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For: Kuroda M, Katayama R, Nishio S, Onabe K, Shiraki Y. Hall effect measurement of InAsN alloy films grown directly on GaAs(001) substrates by RF‐MBE. ACTA ACUST UNITED AC 2003. [DOI: 10.1002/pssc.200303490] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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