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For: Wagner T, Krbal M, Gutwirth J, Nemec P, Vlcek M, Frumar M, Perina V, Mackova A, Hnatovitz V, Kasap SO, Vlcek M. Characterization of AgAsS and AgSbS amorphous films prepared by pulsed laser deposition. SURF INTERFACE ANAL 2004. [DOI: 10.1002/sia.1860] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Number Cited by Other Article(s)
1
Rading D, Moellers R, Kollmer F, Paul W, Niehuis E. Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions. SURF INTERFACE ANAL 2010. [DOI: 10.1002/sia.3422] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
2
Wehbe N, Houssiau L. ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams. SURF INTERFACE ANAL 2010. [DOI: 10.1002/sia.3426] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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