Effect of molecular weight on microcrystalline structure formation in polymer with perylenediimide side chain

Impact of the Composition of Alcohol/Water Dispersion on the Proton Transport and Morphology of Cast Perfluorinated Sulfonic Acid Ionomer Thin Films

The dispersion of perfluorinated sulfonic acid ionomers in catalyst inks is an important factor that controls the performance of catalyst layers in membrane electrode assemblies of polymer electrolyte fuel cells. Herein, the effects of water/alcohol compositions on the morphological properties and proton transport are examined by grazing incidence small-angle X-ray scattering, grazing incidence wide-angle X-ray scattering, and electrochemical impedance spectroscopy. The thin films cast by a high water/alcohol ratio Nafion dispersion have high proton conductivity and well-defined hydrophilic/hydrophobic phase separation, which indicates that the proton conductivity and morphology of the Nafion thin films are strongly influenced by the state of dispersion. This finding is expected to further understand the morphology and proton transport properties of Nafion thin films with different water/alcohol ratios, which has implications for the performance of the Pt/Nafion interface.

Application of Synchrotron Radiation X-ray Scattering and Spectroscopy to Soft Matter

Light produced by synchrotron radiation (SR) is much brighter than that produced by conventional laboratory X-ray sources. The photon energy of SR X-ray ranges from soft and tender X-rays to hard X-rays. Moreover, X-rays become element sensitive with decreasing photon energy. By using a wide energy range and high-quality light of SR, different scattering and spectroscopic methods were applied to various soft matters. We present five of our recent studies performed using specific light properties of a synchrotron facility, which are as follows: (1) In situ USAXS study to understand the deformation behavior of colloidal crystals during uniaxial stretching; (2) structure characterization of semiconducting polymer thin films along the film thickness direction by grazing-incidence wide-angle X-ray scattering using tender X-rays; (3) X-ray absorption fine structure (XAFS) analysis of the formation mechanism of poly(3-hexylthiophene) (P3HT); (4) soft X-ray absorption and emission spectroscopic analysis of water structure in polyelectrolyte brushes; and (5) X-ray photon correlation spectroscopic analysis of the diffusion behavior of polystyrene-grafted nanoparticles dispersed in a polystyrene matrix.

Morphology Changes in Perfluorosulfonated Ionomer from Thickness and Thermal Treatment Conditions

The morphological changes of Nafion thin films with thicknesses from 10 to 200 nm on Pt substrate with various annealing histories (unannealed to 240 °C) were systematically investigated using grazing incidence small-angle X-ray scattering (GISAXS) and grazing incidence wide-angle X-ray scattering (GIWAXS). The results revealed that the hydrophilic ionic domain and hydrophobic backbone in Nafion thin films changed significantly when the annealing treatment exceeded the cluster transition temperature, which decreased proton conductivity, due to the constrained hydrophilic/hydrophobic phase separation, and increased the crystalline-rich domain. This research contributed to the understanding of ionomer thermal stability in the catalyst layer, which is subjected to thermal annealing during the hot-pressing process.

Depth-Resolved Characterization of Perylenediimide Side-Chain Polymer Thin Film Structure Using Grazing-Incidence Wide-Angle X-ray Diffraction with Tender X-rays

Polymers with a perylenediimide (PDI) side chain (PAc12PDI) consist of two kinds of crystalline structures with various types of orientations in a thin film. Understanding the population of the microcrystalline structure and its orientation along the thickness is strongly desired. Grazing-incidence wide-angle X-ray diffraction (GIWAXD) measurements with hard X-rays, which are generally chosen as λ = 0.1 nm, are a powerful tool to evaluate the molecular aggregation structure in thin films. A depth-resolved analysis for the outermost surface of the polymeric materials using conventional GIWAXD measurements, however, has limitations on depth resolution because the X-ray penetration depth dramatically increases above the critical angle. Meanwhile, tender X-rays (λ = 0.5 nm) have the potential advantage that the penetration depth gradually increases above the critical angle, leading to precise characterization for the population of crystallite distribution along the thickness. The population of the microcrystalline states in the PAc12PDI thin film was precisely characterized utilizing GIWAXD measurements using tender X-rays. The outermost surface of the PAc12PDI thin film is occupied by a monoclinic lattice with a = 2.38 nm, b = 0.74 nm, c = 5.98 nm, and β = 108.13°, while maintaining the c-axis perpendicular to the substrate surface. Additionally, the presence of solid substrate controls the formation of the crystallite with unidirectional orientation.