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For: Barozzi M, Gennaro S, Bersani M, Vanzetti L, Jestin Y, Pucker G, Milita S, Balboni R. Structural analysis and depth profiling of nanometric SiO2/SRO multilayers. SURF INTERFACE ANAL 2013. [DOI: 10.1002/sia.4939] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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