• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4596627)   Today's Articles (4370)   Subscriber (49344)
For: Kim KJ, Moon DW, Chi P, Simons D. Development of B-doped Si multiple delta-layer reference materials for SIMS profiling. SURF INTERFACE ANAL 2005. [DOI: 10.1002/sia.2080] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Number Cited by Other Article(s)
1
Development of a Certified Reference Material with Delta-Doped Boron Nitride Layers for Surface Depth-Profile Analysis. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 2016. [DOI: 10.1380/ejssnt.2016.125] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
2
Kang N, Joong Kim K, Seog Kim J, Hae Lee J. Roles of chemical metrology in electronics industry and associated environment in Korea: a tutorial. Talanta 2014;134:284-291. [PMID: 25618669 DOI: 10.1016/j.talanta.2014.11.030] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/10/2014] [Revised: 11/14/2014] [Accepted: 11/15/2014] [Indexed: 11/25/2022]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA