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Ciston J, Brown HG, D'Alfonso AJ, Koirala P, Ophus C, Lin Y, Suzuki Y, Inada H, Zhu Y, Allen LJ, Marks LD. Surface determination through atomically resolved secondary-electron imaging. Nat Commun 2015; 6:7358. [PMID: 26082275 PMCID: PMC4557350 DOI: 10.1038/ncomms8358] [Citation(s) in RCA: 33] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/03/2014] [Accepted: 04/29/2015] [Indexed: 11/30/2022] Open
Abstract
Unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we report a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 × 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our work reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.
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Affiliation(s)
- J. Ciston
- National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
| | - H. G. Brown
- School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
| | - A. J. D'Alfonso
- School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
| | - P. Koirala
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
| | - C. Ophus
- National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
| | - Y. Lin
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
| | - Y. Suzuki
- Application Development Department, Hitachi High Technologies Corp., Ibaraki 312-8504, Japan
| | - H. Inada
- Advanced Microscope Design Department, Hitachi High Technologies Corp., Ibaraki 312-8504, Japan
| | - Y. Zhu
- Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - L. J. Allen
- School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
| | - L. D. Marks
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
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Trasatti S. Systematic trends in the crystal face specificity of interfacial parameters: The cases of Ag and Au. J Electroanal Chem (Lausanne) 1992. [DOI: 10.1016/0022-0728(92)80219-t] [Citation(s) in RCA: 30] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
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Nihoul G, Abdelmoula K, Métois J. High resolution images of a reconstructed surface structure on (111) gold platelets: Interpretation and comparison with theoretical models. Ultramicroscopy 1983. [DOI: 10.1016/0304-3991(83)90249-8] [Citation(s) in RCA: 26] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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