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For: Benninghoven A, Anders V. Detection of phenylthiohydantoin derivatives of amino acids by SIMS. ACTA ACUST UNITED AC 1984. [DOI: 10.1002/oms.1210190712] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
Number Cited by Other Article(s)
1
Yakovlev NL, Kiryukhin MV, Antipina MN, Susanto TT, Ravi S, Adithyavairavan M, Sukhorukov GB. Secondary Ion Mass Spectrometry of Macromolecules Loading in Individual Polyelectrolyte Multilayer Microcapsules. Aust J Chem 2011. [DOI: 10.1071/ch11153] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
2
Coullerez G, Lundmark S, Malmström E, Hult A, Mathieu HJ. ToF-SIMS for the characterization of hyperbranched aliphatic polyesters: probing their molecular weight on surfaces based on principal component analysis (PCA). SURF INTERFACE ANAL 2003. [DOI: 10.1002/sia.1592] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
3
Coullerez G, Mathieu HJ, Lundmark S, Malkoch M, Magnusson H, Hult A. Cationization of dendritic macromolecule adsorbates on metals studied by time-of-flight secondary ion mass spectrometry. SURF INTERFACE ANAL 2003. [DOI: 10.1002/sia.1591] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
4
Benninghoven A. Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). ACTA ACUST UNITED AC 1994. [DOI: 10.1002/anie.199410231] [Citation(s) in RCA: 397] [Impact Index Per Article: 13.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
5
Benninghoven A. Chemische Analyse von anorganischen und organischen Oberflächen und von dünnen Schichten mit der statischen Flugzeit-Sekundärionen-Massenspektrometrie (TOF-SIMS). Angew Chem Int Ed Engl 1994. [DOI: 10.1002/ange.19941061004] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
6
Davies MC, Lynn RA. A review: secondary ion mass spectrometry (SIMS) of polymeric biomaterials. CLINICAL MATERIALS 1989;5:97-114. [PMID: 10147499 DOI: 10.1016/0267-6605(90)90010-s] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
7
Jabs HU, Assmann G, Greifendorf D, Benninghoven A. High performance liquid chromatography and time-of-flight secondary ion mass spectrometry: a new dimension in structural analysis of apolipoproteins. J Lipid Res 1988. [DOI: 10.1016/s0022-2275(20)38806-4] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]  Open
8
Williams TD, Vachon L, Anderegg RJ. Negative ion chemical ionization mass spectrometry of 2,4-dinitrophenyl amino acid esters. Anal Biochem 1986;153:372-9. [PMID: 3706716 DOI: 10.1016/0003-2697(86)90105-3] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/07/2023]
9
The Application of Time-of-Flight Secondary Ion Mass Spectrometry in the Characterization of Apolipoprotein Mutants. ACTA ACUST UNITED AC 1986. [DOI: 10.1007/978-3-642-82718-1_16] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
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