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Ma X, Zhou J, Liu Y, Xu S, Cao S. Supramolecular Framework Constructed by Dendritic Nanopolymer for Stable Flexible Perovskite Resistive Random-Access Memory. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2023; 19:e2206852. [PMID: 36526587 DOI: 10.1002/smll.202206852] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/06/2022] [Revised: 11/30/2022] [Indexed: 06/17/2023]
Abstract
The 3D supramolecular framework (3D-SF) is constructed in this work through the hydrogen bond assisted self-assembly of spherical dendritic nanopolymer to regulate the flexibility, stability, and resistive switching (RS) performance of perovskite resistive random-access memory (RRAM). Herein, the 3D-SF network acts as the perovskite crystallization template to regulate the perovskite crystallization process due to its coordination interaction of functional groups with the perovskite grains, presenting the uniform, pinhole-free, and compact perovskite morphology for stable flexible RRAM. The 3D-SF network in situ stays at the perovskite intergranular boundaries to crosslink the perovskite grains. The RS performance of 3D-SF-modified perovskite RRAM device is evidently improved to the ON/OFF ratio of 105 , the cycle number of 500 times, and the data retention time of 104 s. The 50-days exposure of unencapsulated RRAM device at ambient environment still makes the ON/OFF ratio to be kept at ≈104 , indicating the potential of long-term stable multilevel storage in the high-density data storage. The bending action under different radius also does not change the RS performance due to the excellent bending-resistant ability of 3D-SF-modified perovskite film. This work explores a novel polymer additive strategy to construct the 3D supramolecular framework for stable flexible perovskite optoelectronic devices.
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Affiliation(s)
- Xueqing Ma
- School of Materials Science and Engineering, Zhengzhou University, Zhengzhou, 450001, P. R. China
- Henan Key Laboratory of Advanced Nylon Materials and Application, Zhengzhou University, Zhengzhou, 450001, P. R. China
| | - Jianjun Zhou
- School of Materials Science and Engineering, Zhengzhou University, Zhengzhou, 450001, P. R. China
- Henan Key Laboratory of Advanced Nylon Materials and Application, Zhengzhou University, Zhengzhou, 450001, P. R. China
| | - Yingliang Liu
- School of Materials Science and Engineering, Zhengzhou University, Zhengzhou, 450001, P. R. China
- Henan Key Laboratory of Advanced Nylon Materials and Application, Zhengzhou University, Zhengzhou, 450001, P. R. China
| | - Shengang Xu
- School of Materials Science and Engineering, Zhengzhou University, Zhengzhou, 450001, P. R. China
- Henan Key Laboratory of Advanced Nylon Materials and Application, Zhengzhou University, Zhengzhou, 450001, P. R. China
| | - Shaokui Cao
- School of Materials Science and Engineering, Zhengzhou University, Zhengzhou, 450001, P. R. China
- Henan Key Laboratory of Advanced Nylon Materials and Application, Zhengzhou University, Zhengzhou, 450001, P. R. China
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Characterization of a New Low Temperature Encapsulation Method with Ethylene-Vinyl Acetate under UV Irradiation for Perovskite Solar Cells. APPLIED SCIENCES-BASEL 2022. [DOI: 10.3390/app12105228] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
Abstract
In this work, the performance of a new ethylene-vinyl acetate-based low temperature encapsulation method, conceived to protect perovskite samples from UV irradiation in ambient conditions, has been analyzed. To this purpose, perovskite samples consisting of a set of MAPbI3 (CH3NH3PbI3) films and MAPbI3 with an ETL layer were deposited over glass substrates by spin-coating techniques and encapsulated using the new method. The samples were subjected to an UV lamp or to full solar irradiation in ambient conditions, with a relative humidity of 60–80%. Microscope imaging, spectroscopic ellipsometry and Fourier-transform infrared spectroscopy (FTIR) techniques were applied to analyze the samples. The obtained results indicate UV energy is responsible for the degradation of the perovskite layer. Thus, the cut-UV characteristics of the EVA encapsulate acts as an efficient barrier, allowing the laminated samples to remain stable above 350 h under full solar irradiation compared with non-encapsulated samples. In addition, the FTIR results reveal perovskite degradation caused by UV light. To extend the study to encompass whole PSCs, simulations were carried out using the software SCAPS-1D, where the non-encapsulated devices present a short-circuit current reduction after exposure to UV irradiation, while the encapsulated ones maintained their efficiency.
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