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Citation(s) in
RCA
4
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1983 (2)
1981 (2)
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Morgan AE
.
An alternative to the relative sensitivity factor approach to quantitative SIMS analysis.
SURF INTERFACE ANAL
1980. [DOI:
10.1002/sia.740020402
]
[
Citation(s) in
RCA
: 17
]
[
Impact Index Per Article: 0.4
]
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Reference Citation Analysis
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[Indexed: 11/10/2022]
Number
Cited by Other Article(s)
1
Morgan A
. A comparison of secondary ion mass spectrometry and auger electron spectroscopy as surface analytical techniques.
ACTA ACUST UNITED AC
1983. [DOI:
10.1016/0167-5087(83)91012-8
]
[
Citation(s) in
RCA
: 3
]
[
Impact Index Per Article: 0.1
]
[
Reference Citation Analysis
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[Indexed: 10/27/2022]
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2
Applications of SIMS in Interdisciplinary Materials Characterization.
ACTA ACUST UNITED AC
1983. [DOI:
10.1007/978-3-7091-3943-1_3
]
[
Citation(s) in
RCA
: 7
]
[
Impact Index Per Article: 0.2
]
[
Reference Citation Analysis
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3
Surman DJ
, Vickerman JC. Surface analysis of glasses by fast atom bombardment mass spectrometry.
ACTA ACUST UNITED AC
1981. [DOI:
10.1016/0378-5963(81)90030-1
]
[
Citation(s) in
RCA
: 18
]
[
Impact Index Per Article: 0.4
]
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[Indexed: 11/27/2022]
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4
Morgan A
, de Grefte H, Warmoltz N, Werner H, Tolle H. The influence of bombardment conditions upon the sputtering and secondary ion yields of silicon.
ACTA ACUST UNITED AC
1981. [DOI:
10.1016/0378-5963(81)90084-2
]
[
Citation(s) in
RCA
: 64
]
[
Impact Index Per Article: 1.5
]
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[Indexed: 10/27/2022]
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