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Citation(s) in
RCA
9
(from Reference Citation Analysis)
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SURFACE AND INTERFACE ANALYSIS (6)
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Clegg JB
, Morgan AE, de Grefte HAM, Simondet F, Huber A, Blackmore G, Dowsett MG, Sykes DE, Magee CW, Deline VR.
A comparative study of SIMS depth profiling of boron in silicon.
SURF INTERFACE ANAL
1984. [DOI:
10.1002/sia.740060403
]
[
Citation(s) in
RCA
: 21
]
[
Impact Index Per Article: 0.5
]
[
Reference Citation Analysis
]
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[Indexed: 11/10/2022]
Number
Cited by Other Article(s)
1
Chabala J
, Soni K, Li J, Gavrilov K, Levi-Setti R. High-resolution chemical imaging with scanning ion probe SIMS.
ACTA ACUST UNITED AC
1995. [DOI:
10.1016/0168-1176(94)04119-r
]
[
Citation(s) in
RCA
: 69
]
[
Impact Index Per Article: 2.4
]
[
Reference Citation Analysis
]
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]
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[Indexed: 11/24/2022]
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2
Chew A
, Sykes DE, Houlton MR, Blackmore GW, Blunt RT. SIMS analysis of oxygen in AlxGa1 ?xAs alloys: Variations in sensitivity as a function of alloy composition.
SURF INTERFACE ANAL
1993. [DOI:
10.1002/sia.740201109
]
[
Citation(s) in
RCA
: 1
]
[
Impact Index Per Article: 0.0
]
[
Reference Citation Analysis
]
[
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[Indexed: 11/11/2022]
Abstract
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3
Dowsett MG
. The application of surface analytical techniques to silicon technology.
ACTA ACUST UNITED AC
1991. [DOI:
10.1007/bf00321553
]
[
Citation(s) in
RCA
: 13
]
[
Impact Index Per Article: 0.4
]
[
Reference Citation Analysis
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[Indexed: 11/28/2022]
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4
von Criegern R
, Weitzel L, Zeininger H, Lange-Gieseler R. Optimization of the dynamic range of SIMS depth profiles by sample preparation.
SURF INTERFACE ANAL
1990. [DOI:
10.1002/sia.740150704
]
[
Citation(s) in
RCA
: 10
]
[
Impact Index Per Article: 0.3
]
[
Reference Citation Analysis
]
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[Indexed: 11/10/2022]
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5
Hues SM
, Colton RJ. Results of a SIMS round robin sponsored by ASTM committee E-42 on surface analysis.
SURF INTERFACE ANAL
1989. [DOI:
10.1002/sia.740140302
]
[
Citation(s) in
RCA
: 18
]
[
Impact Index Per Article: 0.5
]
[
Reference Citation Analysis
]
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[Indexed: 11/05/2022]
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6
Quantitative depth profiling by glow discharge mass spectrometry.
SURF INTERFACE ANAL
1988. [DOI:
10.1002/sia.740110105
]
[
Citation(s) in
RCA
: 12
]
[
Impact Index Per Article: 0.3
]
[
Reference Citation Analysis
]
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[Indexed: 11/07/2022]
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7
Clegg JB
, Gale IG, Blackmore G, Dowsett MG, McPhail DS, Spiller GDT, Sykes DE. A SIMS calibration exercise using multi-element (Cr, Fe and Zn) implanted GaAs.
SURF INTERFACE ANAL
1987. [DOI:
10.1002/sia.740100705
]
[
Citation(s) in
RCA
: 9
]
[
Impact Index Per Article: 0.2
]
[
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[Indexed: 11/07/2022]
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8
Powell CJ
, Seah MP. Surface chemical analysis—report on the vamas project.
SURF INTERFACE ANAL
1986. [DOI:
10.1002/sia.740090202
]
[
Citation(s) in
RCA
: 13
]
[
Impact Index Per Article: 0.3
]
[
Reference Citation Analysis
]
[
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[Indexed: 11/11/2022]
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9
Auger Electron Spectroscopy.
ACTA ACUST UNITED AC
1986. [DOI:
10.1007/978-3-642-46571-0_8
]
[
Citation(s) in
RCA
: 1
]
[
Impact Index Per Article: 0.0
]
[
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