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For: Lauraux F, Yehya S, Labat S, Micha J, Robach O, Kovalenko O, Rabkin E, Thomas O, Cornelius TW. In‐situ force measurement during nano‐indentation combined with Laue microdiffraction. Nano Select 2020. [DOI: 10.1002/nano.202000073] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]  Open
Number Cited by Other Article(s)
1
Kort-Kamp WJM, Murdick RA, Htoon H, Jones AC. Utilization of coupled eigenmodes in Akiyama atomic force microscopy probes for bimodal multifrequency sensing. NANOTECHNOLOGY 2022;33:455501. [PMID: 35853401 DOI: 10.1088/1361-6528/ac8232] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/07/2022] [Accepted: 07/18/2022] [Indexed: 06/15/2023]
2
Rong P, Zhang F, Yang Q, Chen H, Shi Q, Zhong S, Chen Z, Wang H. Processing Laue Microdiffraction Raster Scanning Patterns with Machine Learning Algorithms: A Case Study with a Fatigued Polycrystalline Sample. MATERIALS 2022;15:ma15041502. [PMID: 35208042 PMCID: PMC8877650 DOI: 10.3390/ma15041502] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/25/2021] [Revised: 01/18/2022] [Accepted: 02/09/2022] [Indexed: 02/01/2023]
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