32877165 DOI: 10.1021/acsami.0c12491] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Cu-based p-type semiconducting oxides have been sought for water-reduction photocathodes to enhance the energy-conversion efficiency in photoelectrochemical cells. CuBi2O4 has recently attracted notable attention as a new family of p-type oxides, based on its adequate band gap. Although the identification of a major defect structure should be the first step toward understanding the electronic conduction behavior, no direct experimental analysis has been carried out yet. Using atomic-scale scanning transmission electron microscopy together with chemical probing, we identify a substantial amount of BiCu-CuBi antisite intermixing as a major point-defect type. Our density functional theory calculations also show that antisite BiCu can seriously hinder the hole-polaron hopping between Cu, in agreement with lower conductivity and a larger thermal activation barrier under a higher degree of intermixing. These findings highlight the value of the direct identification of point defects for a better understanding of electronic properties in complex oxides.
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Affiliation(s)
- Hyun Joon Jung
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea
- Graduate School of EEWS, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea
| | - Younghwan Lim
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea
| | - Byeong-Uk Choi
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea
| | - Hyung Bin Bae
- KAIST Analysis Center, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea
| | - WooChul Jung
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea
| | - Sangwoo Ryu
- Department of Advanced Materials Engineering, Kyonggi University, Suwon, Gyeonggi-do16227, Korea
| | - Jihun Oh
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea
| | - Sung-Yoon Chung
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea
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11
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Tiede DM, Kwon G, He X, Mulfort KL, Martinson ABF. Characterizing electronic and atomic structures for amorphous and molecular metal oxide catalysts at functional interfaces by combining soft X-ray spectroscopy and high-energy X-ray scattering. NANOSCALE 2020; 12:13276-13296. [PMID: 32567636 DOI: 10.1039/d0nr02350g] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Amorphous thin film materials and heterogenized molecular catalysts supported on electrode and other functional interfaces are widely investigated as promising catalyst formats for applications in solar and electrochemical fuels catalysis. However the amorphous character of these catalysts and the complexity of the interfacial architectures that merge charge transport properties of electrode and semiconductor supports with discrete sites for multi-step catalysis poses challenges for probing mechanisms that activate and tune sites for catalysis. This minireview discusses advances in soft X-ray spectroscopy and high-energy X-ray scattering that provide opportunities to resolve interfacial electronic and atomic structures, respectively, that are linked to catalysis. This review discusses how these techniques can be partnered with advances in nanostructured interface synthesis for combined soft X-ray spectroscopy and high-energy X-ray scattering analyses of thin film and heterogenized molecular catalysts. These combined approaches enable opportunities for the characterization of both electronic and atomic structures underlying fundamental catalytic function, and that can be applied under conditions relevant to device applications.
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Affiliation(s)
- David M Tiede
- Chemical Sciences and Engineering Division, Argonne National Laboratory, Lemont, Illinois, USA.
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12
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Wallum A, Nguyen HA, Gruebele M. Excited-State Imaging of Single Particles on the Subnanometer Scale. Annu Rev Phys Chem 2020; 71:415-433. [DOI: 10.1146/annurev-physchem-071119-040108] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Abstract
At the intersection of spectroscopy and microscopy lie techniques that are capable of providing subnanometer imaging of excited states of individual molecules or nanoparticles. Such approaches are particularly important for imaging macromolecules or nanoparticles large enough to have a high probability of containing a defect. These inevitable defects often control properties and function despite an otherwise ideal structure. We discuss real-space imaging techniques such as using scanning tunneling microscopy tips to enhance optical measurements and electron energy-loss spectroscopy in a scanning transmission electron microscope, which is based on focused electron beams to obtain high-resolution spatial information on excited states. The outlook for these methods is bright, as they will provide critical information for the characterization and improvement of energy-switching, electron-switching, and energy-harvesting materials.
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Affiliation(s)
- Alison Wallum
- Department of Chemistry and Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA
| | - Huy A. Nguyen
- Department of Chemistry and Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA
| | - Martin Gruebele
- Department of Chemistry and Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA
- Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA
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13
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Zhang L, Ran J, Qiao SZ, Jaroniec M. Characterization of semiconductor photocatalysts. Chem Soc Rev 2019; 48:5184-5206. [DOI: 10.1039/c9cs00172g] [Citation(s) in RCA: 152] [Impact Index Per Article: 25.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/23/2022]
Abstract
The long-standing popularity of semiconductor photocatalysts stimulated their characterization, which is the subject of this review aiming to help materials chemists and physicists, particularly students, to select suitable characterization methods.
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Affiliation(s)
- Liping Zhang
- Department of Chemistry and Biochemistry
- Kent State University
- Kent
- USA
| | - Jingrun Ran
- School of Chemical Engineering and Advanced Materials
- The University of Adelaide
- Adelaide
- Australia
| | - Shi-Zhang Qiao
- School of Chemical Engineering and Advanced Materials
- The University of Adelaide
- Adelaide
- Australia
| | - Mietek Jaroniec
- Department of Chemistry and Biochemistry
- Kent State University
- Kent
- USA
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