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Vlachos D. A quantitative analysis of AES and XPS specifically applied in adsorption systems at submonolayer regime. SURF INTERFACE ANAL 2020. [DOI: 10.1002/sia.6893] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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Werner WSM. Simulation of electron spectra for surface analysis using the partial-intensity approach (PIA). SURF INTERFACE ANAL 2005. [DOI: 10.1002/sia.2103] [Citation(s) in RCA: 34] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
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Kozłowska M, Reiche R, Oswald S, Vinzelberg H, Hübner R, Wetzig K. Quantitative ARXPS investigation of systems with ultrathin aluminium oxide layers. SURF INTERFACE ANAL 2004. [DOI: 10.1002/sia.1988] [Citation(s) in RCA: 30] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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Graat P, Somers MAJ. Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: determination of the thickness and composition of thin iron oxide films. SURF INTERFACE ANAL 1999. [DOI: 10.1002/(sici)1096-9918(199810)26:11<773::aid-sia419>3.0.co;2-#] [Citation(s) in RCA: 90] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Affiliation(s)
- Peter Graat
- Delft University of Technology, Laboratory of Materials Science, Rotterdamseweg 137, NL‐2628 AL Delft, The Netherlands
| | - Marcel A. J. Somers
- Delft University of Technology, Laboratory of Materials Science, Rotterdamseweg 137, NL‐2628 AL Delft, The Netherlands
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Cumpson PJ. Elastic Scattering Corrections in AES and XPS. III. Behaviour of Electron Transport Mean Free Path in Solids for Kinetic Energies in the Range 100 eV SURF INTERFACE ANAL 1997. [DOI: 10.1002/(sici)1096-9918(199706)25:6<447::aid-sia272>3.0.co;2-q] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
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Cumpson PJ, Seah MP. Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments. SURF INTERFACE ANAL 1997. [DOI: 10.1002/(sici)1096-9918(199706)25:6%3c430::aid-sia254%3e3.0.co;2-7] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
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Cumpson PJ, Seah MP. Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments. SURF INTERFACE ANAL 1997. [DOI: 10.1002/(sici)1096-9918(199706)25:6<430::aid-sia254>3.0.co;2-7] [Citation(s) in RCA: 449] [Impact Index Per Article: 16.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
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Jablonski A, Tilinin IS, Powell CJ. Mean escape depth of signal photoelectrons from amorphous and polycrystalline solids. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 54:10927-10937. [PMID: 9984892 DOI: 10.1103/physrevb.54.10927] [Citation(s) in RCA: 33] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Turner NH, Schreifels JA. Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy. Anal Chem 1996. [DOI: 10.1021/a19600146] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Affiliation(s)
- Noel H. Turner
- Chemistry Division, Naval Research Laboratory, Washington, D.C. 20375-5342
| | - John A. Schreifels
- Department of Chemistry, George Mason University, Fairfax, Virginia 22030
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Alkemade PF, Flinn L, Lennard WN, Mitchell IV. Spectra of secondary electrons induced by channeled and nonchanneled ions in Si and Al. PHYSICAL REVIEW. A, ATOMIC, MOLECULAR, AND OPTICAL PHYSICS 1996; 53:886-894. [PMID: 9912962 DOI: 10.1103/physreva.53.886] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/22/2023]
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Gries WH. A Universal Predictive Equation for the Inelastic Mean Free Pathlengths of X-ray Photoelectrons and Auger Electrons. SURF INTERFACE ANAL 1996. [DOI: 10.1002/(sici)1096-9918(199601)24:1%3c38::aid-sia84%3e3.0.co;2-h] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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Gries WH. A Universal Predictive Equation for the Inelastic Mean Free Pathlengths of X-ray Photoelectrons and Auger Electrons. SURF INTERFACE ANAL 1996. [DOI: 10.1002/(sici)1096-9918(199601)24:1<38::aid-sia84>3.0.co;2-h] [Citation(s) in RCA: 173] [Impact Index Per Article: 6.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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Werner WSM, Tilinin IS, Jablonski A. Efficient calculation of photoelectron angular distribution. SURF INTERFACE ANAL 1995. [DOI: 10.1002/sia.740231205] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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Werner WS. Influence of multiple elastic and inelastic scattering on photoelectron line shape. PHYSICAL REVIEW. B, CONDENSED MATTER 1995; 52:2964-2975. [PMID: 9981369 DOI: 10.1103/physrevb.52.2964] [Citation(s) in RCA: 33] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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18
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Alkemade PFA. Fast simulation of XPS and AES spectra by transformations of electron trajectories. SURF INTERFACE ANAL 1995. [DOI: 10.1002/sia.740230704] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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Ding ZJ, Shimizu R. Effect of elastic scattering and cylindrical mirror analyser geometry on the evaluation of escape depths of auger electrons. SURF INTERFACE ANAL 1995. [DOI: 10.1002/sia.740230603] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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