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For: Saravanan R, Israel S, Ono Y, Ohno K, Isshiki M, Kajitani T, Rajaram RK. Probabilistic electron density distribution in CdTe at RT and 200K. Cryst Res Technol 2006. [DOI: 10.1002/crat.200510571] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
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