Potential Screening at Electrode/Ionic Liquid Interfaces from In Situ X-ray Photoelectron Spectroscopy

AC-Modulated XPS Enables to Externally Control the Electrical Field Distributions on Metal Electrode/Ionic Liquid Devices

X-Ray Photoelectron Spectroscopy (XPS) has been utilized to extract local electrical potential profiles by recording core-level binding energy shifts upon application of the AC [square-wave (SQW)] bias with different frequencies. An electrochemical system consisting of a coplanar capacitor with a polyethylene membrane (PEM) coated with the Ionic Liquid (IL) N,N-diethyl-N-methyl-N-(2-methoxyethyl) ammonium bis(trifluoromethanesulfonyl)imide (DEME-TFSI) as the electrolyte is investigated. Analyses are carried out in operando, such that XPS measurements are recorded simultaneously with current measurements. ILs have complex charging/discharging processes, in addition to the formation of Electrical Double Layers (EDL) at the interfaces, and certain properties of these processes can be captured using AC modulation within appropriate time windows of observation. Herein, we select two frequencies, namely, 10 kHz and 0.1 Hz, to separate effects of the fast polarization and slow migratory motions, respectively. Moreover, the local potential developments after adding two equivalent series resistors at three different physical positions of the device have been carefully evaluated from the binding energy shifts in the F 1s peak representing the anion of the IL. This circuit modification allows us to quantify the AC currents passing through the device, as well as the system's impedance, in addition to revealing the potential variations due the IR drops. The complex AC-modulated local XPS data recorded can also be faithfully reproduced using the unmodulated F 1s spectrum and by convoluting it with electrical circuit output provided by the LT-Spice software. The outcome of these efforts is a more realistic equivalent circuit model, which can be related to chemical/physical makeup of the electrochemical system. An important finding of this methodology emerges as the possibility to induce additional local electrical field developments within the device, the directions of which can be reversed controllably.

Assessing Local Electrical Properties of Ionic Liquid/Metal Interfaces with Operando-XPS and by Incorporating Additional Circuit Elements

X-ray photoelectron spectroscopy (XPS) has been utilized to record binding energy changes upon applying direct current (DC) and/or alternating current (AC) (square-wave) bias with different frequencies on a coplanar capacitor, having an ionic liquid (IL) film as the electrolyte. Electrical potential developments in numerous locations on the device are extracted from the variations in binding energy positions of the atomic core levels, which together with electrochemical measurements are used to extract local information before and after insertion of additional resistors in series. The presence of the IL introduces complex charging/discharging processes with a direct influence on the electrical double layer (EDL) formation, some of which can be untangled from each other via AC modulation by choosing appropriate time windows of observation. Accordingly, under 10 kHz modulation, fast processes are sampled, which are associated with electronic currents, and effects of slow migratory currents can be measured using 0.1 Hz. The addition of serial resistors allows us to quantify AC currents passing through, which reveals the magnitude of the system's impedance under different conditions. This process surprisingly reverses differences(s) in the voltage developments between the low and high frequencies over the electrified electrodes compared to those over the porous membrane in between. Our approach turns XPS into a powerful electrical and surface-sensitive tool for extracting localized electrochemical properties in a noninvasive and direct way. We expect that a wider utilization of the technique will lead to better identification of the obstacles for developing the next-generation sensing, energy harvesting, and storage systems as well as devices for iontronic/neuromorphic applications.

Enrichment effects of ionic liquid mixtures at polarized electrode interfaces monitored by potential screening

The behavior of ionic liquids (ILs) at charged interfaces is pivotal for their application in supercapacitors and electrochemical cells. Recently, we demonstrated for neat ILs that potential screening at polarized electrode interfaces shows a characteristic voltage dependence, as determined in situ by X-ray photoelectron spectroscopy. Herein, we use this fingerprint-type behavior to characterize the nature of the IL/electrode interfaces for IL mixtures of [C₈C₁Im][Tf₂N] and [C₈C₁Im]Cl on Au and Pt electrodes. For Au, the IL/electrode interfaces are dominated by the Cl⁻ anions, even down to a 0.1 mol% [C₈C₁Im]Cl content. In contrast, [Tf₂N]⁻ anions enrich at the IL/Pt electrode interfaces down to 10 mol% [C₈C₁Im][Tf₂N]; only at lower concentrations does a transition to Cl⁻ enrichment occur. These mixture studies demonstrate that even small concentrations of another IL or contamination, e.g. remaining from synthesis, can strongly influence the situation at charged IL interfaces.

The interface of electrodes and IL mixtures has been studied by in situ XPS. We found that the concentration of counterions at the interface can strongly deviate from the bulk composition due to interactions between electrode and IL.

Growth of Multilayers of Ionic Liquids on Au(111) Investigated by Atomic Force Microscopy in Ultrahigh Vacuum

Understanding the growth of ultrathin films of ionic liquids (ILs) on metal surfaces is of highest relevance for a variety of applications. We present a detailed study of the growth of the wetting layer and successive multilayers of 1,3-dimethylimidazolium bis[(trifluoromethyl)sulfonyl]imide ([C1C1Im][Tf2N]) on Au(111). By atomic force microscopy (AFM) in ultrahigh vacuum, we follow the temperature-dependent behavior between 110 and 300 K at defined coverages. We initially observe the formation of a wetting layer with a thickness of ∼0.37 nm with anions and cations arranged in a checkerboard structure. Stable AFM imaging up to 280 K allows us to follow the IL growing on top of the wetting layer in bilayers with an average thickness of ∼0.71 nm, that is, double the height of the wetting layer, in a bilayer-by-bilayer fashion. This growth behavior is independently confirmed from the surface morphology, as deduced from AFM and angle-resolved X-ray photoelectron spectroscopy. High-resolution AFM images at 110 K allow for identifying the molecular surface structure of the bilayers as a striped phase, which is one of the phases also seen for the wetting layer (Meusel, M.; Lexow, M.; Gezmis, A.; Schotz, S.; Wagner, M.; Bayer, A.; Maier, F.; Steinrück, H. P. Atomic Force and Scanning Tunneling Microscopy of Ordered Ionic Liquid Wetting Layers from 110 K up to Room Temperature. ACS Nano 2020, 14, 9000-9010).