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For: Albers C, Wienecke M. High-temperature in-situ-hall-equipment for semiconductor compounds. Cryst Res Technol 1987. [DOI: 10.1002/crat.2170220332] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
Number Cited by Other Article(s)
1
Berger H. X-Ray Diffraction Studies on Point Defects in II–VI Compounds. CRYSTAL RESEARCH AND TECHNOLOGY 1993. [DOI: 10.1002/crat.2170280604] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
2
Schenk M, Berger H, Klimakow A, Mühlberg M, Wienecke M. Nonstoichiometry and point defects in PbTe. CRYSTAL RESEARCH AND TECHNOLOGY 1988. [DOI: 10.1002/crat.2170230111] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
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