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Number Cited by Other Article(s)
1
Zhang F, Huang Z. Spectroscopic ellipsometric properties of annealed Mn1.95Co0.77Ni0.28O4 thin films. OPTICS LETTERS 2017;42:3836-3839. [PMID: 28957141 DOI: 10.1364/ol.42.003836] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/20/2017] [Accepted: 08/25/2017] [Indexed: 06/07/2023]
2
Park GH, Pao YH, Igelnik B, Eyink KG, Leclair SR. Neural-net computing for interpretation of semiconductor film optical ellipsometry parameters. IEEE TRANSACTIONS ON NEURAL NETWORKS 1996;7:816-829. [PMID: 18263478 DOI: 10.1109/72.508926] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
3
Kuball M, Kelly MK, Cardona M, Köhler K, Wagner J. Doping dependence of the E1 and E1+ Delta 1 critical points in highly doped n- and p-type GaAs: Importance of surface band bending and depletion. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;49:16569-16574. [PMID: 10010812 DOI: 10.1103/physrevb.49.16569] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
4
Lukes F, Gopalan S, Cardona M. Effect of heavy doping on the optical properties and band structure of GaAs. PHYSICAL REVIEW. B, CONDENSED MATTER 1993;47:7071-7079. [PMID: 10004703 DOI: 10.1103/physrevb.47.7071] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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