1
|
Tokarski T, Nolze G, Winkelmann A, Rychłowski Ł, Bała P, Cios G. Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio. Ultramicroscopy 2021; 230:113372. [PMID: 34479040 DOI: 10.1016/j.ultramic.2021.113372] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/15/2021] [Revised: 07/27/2021] [Accepted: 08/05/2021] [Indexed: 10/20/2022]
Abstract
Signal optimization for transmission Kikuchi diffraction (TKD) measurements in the scanning electron microscope is investigated by a comparison of different sample holder designs. An optimized design is presented, which uses a metal shield to efficiently trap the electron beam after transmission through the sample. For comparison, a second holder configuration allows a significant number of the transmitted electrons to scatter back from the surface of the sample holder onto the diffraction camera screen. It is shown that the secondary interaction with the sample holder leads to a significant increase in the background level, as well as to additional noise in the final Kikuchi diffraction signal. The clean TKD signal of the optimized holder design with reduced background scattering makes it possible to use small signal changes in the range of 2% of the camera full dynamic range. As is shown by an analysis of the power spectrum, the signal-to-noise ratio in the processed Kikuchi diffraction patterns is improved by an order of magnitude. As a result, the optimized design allows an increase in pattern signal to noise ratio which may lead to increase in measurement speed and indexing reliability.
Collapse
Affiliation(s)
- Tomasz Tokarski
- Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, al. A. Mickiewicza 30, 30-059 Krakow, Poland.
| | - Gert Nolze
- Federal Institute for Materials, Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany.
| | - Aimo Winkelmann
- Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, al. A. Mickiewicza 30, 30-059 Krakow, Poland.
| | - Łukasz Rychłowski
- Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, al. A. Mickiewicza 30, 30-059 Krakow, Poland.
| | - Piotr Bała
- Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, al. A. Mickiewicza 30, 30-059 Krakow, Poland; Faculty of Metals and Industrial Computer Science, AGH University of Science and Technology, al. A. Mickiewicza 30, 30-059 Krakow, Poland.
| | - Grzegorz Cios
- Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, al. A. Mickiewicza 30, 30-059 Krakow, Poland.
| |
Collapse
|
2
|
Fanta ABS, Fuller A, Alimadadi H, Todeschini M, Goran D, Burrows A. Improving the imaging capability of an on-axis transmission Kikuchi detector. Ultramicroscopy 2019; 206:112812. [PMID: 31382231 DOI: 10.1016/j.ultramic.2019.112812] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/21/2019] [Revised: 06/30/2019] [Accepted: 07/07/2019] [Indexed: 10/26/2022]
Abstract
Transmission Kikuchi Diffraction (TKD) in the scanning electron microscope has been developing at a fast pace since its introduction less than a decade ago. The recently presented on-axis detector configuration, with its optimized geometry, has significantly increased the signal yield and facilitated the acquisition of STEM images in bright field (BF) and dark field (DF) mode, in addition to the automated orientation mapping of nanocrystalline electron transparent samples. However, the physical position of the integrated imaging system, located outside the detector screen, requires its movement in order to combine high resolution STEM images with high resolution orientation measurements. The difference between the two positions makes it impossible to acquire optimal signals simultaneously, leading to challenges when investigating site-specific nanocrystalline microstructures. To eliminate this drawback, a new imaging capability was added at the centre of the on-axis TKD detector, thus enabling acquisition of optimal quality BF images and orientation maps without detector movement. The advantages brought about by this new configuration are presented and the associated limitations are discussed.
Collapse
Affiliation(s)
- Alice Bastos S Fanta
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Fysikvej 307, 2800 Kgs. Lyngby, Denmark.
| | - Adam Fuller
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Fysikvej 307, 2800 Kgs. Lyngby, Denmark.
| | - Hossein Alimadadi
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Fysikvej 307, 2800 Kgs. Lyngby, Denmark; Danish Technological Institute, Kongsvang Alle 29, 8000 Aarhus C, Denmark.
| | - Matteo Todeschini
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Fysikvej 307, 2800 Kgs. Lyngby, Denmark; Blue Scientific Ltd., St. John's Innovation Centre, Cowley Road, Cambridge CB4 0WS, UK
| | | | - Andrew Burrows
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Fysikvej 307, 2800 Kgs. Lyngby, Denmark; ISS Group Services Ltd, Pellowe House, Francis Road, Withington, Manchester, Greater Manchester M20 4XP, UK
| |
Collapse
|
3
|
Kuo CW, Kuo JC, Wang SC. Resolution of transmission electron backscatter diffraction in aluminum and silver: Effect of the atomic number. Ultramicroscopy 2018; 193:126-136. [PMID: 30005322 DOI: 10.1016/j.ultramic.2018.06.019] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/26/2018] [Revised: 06/21/2018] [Accepted: 06/27/2018] [Indexed: 11/26/2022]
Abstract
This work aims to investigate the influence of intrinsic and extrinsic factors on the physical resolution of the transmission electron backscattered diffraction technique (t-EBSD) in aluminum and silver. Here, we focus on the intrinsic factors, namely, atomic number and thickness of the specimen, and extrinsic set-up factors, which include the electron beam voltage, working distance, and specimen tilt. The working distance and tilt angle, which are selected as 12 mm and 60° for Al and 12 mm and 50° for Ag, respectively, reveal a sharp pattern with high contrast. The physical resolutions at the lateral and longitudinal directions depend on the depth resolution. The depth and lateral and longitudinal resolutions increase in Al but decrease in Ag with increased accelerating voltage. The decrease in specimen thickness for Al and Ag from 400 nm to 100 nm reduces the lateral and longitudinal resolutions. The most ideal depth and lateral and longitudinal resolutions obtained under a thickness of 100 nm are 22.7, 18.9, and 33.7 nm at 30 kV for Ag and 34.7, 22.8, and 36.6 nm at 15 kV for Al, respectively.
Collapse
Affiliation(s)
- Chia-Wei Kuo
- Department of Materials Science and Engineering, National Cheng Kung University, Tainan 701, Taiwan, ROC
| | - Jui-Chao Kuo
- Department of Materials Science and Engineering, National Cheng Kung University, Tainan 701, Taiwan, ROC.
| | - Sheng-Chang Wang
- Department of Mechanical Engineering, Southern Taiwan University of Technology, Tainan 71005, Taiwan, ROC
| |
Collapse
|
4
|
Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review. J Imaging 2018. [DOI: 10.3390/jimaging4070088] [Citation(s) in RCA: 20] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022] Open
|
5
|
Gazder AA, Elkhodary KI, Nancarrow MJ, Saleh AA. Transmission Kikuchi diffraction versus electron back-scattering diffraction: A case study on an electron transparent cross-section of TWIP steel. Micron 2017; 103:53-63. [DOI: 10.1016/j.micron.2017.09.008] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/01/2017] [Revised: 09/20/2017] [Accepted: 09/20/2017] [Indexed: 12/01/2022]
|
6
|
VALERY A, RAUCH E, CLÉMENT L, LORUT F. Retrieving overlapping crystals information from TEM nano-beam electron diffraction patterns. J Microsc 2017; 268:208-218. [DOI: 10.1111/jmi.12599] [Citation(s) in RCA: 19] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/09/2016] [Revised: 06/05/2017] [Accepted: 06/06/2017] [Indexed: 11/25/2022]
Affiliation(s)
- A. VALERY
- Physical Characterization group, STMicroelectronics; Crolles France
- SIMaP Laboratory, CNRS, Université Grenoble Alpes; Grenoble France
| | - E.F. RAUCH
- SIMaP Laboratory, CNRS, Université Grenoble Alpes; Grenoble France
| | - L. CLÉMENT
- Physical Characterization group, STMicroelectronics; Crolles France
| | - F. LORUT
- Physical Characterization group, STMicroelectronics; Crolles France
| |
Collapse
|
7
|
La Fontaine A, Piazolo S, Trimby P, Yang L, Cairney JM. Laser-Assisted Atom Probe Tomography of Deformed Minerals: A Zircon Case Study. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2017; 23:404-413. [PMID: 28134066 DOI: 10.1017/s1431927616012745] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
The application of atom probe tomography to the study of minerals is a rapidly growing area. Picosecond-pulsed, ultraviolet laser (UV-355 nm) assisted atom probe tomography has been used to analyze trace element mobility within dislocations and low-angle boundaries in plastically deformed specimens of the nonconductive mineral zircon (ZrSiO4), a key material to date the earth's geological events. Here we discuss important experimental aspects inherent in the atom probe tomography investigation of this important mineral, providing insights into the challenges in atom probe tomography characterization of minerals as a whole. We studied the influence of atom probe tomography analysis parameters on features of the mass spectra, such as the thermal tail, as well as the overall data quality. Three zircon samples with different uranium and lead content were analyzed, and particular attention was paid to ion identification in the mass spectra and detection limits of the key trace elements, lead and uranium. We also discuss the correlative use of electron backscattered diffraction in a scanning electron microscope to map the deformation in the zircon grains, and the combined use of transmission Kikuchi diffraction and focused ion beam sample preparation to assist preparation of the final atom probe tip.
Collapse
Affiliation(s)
- Alexandre La Fontaine
- 1School of Aerospace, Mechanical, Mechatronic Engineering,The University of Sydney,NSW 2006,Australia
| | - Sandra Piazolo
- 3Department of Earth and Planetary Science,Macquarie University,NSW 2109,Australia
| | - Patrick Trimby
- 2Australian Centre for Microscopy and Microanalysis,The University of Sydney,NSW 2006,Australia
| | - Limei Yang
- 2Australian Centre for Microscopy and Microanalysis,The University of Sydney,NSW 2006,Australia
| | - Julie M Cairney
- 1School of Aerospace, Mechanical, Mechatronic Engineering,The University of Sydney,NSW 2006,Australia
| |
Collapse
|
8
|
YUAN H, BRODU E, CHEN C, BOUZY E, FUNDENBERGER JJ, TOTH L. On-axis versus off-axis Transmission Kikuchi Diffraction technique: application to the characterisation of severe plastic deformation-induced ultrafine-grained microstructures. J Microsc 2017; 267:70-80. [DOI: 10.1111/jmi.12548] [Citation(s) in RCA: 18] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/15/2016] [Revised: 02/08/2017] [Accepted: 02/12/2017] [Indexed: 12/01/2022]
Affiliation(s)
- H. YUAN
- Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3); Université de Lorraine; Metz France
- Laboratory of Excellence on Design of Alloy Metals for low-Mass Structures (DAMAS); University of Lorraine; Metz France
| | - E. BRODU
- Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3); Université de Lorraine; Metz France
- Laboratory of Excellence on Design of Alloy Metals for low-Mass Structures (DAMAS); University of Lorraine; Metz France
| | - C. CHEN
- Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3); Université de Lorraine; Metz France
- Laboratory of Excellence on Design of Alloy Metals for low-Mass Structures (DAMAS); University of Lorraine; Metz France
| | - E. BOUZY
- Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3); Université de Lorraine; Metz France
- Laboratory of Excellence on Design of Alloy Metals for low-Mass Structures (DAMAS); University of Lorraine; Metz France
| | - J-J. FUNDENBERGER
- Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3); Université de Lorraine; Metz France
- Laboratory of Excellence on Design of Alloy Metals for low-Mass Structures (DAMAS); University of Lorraine; Metz France
| | - L.S. TOTH
- Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3); Université de Lorraine; Metz France
- Laboratory of Excellence on Design of Alloy Metals for low-Mass Structures (DAMAS); University of Lorraine; Metz France
| |
Collapse
|
9
|
Li CW, Han LZ, Luo XM, Liu QD, Gu JF. Fine structure characterization of martensite/austenite constituent in low-carbon low-alloy steel by transmission electron forward scatter diffraction. J Microsc 2016; 264:252-258. [PMID: 27571433 DOI: 10.1111/jmi.12465] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/05/2016] [Revised: 07/02/2016] [Accepted: 08/02/2016] [Indexed: 11/30/2022]
Abstract
Transmission electron forward scatter diffraction and other characterization techniques were used to investigate the fine structure and the variant relationship of the martensite/austenite (M/A) constituent of the granular bainite in low-carbon low-alloy steel. The results demonstrated that the M/A constituents were distributed in clusters throughout the bainitic ferrite. Lath martensite was the main component of the M/A constituent, where the relationship between the martensite variants was consistent with the Nishiyama-Wassermann orientation relationship and only three variants were found in the M/A constituent, suggesting that the variants had formed in the M/A constituent according to a specific mechanism. Furthermore, the Σ3 boundaries in the M/A constituent were much longer than their counterparts in the bainitic ferrite region. The results indicate that transmission electron forward scatter diffraction is an effective method of crystallographic analysis for nanolaths in M/A constituents.
Collapse
Affiliation(s)
- C W Li
- Institute of Materials Modification and Modeling, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, P.R. China
| | - L Z Han
- Institute of Materials Modification and Modeling, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, P.R. China
| | - X M Luo
- Institute of Materials Modification and Modeling, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, P.R. China
| | - Q D Liu
- Institute of Materials Modification and Modeling, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, P.R. China
| | - J F Gu
- Institute of Materials Modification and Modeling, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, P.R. China.
| |
Collapse
|
10
|
de Jeer LTH, Ribas Gomes D, Nijholt JE, van Bremen R, Ocelík V, De Hosson JTM. Formation of Nanoporous Gold Studied by Transmission Electron Backscatter Diffraction. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2015; 21:1387-1397. [PMID: 26514692 DOI: 10.1017/s1431927615015329] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Transmission electron backscatter diffraction (t-EBSD) was used to investigate the effect of dealloying on the microstructure of 140-nm thin gold foils. Statistical and local comparisons of the microstructure between the nonetched and nanoporous gold foils were made. Analyses of crystallographic texture, misorientation distribution, and grain structure clearly prove that during the dealloying manufacturing process of nanoporous materials the crystallographic texture is enhanced significantly with a clear decrease of internal strain, whereas maintaining the grain structure.
Collapse
Affiliation(s)
- Leo T H de Jeer
- Department of Applied Physics,Zernike Institute for Advanced Materials,University of Groningen,Nijenborgh 4,9747 AG Groningen,The Netherlands
| | - Diego Ribas Gomes
- Department of Applied Physics,Zernike Institute for Advanced Materials,University of Groningen,Nijenborgh 4,9747 AG Groningen,The Netherlands
| | - Jorrit E Nijholt
- Department of Applied Physics,Zernike Institute for Advanced Materials,University of Groningen,Nijenborgh 4,9747 AG Groningen,The Netherlands
| | - Rik van Bremen
- Department of Applied Physics,Zernike Institute for Advanced Materials,University of Groningen,Nijenborgh 4,9747 AG Groningen,The Netherlands
| | - Václav Ocelík
- Department of Applied Physics,Zernike Institute for Advanced Materials,University of Groningen,Nijenborgh 4,9747 AG Groningen,The Netherlands
| | - Jeff Th M De Hosson
- Department of Applied Physics,Zernike Institute for Advanced Materials,University of Groningen,Nijenborgh 4,9747 AG Groningen,The Netherlands
| |
Collapse
|
11
|
Abbasi M, Kim DI, Guim HU, Hosseini M, Danesh-Manesh H, Abbasi M. Application of Transmitted Kikuchi Diffraction in Studying Nano-oxide and Ultrafine Metallic Grains. ACS NANO 2015; 9:10991-11002. [PMID: 26482120 DOI: 10.1021/acsnano.5b04296] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Transmitted Kikuchi diffraction (TKD) is an emerging SEM-based technique that enables investigation of highly refined grain structures. It offers higher spatial resolution by utilizing conventional electron backscattered diffraction equipment on electron-transparent samples. A successful attempt has been made to reveal nano-oxide grain structures as well as ultrafine severely deformed metallic grains. The effect of electron beam current was studied. Higher beam currents enhance pattern contrast and intensity. Lower detector exposure times could be employed to accelerate the acquisition time and minimize drift and carbon contamination. However, higher beam currents increase the electron interaction volume and compromise the spatial resolution. Lastly, TKD results were compared to orientation mapping results in TEM (ASTAR). Results indicate that a combination of TKD and EDS is a capable tool to characterize nano-oxide grains such as Al2O3 and Cr2O3 with similar crystal structures.
Collapse
Affiliation(s)
- Majid Abbasi
- High Temperature Energy Materials Research Center, Korea Institute of Science and Technology , Seoul 02792, Republic of Korea
| | - Dong-Ik Kim
- High Temperature Energy Materials Research Center, Korea Institute of Science and Technology , Seoul 02792, Republic of Korea
| | - Hwan-Uk Guim
- Korea Basic Science Institute , Daejeon 34133, Republic of Korea
| | - Morteza Hosseini
- Department of Materials Science and Engineering, Shiraz University , Shiraz, Iran
| | - Habib Danesh-Manesh
- Department of Materials Science and Engineering, Shiraz University , Shiraz, Iran
| | - Mehrdad Abbasi
- Department of Mining and Metallurgy, Amirkabir University of Technology , Tehran, Iran
| |
Collapse
|
12
|
van Bremen R, Ribas Gomes D, de Jeer LTH, Ocelík V, De Hosson JTM. On the optimum resolution of transmission-electron backscattered diffraction (t-EBSD). Ultramicroscopy 2015; 160:256-264. [PMID: 26579885 DOI: 10.1016/j.ultramic.2015.10.025] [Citation(s) in RCA: 37] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/12/2015] [Revised: 10/22/2015] [Accepted: 10/29/2015] [Indexed: 10/22/2022]
Abstract
The work presented aims at determining the optimum physical resolution of the transmission-electron backscattered diffraction (t-EBSD) technique. The resolution depends critically on intrinsic factors such as the density, atomic number and thickness of the specimen but also on the extrinsic experimental set-up of the electron beam voltage, specimen tilt and detector position. In the present study, the so-called physical resolution of a typical t-EBSD set-up was determined with the use of Monte Carlo simulations and confronted to experimental findings. In the case of a thin Au film of 20 nm, the best resolution obtained was 9 nm whereas for a 100 nm Au film the best resolution was 66 nm. The precise dependence of resolution on thickness was found to vary differently depending on the specific elements involved. This means that the resolution of each specimen should be determined individually. Experimentally the median probe size of the t-EBSD for a 140 nm thick AuAg specimen was measured to be 87 nm. The first and third quartiles of the probe size measurements were found to be 60 nm and 118 nm. Simulation of this specimen resulted in a resolution of 94 nm which fits between these quartiles.
Collapse
Affiliation(s)
- R van Bremen
- Department of Applied Physics, Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
| | - D Ribas Gomes
- Department of Applied Physics, Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
| | - L T H de Jeer
- Department of Applied Physics, Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
| | - V Ocelík
- Department of Applied Physics, Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands.
| | - J Th M De Hosson
- Department of Applied Physics, Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
| |
Collapse
|
13
|
Birosca S, Ding R, Ooi S, Buckingham R, Coleman C, Dicks K. Nanostructure characterisation of flow-formed Cr-Mo-V steel using transmission Kikuchi diffraction technique. Ultramicroscopy 2015; 153:1-8. [PMID: 25697460 DOI: 10.1016/j.ultramic.2015.02.001] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/20/2014] [Revised: 02/02/2015] [Accepted: 02/07/2015] [Indexed: 10/24/2022]
Abstract
Nowadays flow-forming has become a desired near net shape manufacturing method as it provides excellent mechanical properties with improved surface finish and significant manufacturing cost reduction. However, the material is subjected to excessive plastic deformation during flow-forming process, generating a very fine and complex microstructure. In addition, the intense dislocation density and residual stress that is generated in the component during processing makes the microstructure characterisation using conventional micro-analytical tools challenging. Thus, the microstructure/property relationship study in such a material is rather difficult. In the present study a flow-formed Cr-Mo-V steel nanostructure and crystallographic texture were characterised by means of Transmission Kikuchi Diffraction (TKD). Here, TKD is shown to be a powerful technique in revealing very fine martensite laths within an austenite matrix. Moreover, fine precipitates in the order of 20-70 nm on the martensite lath boundaries were clearly imaged and characterised. This greatly assisted in understanding the preferable site formation of the carbides in such a complex microstructure. The results showed that the actual TKD spatial resolution was in the range of 5-10 nm using 25 kV for flow-formed Cr-Mo-V steel.
Collapse
Affiliation(s)
- S Birosca
- Materials Research Centre, College of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP, UK.
| | - R Ding
- School of Metallurgy and Materials, University of Birmingham, Edgbaston, Birmingham B15 2TT, UK
| | - S Ooi
- Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, UK
| | - R Buckingham
- Materials Research Centre, College of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP, UK
| | - C Coleman
- Materials Research Centre, College of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP, UK
| | - K Dicks
- Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe, Buckinghamshire HP12 3SE, UK
| |
Collapse
|
14
|
Brodusch N, Demers H, Trudeau M, Gauvin R. High-resolution imaging and X-ray microanalysis in the FE-SEM. SURF INTERFACE ANAL 2014. [DOI: 10.1002/sia.5584] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
Affiliation(s)
| | - Hendrix Demers
- McGill University; University St. Montréal H3A 0C5 Canada
| | | | - Raynald Gauvin
- McGill University; University St. Montréal H3A 0C5 Canada
| |
Collapse
|
15
|
Bandli BR, Gunter ME. Scanning electron microscopy and transmitted electron backscatter diffraction examination of asbestos standard reference materials, amphibole particles of differing morphology, and particle phase discrimination from talc ores. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2014; 20:1805-1816. [PMID: 25339300 DOI: 10.1017/s1431927614013415] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Since 1972, when the US Occupational Health and Safety Administration established the first limits on occupational exposure to asbestos fibers, numerous analytical methods employing several microscopy techniques have been developed to identify a group of minerals defined by legislation as asbestos. While transmission electron microscopy (TEM) is implemented in standardized analytical methods, these methods specify the use of selected area electron diffraction. Because of this constraint, the diffraction data a TEM can provide are often underutilized due to challenges associated with collecting and interpreting individual diffraction patterns. It has been shown that transmission electron backscatter diffraction (tEBSD) produces diffraction patterns nearly identical to electron backscatter diffraction, but from smaller crystal domains. This paper explores the utility of tEBSD for characterization of asbestiform particles from reference asbestos materials, a suite of amphibole minerals of varying morphologies to determine if there is a correlation between mineral habit (i.e., crystal form), microscopic particle shape preferred orientation, and mineral specimens from an industrial talc deposit to provide a case study of the utility and limitations of the technique.
Collapse
Affiliation(s)
- Bryan R Bandli
- 1Department of Geological Sciences,University of Minnesota,Duluth,1114 Kirby Dr.,229 Heller Hall,Duluth,MN 55812,USA
| | - Mickey E Gunter
- 2Department of Geological Sciences,University of Idaho,875 Perimeter Drive,MS 3022,Moscow,ID 83844,USA
| |
Collapse
|
16
|
RICE K, KELLER R, STOYKOVICH M. Specimen-thickness effects on transmission Kikuchi patterns in the scanning electron microscope. J Microsc 2014; 254:129-36. [DOI: 10.1111/jmi.12124] [Citation(s) in RCA: 47] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/05/2013] [Accepted: 02/15/2014] [Indexed: 11/28/2022]
Affiliation(s)
- K.P. RICE
- Applied Chemicals and Materials Division; National Institute of Standards and Technology; Boulder Colorado U.S.A
| | - R.R. KELLER
- Applied Chemicals and Materials Division; National Institute of Standards and Technology; Boulder Colorado U.S.A
| | - M.P. STOYKOVICH
- Department of Chemical and Biological Engineering; University of Colorado; Boulder Colorado U.S.A
| |
Collapse
|