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Muramoto S, Graham DJ, Castner DG. ToF-SIMS analysis of ultrathin films and their fragmentation patterns. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. A, VACUUM, SURFACES, AND FILMS : AN OFFICIAL JOURNAL OF THE AMERICAN VACUUM SOCIETY 2024; 42:023416. [PMID: 38328692 PMCID: PMC10846908 DOI: 10.1116/6.0003249] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/27/2023] [Revised: 12/10/2023] [Accepted: 01/05/2024] [Indexed: 02/09/2024]
Abstract
Organic thin films are of great interest due to their intriguing interfacial and functional properties, especially for device applications such as thin-film transistors and sensors. As their thickness approaches single nanometer thickness, characterization and interpretation of the extracted data become increasingly complex. In this study, plasma polymerization is used to construct ultrathin films that range in thickness from 1 to 20 nm, and time-of-flight secondary ion mass spectrometry coupled with principal component analysis is used to investigate the effects of film thickness on the resulting spectra. We demonstrate that for these cross-linked plasma polymers, at these thicknesses, the observed trends are different from those obtained from thicker films with lower degrees of cross-linking: contributions from ambient carbon contamination start to dominate the mass spectrum; cluster-induced nonlinear enhancement in secondary ion yield is no longer observed; extent of fragmentation is higher due to confinement of the primary ion energy; and the size of the primary ion source also affects fragmentation (e.g., Bi1 versus Bi5). These differences illustrate that care must be taken in choosing the correct primary ion source as well as in interpreting the data.
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Affiliation(s)
- Shin Muramoto
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899
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2
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Trindade GF, Sul S, Kim J, Havelund R, Eyres A, Park S, Shin Y, Bae HJ, Sung YM, Matjacic L, Jung Y, Won J, Jeon WS, Choi H, Lee HS, Lee JC, Kim JH, Gilmore IS. Direct identification of interfacial degradation in blue OLEDs using nanoscale chemical depth profiling. Nat Commun 2023; 14:8066. [PMID: 38052834 DOI: 10.1038/s41467-023-43840-9] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/20/2022] [Accepted: 11/21/2023] [Indexed: 12/07/2023] Open
Abstract
Understanding the degradation mechanism of organic light-emitting diodes (OLED) is essential to improve device performance and stability. OLED failure, if not process-related, arises mostly from chemical instability. However, the challenges of sampling from nanoscale organic layers and interfaces with enough analytical information has hampered identification of degradation products and mechanisms. Here, we present a high-resolution diagnostic method of OLED degradation using an Orbitrap mass spectrometer equipped with a gas cluster ion beam to gently desorb nanometre levels of materials, providing unambiguous molecular information with 7-nm depth resolution. We chemically depth profile and analyse blue phosphorescent and thermally-activated delayed fluorescent (TADF) OLED devices at different degradation levels. For OLED devices with short operational lifetimes, dominant chemical degradation mainly relate to oxygen loss of molecules that occur at the interface between emission and electron transport layers (EML/ETL) where exciton distribution is maximised, confirmed by emission zone measurements. We also show approximately one order of magnitude increase in lifetime of devices with slightly modified host materials, which present minimal EML/ETL interfacial degradation and show the method can provide insight for future material and device architecture development.
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Affiliation(s)
| | - Soohwan Sul
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Joonghyuk Kim
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Rasmus Havelund
- National Physical Laboratory, NiCE-MSI, Teddington, TW11 0LW, UK
| | - Anya Eyres
- National Physical Laboratory, NiCE-MSI, Teddington, TW11 0LW, UK
| | - Sungjun Park
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Youngsik Shin
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Hye Jin Bae
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Young Mo Sung
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Lidija Matjacic
- National Physical Laboratory, NiCE-MSI, Teddington, TW11 0LW, UK
| | - Yongsik Jung
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Jungyeon Won
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Woo Sung Jeon
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Hyeonho Choi
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Hyo Sug Lee
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
| | - Jae-Cheol Lee
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea
- Korea Research Institute of Material Property Analysis (KRIMPA), 712, Nongseo-dong 455, Yongin, 17111, Republic of Korea
| | - Jung-Hwa Kim
- Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., 130 Samsung-ro, Suwon, 16678, Republic of Korea.
| | - Ian S Gilmore
- National Physical Laboratory, NiCE-MSI, Teddington, TW11 0LW, UK.
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3
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Barut I, Fletcher JS. Cell and tissue imaging by secondary ion mass spectrometry. Biointerphases 2023; 18:061202. [PMID: 38108477 DOI: 10.1116/6.0003140] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/14/2023] [Accepted: 11/20/2023] [Indexed: 12/19/2023] Open
Abstract
This Tutorial focuses on the use of secondary ion mass spectrometry for the analysis of cellular and tissue samples. The Tutorial aims to cover the considerations in sample preparation analytical set up and some specific aspects of data interpretation associated with such analysis.
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Affiliation(s)
- Inci Barut
- Department of Pharmacy, Basic Pharmaceutical Sciences, Gazi University, Ankara 06330, Turkey
| | - John S Fletcher
- Department of Chemistry and Molecular Biology, University of Gothenburg, Gothenburg 413 90, Sweden
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4
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Graham DJ, Gamble LJ. Back to the basics of time-of-flight secondary ion mass spectrometry of bio-related samples. I. Instrumentation and data collection. Biointerphases 2023; 18:021201. [PMID: 36990800 PMCID: PMC10063322 DOI: 10.1116/6.0002477] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/09/2023] [Revised: 03/01/2023] [Accepted: 03/03/2023] [Indexed: 03/30/2023] Open
Abstract
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used widely throughout industrial and academic research due to the high information content of the chemically specific data it produces. Modern ToF-SIMS instruments can generate high mass resolution data that can be displayed as spectra and images (2D and 3D). This enables determining the distribution of molecules across and into a surface and provides access to information not obtainable from other methods. With this detailed chemical information comes a steep learning curve in how to properly acquire and interpret the data. This Tutorial is aimed at helping ToF-SIMS users to plan for and collect ToF-SIMS data. The second Tutorial in this series will cover how to process, display, and interpret ToF-SIMS data.
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5
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Muramoto S, Graham DJ. Deep depth profiling using gas cluster secondary ion mass spectrometry: Micrometer topography development and effects on depth resolution. SURF INTERFACE ANAL 2021; 53:814-823. [DOI: 10.1002/sia.6983] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
Affiliation(s)
- Shin Muramoto
- Materials Measurement Science Division National Institute of Standards and Technology Gaithersburg MD USA
| | - Daniel J. Graham
- Department of Bioengineering University of Washington Seattle WA USA
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6
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The Surface Characterisation of Polyetheretherketone (PEEK) Modified via the Direct Sputter Deposition of Calcium Phosphate Thin Films. COATINGS 2020. [DOI: 10.3390/coatings10111088] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
Abstract
Polyetheretherketone (PEEK) has emerged as the material of choice for spinal fusion devices, replacing conventional materials such as titanium and its alloys due to its ability to easily overcome a lot of the limitations of traditional metallic biomaterials. However, one of the major drawbacks of this material is that it is not osteoinductive, nor osteoconductive, preventing direct bone apposition. One way to overcome this is through the modification of the PEEK with bioactive calcium phosphate (CaP) materials, such as hydroxyapatite (HA–Ca10(PO4)6(OH)2). RF magnetron sputtering has been shown to be a particularly useful technique for the deposition of CaP coatings due to the ability of the technique to provide greater control of the coating’s properties. The work undertaken here involved the deposition of HA directly onto PEEK via RF magnetron at a range of deposition times between 10–600 min to provide more bioactive surfaces. The surfaces produced have been extensively characterised using X-Ray Photoelectron Spectroscopy (XPS), Scanning Electron Microscopy (SEM), stylus profilometry, and Time of Flight Secondary Ion Mass Spectrometry (ToFSIMS). XPS results indicated that both Ca and P had successfully deposited onto the surface, albeit with low Ca/P ratios of around 0.85. ToFSIMS analysis indicated that Ca and P had been homogeneously deposited across all the surfaces. The SEM results showed that the CaP surfaces produced were a porous micro-/nano-structured lattice network and that the deposition rate influenced the pore area, pore diameter and number of pores. Depth profiling, using ToFSIMS, highlighted that Ca and P were embedded into the PEEK matrix up to a depth of around 1.21 µm and that the interface between the CaP surface and PEEK substrate was an intermixed layer. In summary, the results highlighted that RF magnetron sputtering can deliver homogenous CaP lattice-like surfaces onto PEEK in a direct, one-step process, without the need for any interlayers, and provides a basis for enhancing the potential bioactivity of PEEK.
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7
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Muramoto S, Gillen G, Collett C, Zeissler CJ, Garboczi EJ. ToF‐SIMS depth profiling of oral drug delivery films for 3D visualization of active pharmaceutical particles. SURF INTERFACE ANAL 2019. [DOI: 10.1002/sia.6707] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/01/2023]
Affiliation(s)
- Shin Muramoto
- National Institute of Standards and Technology Gaithersburg MD 20895 USA
| | - Greg Gillen
- National Institute of Standards and Technology Gaithersburg MD 20895 USA
| | - Cayla Collett
- National Institute of Standards and Technology Gaithersburg MD 20895 USA
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8
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Muramoto S, Collett C. Secondary ion mass spectrometry depth profiling of ultrathick films using an argon gas cluster source: Crater shape implications on the analysis area as a function of depth. SURF INTERFACE ANAL 2019. [DOI: 10.1002/sia.6540] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/22/2023]
Affiliation(s)
- Shin Muramoto
- National Institute of Standards and Technology; Gaithersburg MD USA
| | - Cayla Collett
- National Institute of Standards and Technology; Gaithersburg MD USA
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9
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Graham DJ, Gamble LJ. Dealing with image shifting in 3D ToF-SIMS depth profiles. Biointerphases 2018; 13:06E402. [PMID: 30185054 PMCID: PMC6125139 DOI: 10.1116/1.5041740] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/25/2018] [Revised: 08/01/2018] [Accepted: 08/07/2018] [Indexed: 11/17/2022] Open
Abstract
The high sputter efficiency and low damage of gas cluster ion beams have enabled depth profiling to greater depths within organic samples using time-of-flight secondary ion mass spectrometry (ToF-SIMS). Due to the typically fixed geometry of the ion sources used in ToF-SIMS, as one digs into a surface, the position sampled by ion beams shifts laterally. This causes a lateral shift in the resulting images that can become quite significant when profiling down more than one micron. Here, three methods to compensate for this image shifting are presented in order to more accurately stack the images to present a 3D representation. These methods include (1) using software to correct the image shifts post-acquisition, (2) correcting the sample height during acquisition, and (3) adjusting the beam position during acquisition. The advantages and disadvantages of these methods are discussed. It was found that all three methods were successful in compensating for image shifting in ToF-SIMS depth profiles resulting in a more accurate display of the 3D data. Features from spherical objects that were ellipsoidal prior to shifting were seen to be spherical after correction. Software shifting is convenient as it can be applied after data acquisition. However, when using software shifting, one must take into account the scan size and the size of the features of interest as image shifts can be significant and can result in cropping of features of interest. For depth profiles deeper than a few microns, hardware methods should be used as they preserve features of interest within the field of view regardless of the profile depth. Software shifting can also be used to correct for small shifts not accounted for by hardware methods. A combination of hardware and software shift correction can enable correction for a wide range of samples and profiling depths. The scripts required for the software shifting demonstrated herein are provided along with tutorials in the supplementary material.
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Affiliation(s)
- Daniel J Graham
- NESAC/BIO, Department of Bioengineering, University of Washington, Seattle, Washington 98195
| | - Lara J Gamble
- NESAC/BIO, Department of Bioengineering, University of Washington, Seattle, Washington 98195
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10
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Muramoto S, Gillen G, Windsor ES. Chemical discrimination of multilayered paint cross sections for potential forensic applications using time-of-flight secondary ion mass spectrometry. SURF INTERFACE ANAL 2018. [DOI: 10.1002/sia.6509] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
Affiliation(s)
- Shin Muramoto
- Materials Measurement Sciences Division; National Institute of Standards and Technology; Gaithersburg Maryland
| | - Greg Gillen
- Materials Measurement Sciences Division; National Institute of Standards and Technology; Gaithersburg Maryland
| | - Eric S. Windsor
- Materials Measurement Sciences Division; National Institute of Standards and Technology; Gaithersburg Maryland
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11
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Muramoto S, Bennett J. Low Temperature Plasma for the Preparation of Crater Walls for Compositional Depth Profiling of Thin Inorganic Multilayers. SURF INTERFACE ANAL 2017; 49:515-521. [PMID: 28584389 DOI: 10.1002/sia.6187] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
Abstract
An indirect, compositional depth profiling of an inorganic multilayer system using a helium low temperature plasma (LTP) containing 0.2% (v/v) SF6 was evaluated. A model multilayer system consisting of four 10 nm layers of silicon separated by four 50 nm layers of tungsten was plasma-etched for (10, 20, and 30) s at substrate temperatures of (50, 75, and 100) °C to obtain crater walls with exposed silicon layers that were then visualized using time-of-flight secondary ion mass spectrometry (ToF-SIMS) to determine plasma-etching conditions that produced optimum depth resolutions. At a substrate temperature of 100 °C and an etch time of 10 s, the FWHM of the 2nd, 3rd, and 4th Si layers were (6.4, 10.9, and 12.5) nm, respectively, while the 1/e decay lengths were (2.5, 3.7, and 3.9) nm, matching those obtained from a SIMS depth profile. Though artifacts remain that contribute to degraded depth resolutions, a few experimental parameters have been identified that could be used to reduce their contributions. Further studies are needed, but as long as the artifacts can be controlled, plasma etching was found to be an effective method for preparing samples for compositional depth profiling of both organic and inorganic films, which could pave the way for an indirect depth profile analysis of inorganic-organic hybrid structures that have recently evolved into innovative next-generation materials.
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Affiliation(s)
- Shin Muramoto
- National Institute of Standards and Technology, Gaithersburg, MD, USA
| | - Joe Bennett
- National Institute of Standards and Technology, Gaithersburg, MD, USA
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12
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Vorng JL, Kotowska AM, Passarelli MK, West A, Marshall PS, Havelund R, Seah MP, Dollery CT, Rakowska PD, Gilmore IS. Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue Sample. Anal Chem 2016; 88:11028-11036. [DOI: 10.1021/acs.analchem.6b02894] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/08/2023]
Affiliation(s)
- Jean-Luc Vorng
- National
Centre of Excellence in Mass Spectrometry Imaging (NiCE-MSI), National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Anna M. Kotowska
- National
Centre of Excellence in Mass Spectrometry Imaging (NiCE-MSI), National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Melissa K. Passarelli
- National
Centre of Excellence in Mass Spectrometry Imaging (NiCE-MSI), National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Andrew West
- GlaxoSmithKline, Gunnels Wood Road, Stevenage, Hertfordshire SG1 2NY, United Kingdom
| | - Peter S. Marshall
- GlaxoSmithKline, Gunnels Wood Road, Stevenage, Hertfordshire SG1 2NY, United Kingdom
| | - Rasmus Havelund
- National
Centre of Excellence in Mass Spectrometry Imaging (NiCE-MSI), National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Martin P. Seah
- National
Centre of Excellence in Mass Spectrometry Imaging (NiCE-MSI), National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Colin T. Dollery
- GlaxoSmithKline, Gunnels Wood Road, Stevenage, Hertfordshire SG1 2NY, United Kingdom
| | - Paulina D. Rakowska
- National
Centre of Excellence in Mass Spectrometry Imaging (NiCE-MSI), National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, United Kingdom
| | - Ian S. Gilmore
- National
Centre of Excellence in Mass Spectrometry Imaging (NiCE-MSI), National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, United Kingdom
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13
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Taylor AJ, Graham DJ, Castner DG. Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates. Analyst 2015; 140:6005-14. [PMID: 26185799 PMCID: PMC4532557 DOI: 10.1039/c5an00860c] [Citation(s) in RCA: 20] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
To properly process and reconstruct 3D ToF-SIMS data from systems such as multi-component polymers, drug delivery scaffolds, cells and tissues, it is important to understand the sputtering behavior of the sample. Modern cluster sources enable efficient and stable sputtering of many organics materials. However, not all materials sputter at the same rate and few studies have explored how different sputter rates may distort reconstructed depth profiles of multicomponent materials. In this study spun-cast bilayer polymer films of polystyrene and PMMA are used as model systems to optimize methods for the reconstruction of depth profiles in systems exhibiting different sputter rates between components. Transforming the bilayer depth profile from sputter time to depth using a single sputter rate fails to account for sputter rate variations during the profile. This leads to inaccurate apparent layer thicknesses and interfacial positions, as well as the appearance of continued sputtering into the substrate. Applying measured single component sputter rates to the bilayer films with a step change in sputter rate at the interfaces yields more accurate film thickness and interface positions. The transformation can be further improved by applying a linear sputter rate transition across the interface, thus modeling the sputter rate changes seen in polymer blends. This more closely reflects the expected sputtering behavior. This study highlights the need for both accurate evaluation of component sputter rates and the careful conversion of sputter time to depth, if accurate 3D reconstructions of complex multi-component organic and biological samples are to be achieved. The effects of errors in sputter rate determination are also explored.
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Affiliation(s)
- Adam J Taylor
- National ESCA and Surface Analysis Center for Biomedical Problems (NESAC/BIO), Molecular Engineering and Sciences Institute, University of Washington, Seattle, WA, USA.
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14
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Muramoto S, Rading D, Bush B, Gillen G, Castner DG. Low-temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60 and giant argon gas cluster sources. RAPID COMMUNICATIONS IN MASS SPECTROMETRY : RCM 2014; 28:1971-1978. [PMID: 25132297 PMCID: PMC4155327 DOI: 10.1002/rcm.6981] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/28/2014] [Revised: 07/01/2014] [Accepted: 07/06/2014] [Indexed: 06/03/2023]
Abstract
RATIONALE For organic electronics, device performance can be affected by interlayer diffusion across interfaces. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) can resolve buried structures with nanometer resolution, but instrument artifacts make this difficult. Low-temperature plasma (LTP) is suggested as a way to prepare artifact-free surfaces for accurate determination of chemical diffusion. METHODS A model organic layer system consisting of three 1 nm delta layers of 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline (BCP) separated by three 30 nm layers of tris(8-hydroxyquinolinato)aluminum (Alq3) was used to evaluate the effectiveness of LTP etching for the preparation of crater edge surfaces for subsequent compositional depth profile analysis. This was compared with depth profiles obtained using an instrument equipped with an argon cluster sputter source. RESULTS The quality of the depth profiles was determined by comparing the depth resolutions of the BCP delta layers. The full width at half maximum gave depth resolutions of 6.9 nm and 6.0 nm using LTP, and 6.2 nm and 5.8 nm using argon clusters. In comparison, the 1/e decay length of the trailing edge gave depth resolutions of 2.0 nm and 1.8 nm using LTP, and 3.5 nm and 3.4 nm using argon clusters. CONCLUSIONS The comparison of the 1/e decay lengths showed that LTP can determine the thickness and composition of the buried structures without instrument artifacts. Although it does suffer from contaminant deposition, LTP was shown to be a viable option for preparing crater edges for a more accurate determination of buried structures.
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Affiliation(s)
- Shin Muramoto
- National Institute of Standards and Technology, Gaithersburg, MD, USA
| | | | - Brian Bush
- National Institute of Standards and Technology, Gaithersburg, MD, USA
| | - Greg Gillen
- National Institute of Standards and Technology, Gaithersburg, MD, USA
| | - David G. Castner
- Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, WA, USA
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15
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Iida SI, Miyayama T, Fisher GL, Hammond JS, Bryan SR, Sanada N. A new approach for determining accurate chemical distributions using in-situ
GCIB cross-section imaging. SURF INTERFACE ANAL 2014. [DOI: 10.1002/sia.5595] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
Affiliation(s)
- Shin-ichi Iida
- ULVAC-PHI Inc.; 370 Enzo Chigasaki Kanagawa 253-8522 Japan
| | - Takuya Miyayama
- Physical Electronics Inc.; 18725 Lake Drive East Chanhassen MN 53317 USA
| | - Gregory L. Fisher
- Physical Electronics Inc.; 18725 Lake Drive East Chanhassen MN 53317 USA
| | - John S. Hammond
- Physical Electronics Inc.; 18725 Lake Drive East Chanhassen MN 53317 USA
| | - Scott R. Bryan
- Physical Electronics Inc.; 18725 Lake Drive East Chanhassen MN 53317 USA
| | - Noriaki Sanada
- ULVAC-PHI Inc.; 370 Enzo Chigasaki Kanagawa 253-8522 Japan
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16
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Brison J, Robinson MA, Benoit DS, Muramoto S, Stayton PS, Castner DG. TOF-SIMS 3D imaging of native and non-native species within HeLa cells. Anal Chem 2013; 85:10869-77. [PMID: 24131300 PMCID: PMC3889863 DOI: 10.1021/ac402288d] [Citation(s) in RCA: 64] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/26/2022]
Abstract
In this study, a non-native chemical species, bromodeoxyuridine (BrdU), was imaged within single HeLa cells using time-of-flight secondary ion mass spectrometry (TOF-SIMS). z-corrected 3D images were reconstructed that accurately portray the distribution of intracellular BrdU as well as other intracellular structures. The BrdU was localized to the nucleus of cells, whereas structures composed of CxHyOz(-) species were located in bundles on the periphery of cells. The CxHyOz(-) subcellular features had a spatial resolution at or slightly below a micrometer (900 nm), as defined by the distance between the 16% and 84% intensities in a line scan across the edge of the features. Additionally, important parameters influencing the quality of the HeLa cell 3D images were investigated. Atomic force microscopy measurements revealed that the HeLa cells were sputtered at a rate of approximately 4 nm per 10(13) C60(+) ions/cm(2) at 10 keV and a 45° incident angle. Optimal 3D images were acquired using a Bi3(+) liquid metal ion gun operating in the simultaneous high mass and spatial resolution mode.
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Affiliation(s)
- Jeremy Brison
- National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Seattle, WA 98195-1653
- Department of Bioengineering, University of Washington, Seattle, WA 98195-1653
| | - Michael A. Robinson
- National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Seattle, WA 98195-1653
- Department of Chemical Engineering, University of Washington, Seattle, WA 98195-1653
| | | | - Shin Muramoto
- National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Seattle, WA 98195-1653
- Department of Chemical Engineering, University of Washington, Seattle, WA 98195-1653
| | - Patrick S. Stayton
- Department of Bioengineering, University of Washington, Seattle, WA 98195-1653
| | - David G. Castner
- National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Seattle, WA 98195-1653
- Department of Chemical Engineering, University of Washington, Seattle, WA 98195-1653
- Department of Bioengineering, University of Washington, Seattle, WA 98195-1653
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17
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Bich C, Havelund R, Moellers R, Touboul D, Kollmer F, Niehuis E, Gilmore IS, Brunelle A. Argon Cluster Ion Source Evaluation on Lipid Standards and Rat Brain Tissue Samples. Anal Chem 2013; 85:7745-52. [DOI: 10.1021/ac4009513] [Citation(s) in RCA: 60] [Impact Index Per Article: 5.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
Affiliation(s)
- Claudia Bich
- Centre de Recherche de Gif, Institut de Chimie des Substances Naturelles, CNRS,
Avenue de la Terrasse, 91198 Gif-sur-Yvette, France
| | - Rasmus Havelund
- Surface and Nanoanalysis, National Physical Laboratory (NPL) Teddington, Middlesex, TW11
0LW, United Kingdom
| | | | - David Touboul
- Centre de Recherche de Gif, Institut de Chimie des Substances Naturelles, CNRS,
Avenue de la Terrasse, 91198 Gif-sur-Yvette, France
| | - Felix Kollmer
- ION-TOF GmbH, Heisenbergstr.15, 48149 Münster,
Germany
| | - Ewald Niehuis
- ION-TOF GmbH, Heisenbergstr.15, 48149 Münster,
Germany
| | - Ian S. Gilmore
- Surface and Nanoanalysis, National Physical Laboratory (NPL) Teddington, Middlesex, TW11
0LW, United Kingdom
| | - Alain Brunelle
- Centre de Recherche de Gif, Institut de Chimie des Substances Naturelles, CNRS,
Avenue de la Terrasse, 91198 Gif-sur-Yvette, France
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18
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Havelund R, Licciardello A, Bailey J, Tuccitto N, Sapuppo D, Gilmore IS, Sharp JS, Lee JLS, Mouhib T, Delcorte A. Improving Secondary Ion Mass Spectrometry C60n+Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing. Anal Chem 2013; 85:5064-70. [DOI: 10.1021/ac4003535] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/31/2023]
Affiliation(s)
- R. Havelund
- National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom
| | - A. Licciardello
- Laboratory for Molecular Surfaces and Nanotechnology (LAMSUN), Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI, Via A. Doria 6, 95125 Catania, Italy
| | - J. Bailey
- School of Physics and Astronomy and Nottingham Nanotechnology and Nanoscience Centre, University of Nottingham, University Park, Nottingham, NG7 2RD, United Kingdom
| | - N. Tuccitto
- Laboratory for Molecular Surfaces and Nanotechnology (LAMSUN), Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI, Via A. Doria 6, 95125 Catania, Italy
| | - D. Sapuppo
- Laboratory for Molecular Surfaces and Nanotechnology (LAMSUN), Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI, Via A. Doria 6, 95125 Catania, Italy
| | - I. S. Gilmore
- National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom
| | - J. S. Sharp
- School of Physics and Astronomy and Nottingham Nanotechnology and Nanoscience Centre, University of Nottingham, University Park, Nottingham, NG7 2RD, United Kingdom
| | - J. L. S. Lee
- National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom
| | - T. Mouhib
- Institute of Condensed Matter and Nanosciences-Bio & Soft Matter, Université Catholique de Louvain, Croix du Sud, 1 bte L7.04.01; B-1348 Louvain-la-Neuve, Belgium
| | - A. Delcorte
- Institute of Condensed Matter and Nanosciences-Bio & Soft Matter, Université Catholique de Louvain, Croix du Sud, 1 bte L7.04.01; B-1348 Louvain-la-Neuve, Belgium
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19
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Robinson MA, Graham DJ, Castner DG. ToF-SIMS depth profiling of cells: z-correction, 3D imaging, and sputter rate of individual NIH/3T3 fibroblasts. Anal Chem 2012; 84:4880-5. [PMID: 22530745 DOI: 10.1021/ac300480g] [Citation(s) in RCA: 78] [Impact Index Per Article: 6.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Abstract
Proper display of three-dimensional time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging data of complex, nonflat samples requires a correction of the data in the z-direction. Inaccuracies in displaying three-dimensional ToF-SIMS data arise from projecting data from a nonflat surface onto a 2D image plane, as well as possible variations in the sputter rate of the sample being probed. The current study builds on previous studies by creating software written in Matlab, the ZCorrectorGUI (available at http://mvsa.nb.uw.edu/), to apply the z-correction to entire 3D data sets. Three-dimensional image data sets were acquired from NIH/3T3 fibroblasts by collecting ToF-SIMS images, using a dual beam approach (25 keV Bi(3)(+) for analysis cycles and 20 keV C(60)(2+) for sputter cycles). The entire data cube was then corrected by using the new ZCorrectorGUI software, producing accurate chemical information from single cells in 3D. For the first time, a three-dimensional corrected view of a lipid-rich subcellular region, possibly the nuclear membrane, is presented. Additionally, the key assumption of a constant sputter rate throughout the data acquisition was tested by using ToF-SIMS and atomic force microscopy (AFM) analysis of the same cells. For the dried NIH/3T3 fibroblasts examined in this study, the sputter rate was found to not change appreciably in x, y, or z, and the cellular material was sputtered at a rate of approximately 10 nm per 1.25 × 10(13) ions C(60)(2+)/cm(2).
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Affiliation(s)
- Michael A Robinson
- National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Seattle, Washington 98195-1750, United States
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20
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Muramoto S, Brison J, Castner DG. Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic films. Anal Chem 2012; 84:365-72. [PMID: 22084828 PMCID: PMC3259203 DOI: 10.1021/ac202713k] [Citation(s) in RCA: 47] [Impact Index Per Article: 3.9] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Abstract
The surface sensitivity of Bi(n)(q+) (n = 1, 3, 5, q = 1, 2) and C(60)(q+) (q = 1, 2) primary ions in static time-of-flight secondary ion mass spectrometry (TOF-SIMS) experiments were investigated for molecular trehalose and polymeric tetraglyme organic films. Parameters related to surface sensitivity (impact crater depth, implantation depth, and molecular escape depths) were measured. Under static TOF-SIMS conditions (primary ion doses of 1 × 10(12) ions/cm(2)), the 25 keV Bi(1)(+) primary ions were the most surface sensitive with a molecular escape depth of 1.8 nm for protein films with tetraglyme overlayers, but they had the deepest implantation depth (~18 and 26 nm in trehalose and tetraglyme films, respectively). The 20 keV C(60)(+2) primary ions were the second most surface sensitive with a slightly larger molecular escape depth of 2.3 nm. The most important factor that determined the surface sensitivity of the primary ion was its impact crater depth or the amount of surface erosion. The most surface sensitive primary ions, Bi(1)(+) and C(60)(+2), created impact craters with depths of 0.3 and 1.0 nm, respectively, in tetraglyme films. In contrast, Bi(5)(+2) primary ions created impact craters with a depth of 1.8 nm in tetraglyme films and were the least surface sensitive with a molecular escape depth of 4.7 nm.
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Affiliation(s)
- Shin Muramoto
- National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Seattle, WA 98195
- Department of Chemical Engineering, University of Washington, Seattle, WA 98195
| | - Jeremy Brison
- National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Seattle, WA 98195
- Department of Bioengineering, University of Washington, Seattle, WA 98195
| | - David G. Castner
- National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Seattle, WA 98195
- Department of Bioengineering, University of Washington, Seattle, WA 98195
- Department of Chemical Engineering, University of Washington, Seattle, WA 98195
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