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Citation(s) in RCA

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For: Shiramizu T, Tanimura J, Kurokawa H, Sasaki H, Abe S. Diffusion phenomena at the interface between dielectric films and compound semiconductors. SURF INTERFACE ANAL 2005. [DOI: 10.1002/sia.1950] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Number Cited by Other Article(s)
1
Zhang L, Dai C, Zhang J. 3D ToF‐SIMS view of interfacial diffusion between Cr 2 AlC coating and zircaloy substrate. SURF INTERFACE ANAL 2019. [DOI: 10.1002/sia.6715] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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