Reference Citation Analysis: Find an Article, Find a Category, Find a Journal, Find a Scholar

Citation(s) in RCA

1
(from Reference Citation Analysis)

Indexed Articles

Ranked By

Results Analysis

Year Published Analysis
Article Type Analysis
Journal Title Analysis
Category Analysis

Results Analysis

Year Published

Show more Refine

Article Statistics

Refine

Publication Titles

Show more Refine

Category

Show more Refine

For: Conard T, Franquet A, Tsvetanova D, Mouhib T, Vandervorst W. Degradation of deep ultraviolet photoresist by As-implantation studied by Ar-cluster beam profiling. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.5126] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]

For:	Conard T, Franquet A, Tsvetanova D, Mouhib T, Vandervorst W. Degradation of deep ultraviolet photoresist by As-implantation studied by Ar-cluster beam profiling. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.5126] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]

Number

Cited by Other Article(s)

Fleischmann C, Conard T, Havelund R, Franquet A, Poleunis C, Voroshazi E, Delcorte A, Vandervorst W. Fundamental aspects of Arn + SIMS profiling of common organic semiconductors. SURF INTERFACE ANAL 2014. [DOI: 10.1002/sia.5621] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]