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Graham DJ, Gamble LJ. Dealing with image shifting in 3D ToF-SIMS depth profiles. Biointerphases 2018; 13:06E402. [PMID: 30185054 PMCID: PMC6125139 DOI: 10.1116/1.5041740] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/25/2018] [Revised: 08/01/2018] [Accepted: 08/07/2018] [Indexed: 11/17/2022] Open
Abstract
The high sputter efficiency and low damage of gas cluster ion beams have enabled depth profiling to greater depths within organic samples using time-of-flight secondary ion mass spectrometry (ToF-SIMS). Due to the typically fixed geometry of the ion sources used in ToF-SIMS, as one digs into a surface, the position sampled by ion beams shifts laterally. This causes a lateral shift in the resulting images that can become quite significant when profiling down more than one micron. Here, three methods to compensate for this image shifting are presented in order to more accurately stack the images to present a 3D representation. These methods include (1) using software to correct the image shifts post-acquisition, (2) correcting the sample height during acquisition, and (3) adjusting the beam position during acquisition. The advantages and disadvantages of these methods are discussed. It was found that all three methods were successful in compensating for image shifting in ToF-SIMS depth profiles resulting in a more accurate display of the 3D data. Features from spherical objects that were ellipsoidal prior to shifting were seen to be spherical after correction. Software shifting is convenient as it can be applied after data acquisition. However, when using software shifting, one must take into account the scan size and the size of the features of interest as image shifts can be significant and can result in cropping of features of interest. For depth profiles deeper than a few microns, hardware methods should be used as they preserve features of interest within the field of view regardless of the profile depth. Software shifting can also be used to correct for small shifts not accounted for by hardware methods. A combination of hardware and software shift correction can enable correction for a wide range of samples and profiling depths. The scripts required for the software shifting demonstrated herein are provided along with tutorials in the supplementary material.
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Affiliation(s)
- Daniel J Graham
- NESAC/BIO, Department of Bioengineering, University of Washington, Seattle, Washington 98195
| | - Lara J Gamble
- NESAC/BIO, Department of Bioengineering, University of Washington, Seattle, Washington 98195
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Paine MRL, Kooijman PC, Fisher GL, Heeren RMA, Fernández FM, Ellis SR. Visualizing molecular distributions for biomaterials applications with mass spectrometry imaging: a review. J Mater Chem B 2017; 5:7444-7460. [PMID: 32264222 DOI: 10.1039/c7tb01100h] [Citation(s) in RCA: 15] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/24/2022]
Abstract
Mass spectrometry imaging (MSI) is a rapidly emerging field that is continually finding applications in new and exciting areas. The ability of MSI to measure the spatial distribution of molecules at or near the surface of complex substrates makes it an ideal candidate for many applications, including those in the sphere of materials chemistry. Continual development and optimization of both ionization sources and analyzer technologies have resulted in a wide array of MSI tools available, both commercially available and custom-built, with each configuration possessing inherent strengths and limitations. Despite the unique potential of MSI over other chemical imaging methods, their potential and application to (bio)materials science remains in our view a largely underexplored avenue. This review will discuss these techniques enabling high parallel molecular detection, focusing on those with reported uses in (bio)materials chemistry applications and highlighted with select applications. Different technologies are presented in three main sections; secondary ion mass spectrometry (SIMS) imaging, matrix-assisted laser desorption ionization (MALDI) MSI, and emerging MSI technologies with potential for biomaterial analysis. The first two sections (SIMS and MALDI) discuss well-established methods that are continually evolving both in technological advancements and in experimental versatility. In the third section, relatively new and versatile technologies capable of performing measurements under ambient conditions will be introduced, with reported applications in materials chemistry or potential applications discussed. The aim of this review is to provide a concise resource for those interested in utilizing MSI for applications such as biomimetic materials, biological/synthetic material interfaces, polymer formulation and bulk property characterization, as well as the spatial and chemical distributions of nanoparticles, or any other molecular imaging application requiring broad chemical speciation.
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Affiliation(s)
- Martin R L Paine
- M4I, The Maastricht MultiModal Molecular Imaging Institute, Maastricht University, Maastricht 6229 ER, The Netherlands.
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Surface initiated supplemental activator and reducing agent atom transfer radical polymerization (SI-SARA-ATRP) of 4-vinylpyridine on poly(ethylene terephthalate). J Colloid Interface Sci 2017; 500:69-78. [DOI: 10.1016/j.jcis.2017.03.115] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/13/2017] [Revised: 03/30/2017] [Accepted: 03/31/2017] [Indexed: 11/21/2022]
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Terlier T, Zappalà G, Marie C, Leonard D, Barnes JP, Licciardello A. ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Ar n+, C 60++, and Cs + Sputtering Ions. Anal Chem 2017; 89:6984-6991. [PMID: 28617583 DOI: 10.1021/acs.analchem.7b00279] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Abstract
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a high performance tool for molecular depth profiling of polymer films, in particular when they are structured in microphases. However, a major issue is the degradation of polymer materials under ion irradiation in reactions such as cross-linking, chain breaking, or reorganization processes of polymers which have been demonstrated for materials such as polystyrene (PS) and poly(methyl methacrylate) (PMMA). This work aims at comparing ToF-SIMS molecular depth profiling of structured polymers (polystyrene (PS)-b-polymethyl methacrylate (PMMA) block copolymers (BCP)) using either ultralow energy cesium or the more recently introduced C60++ (under NO dosing and with sample cooling) and argon cluster ion beams (using Ar1500+ ions at 5 keV). The latter improved the quality of the depth profiles, especially the argon cluster ion beam, as it is characterized by a greater homogeneity for the sputter yields of PS and PMMA. No significant artifacts were observed, and this was confirmed by the comparison of depth profiles obtained from films with variable thickness, annealing time, and morphology (cylindrical blocks vs spherical blocks). Comparison to a theoretical model (hexagonal centered pattern) ensured that the ToF-SIMS depth profiles described the real morphology and may thus be a relevant characterization tool to verify the morphology of the films as a function of the deposition parameters.
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Affiliation(s)
- T Terlier
- University Grenoble Alpes , F-38000 Grenoble, France.,CEA, LETI, MINATEC Campus, F-38054 Grenoble, France.,Univ Lyon, CNRS, Université Claude Bernard Lyon 1, ENS Lyon, Institut des Sciences Analytiques , UMR 5280, 5, rue de la Doua, F-69100 Villeurbanne, France
| | - G Zappalà
- Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI , Viale A. Doria 6, 95125 Catania, Italy
| | - C Marie
- University Grenoble Alpes , F-38000 Grenoble, France.,CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
| | - D Leonard
- Univ Lyon, CNRS, Université Claude Bernard Lyon 1, ENS Lyon, Institut des Sciences Analytiques , UMR 5280, 5, rue de la Doua, F-69100 Villeurbanne, France
| | - J-P Barnes
- University Grenoble Alpes , F-38000 Grenoble, France.,CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
| | - A Licciardello
- Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI , Viale A. Doria 6, 95125 Catania, Italy
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5
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Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers. Anal Bioanal Chem 2013; 406:201-11. [DOI: 10.1007/s00216-013-7408-x] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/31/2013] [Revised: 09/22/2013] [Accepted: 09/30/2013] [Indexed: 10/26/2022]
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Havelund R, Licciardello A, Bailey J, Tuccitto N, Sapuppo D, Gilmore IS, Sharp JS, Lee JLS, Mouhib T, Delcorte A. Improving Secondary Ion Mass Spectrometry C60n+Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing. Anal Chem 2013; 85:5064-70. [DOI: 10.1021/ac4003535] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/31/2023]
Affiliation(s)
- R. Havelund
- National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom
| | - A. Licciardello
- Laboratory for Molecular Surfaces and Nanotechnology (LAMSUN), Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI, Via A. Doria 6, 95125 Catania, Italy
| | - J. Bailey
- School of Physics and Astronomy and Nottingham Nanotechnology and Nanoscience Centre, University of Nottingham, University Park, Nottingham, NG7 2RD, United Kingdom
| | - N. Tuccitto
- Laboratory for Molecular Surfaces and Nanotechnology (LAMSUN), Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI, Via A. Doria 6, 95125 Catania, Italy
| | - D. Sapuppo
- Laboratory for Molecular Surfaces and Nanotechnology (LAMSUN), Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI, Via A. Doria 6, 95125 Catania, Italy
| | - I. S. Gilmore
- National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom
| | - J. S. Sharp
- School of Physics and Astronomy and Nottingham Nanotechnology and Nanoscience Centre, University of Nottingham, University Park, Nottingham, NG7 2RD, United Kingdom
| | - J. L. S. Lee
- National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom
| | - T. Mouhib
- Institute of Condensed Matter and Nanosciences-Bio & Soft Matter, Université Catholique de Louvain, Croix du Sud, 1 bte L7.04.01; B-1348 Louvain-la-Neuve, Belgium
| | - A. Delcorte
- Institute of Condensed Matter and Nanosciences-Bio & Soft Matter, Université Catholique de Louvain, Croix du Sud, 1 bte L7.04.01; B-1348 Louvain-la-Neuve, Belgium
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ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth: application to single inkjet dots. Anal Bioanal Chem 2013; 405:2053-64. [DOI: 10.1007/s00216-012-6647-6] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/11/2012] [Revised: 11/29/2012] [Accepted: 12/07/2012] [Indexed: 11/25/2022]
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Mouhib T, Poleunis C, Wehbe N, Michels JJ, Galagan Y, Houssiau L, Bertrand P, Delcorte A. Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams. Analyst 2013; 138:6801-10. [DOI: 10.1039/c3an01035j] [Citation(s) in RCA: 35] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
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Ren X, Weng LT, Chan CM, Ng KM. Hollow Interior Structure of Spin-Coated Polymer Thin Films Revealed by ToF-SIMS Three-Dimensional Imaging. Anal Chem 2012; 84:8497-504. [DOI: 10.1021/ac3014466] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Affiliation(s)
- Xianwen Ren
- Department
of Chemical and Biomolecular Engineering, ‡Materials Characterization and
Preparation Facility, §Division of Environment, and ∥Advanced Engineering Materials
Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
| | - Lu-Tao Weng
- Department
of Chemical and Biomolecular Engineering, ‡Materials Characterization and
Preparation Facility, §Division of Environment, and ∥Advanced Engineering Materials
Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
| | - Chi-Ming Chan
- Department
of Chemical and Biomolecular Engineering, ‡Materials Characterization and
Preparation Facility, §Division of Environment, and ∥Advanced Engineering Materials
Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
| | - Kai-Mo Ng
- Department
of Chemical and Biomolecular Engineering, ‡Materials Characterization and
Preparation Facility, §Division of Environment, and ∥Advanced Engineering Materials
Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
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Mouhib T, Poleunis C, Möllers R, Niehuis E, Defrance P, Bertrand P, Delcorte A. Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.5052] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Affiliation(s)
| | - C. Poleunis
- Bio and Soft Matter Division, Institute of Condensed Matter and Nanosciences; Université Catholique de Louvain; Croix du Sud 1, bte L7.04.01 Boltzmann; B-1348; Louvain-la-Neuve; Belgium
| | - R. Möllers
- ION-TOF GmbH; Heisenbergstrasse 15; 48149; Muenster; Germany
| | - E. Niehuis
- ION-TOF GmbH; Heisenbergstrasse 15; 48149; Muenster; Germany
| | - P. Defrance
- Nanoscopic Physics Division, Institute of Condensed Matter and Nanosciences; Université Catholique de Louvain; Chemin du Cyclotron 2, bte L7.01.07; B-1348; Louvain-la-Neuve; Belgium
| | - P. Bertrand
- Bio and Soft Matter Division, Institute of Condensed Matter and Nanosciences; Université Catholique de Louvain; Croix du Sud 1, bte L7.04.01 Boltzmann; B-1348; Louvain-la-Neuve; Belgium
| | - A. Delcorte
- Bio and Soft Matter Division, Institute of Condensed Matter and Nanosciences; Université Catholique de Louvain; Croix du Sud 1, bte L7.04.01 Boltzmann; B-1348; Louvain-la-Neuve; Belgium
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Toshner SB, Zhu Z, Kosilkin IV, Leger JM. Characterization of ion profiles in light-emitting electrochemical cells by secondary ion mass spectrometry. ACS APPLIED MATERIALS & INTERFACES 2012; 4:1149-1153. [PMID: 22387346 DOI: 10.1021/am201469t] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
Ion profiles in polymer light-emitting electrochemical cells are known to significantly affect performance and stability, but are not easily measured. Here, secondary ion mass spectrometry is used to investigate ion profiles in both dynamic and chemically fixed junction devices. Results indicate lower reversibility of dynamic junctions and a more significant time delay for ion redistribution than previously expected, but confirm the complete immobilization of ions in chemically fixed junction devices. When compared with prior studies analyzing the electric field profiles in similar devices, these results help to elucidate the roles of ion distribution and electrochemical doping in LECs.
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Affiliation(s)
- Samuel B Toshner
- Department of Physics and Astronomy, Western Washington University, Bellingham, Washington 98225-9164, USA
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