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For: Lee YH, Wang KL, Jaworowski A, Mooney PM, Cheng LJ, Corbett JW. A transient capacitance study of radiation-induced defects in aluminum-doped silicon. ACTA ACUST UNITED AC 1980. [DOI: 10.1002/pssa.2210570228] [Citation(s) in RCA: 26] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]

For:	Lee YH, Wang KL, Jaworowski A, Mooney PM, Cheng LJ, Corbett JW. A transient capacitance study of radiation-induced defects in aluminum-doped silicon. ACTA ACUST UNITED AC 1980. [DOI: 10.1002/pssa.2210570228] [Citation(s) in RCA: 26] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]

Number	Cited by Other Article(s)
1	Intrinsic Point Defects. COMPUTATIONAL MICROELECTRONICS 2004. [DOI: 10.1007/978-3-7091-0597-9_2] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/19/2023] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse