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For: Tai KL, Huang CW, Cai RF, Huang GM, Tseng YT, Chen J, Wu WW. Atomic-Scale Fabrication of In-Plane Heterojunctions of Few-Layer MoS2 via In Situ Scanning Transmission Electron Microscopy. Small 2020;16:e1905516. [PMID: 31825564 DOI: 10.1002/smll.201905516] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/26/2019] [Revised: 11/14/2019] [Indexed: 06/10/2023]
Number Cited by Other Article(s)
1
Chen Y, Chou TC, Fang CH, Lu CY, Hsiao CN, Hsu WT, Chen CC. Direct observation of single-atom defects in monolayer two-dimensional materials by using electron ptychography at 200 kV acceleration voltage. Sci Rep 2024;14:277. [PMID: 38167628 PMCID: PMC10761697 DOI: 10.1038/s41598-023-50784-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/02/2023] [Accepted: 12/25/2023] [Indexed: 01/05/2024]  Open
2
Gavhane D, Sontakke AD, van Huis MA. Thermolysis-Driven Growth of Vanadium Oxide Nanostructures Revealed by In Situ Transmission Electron Microscopy: Implications for Battery Applications. ACS APPLIED NANO MATERIALS 2023;6:7280-7289. [PMID: 37205293 PMCID: PMC10186331 DOI: 10.1021/acsanm.3c00397] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Indexed: 05/21/2023]
3
Boebinger MG, Brea C, Ding LP, Misra S, Olunloyo O, Yu Y, Xiao K, Lupini AR, Ding F, Hu G, Ganesh P, Jesse S, Unocic RR. The Atomic Drill Bit: Precision Controlled Atomic Fabrication of 2D Materials. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2023;35:e2210116. [PMID: 36635517 DOI: 10.1002/adma.202210116] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/01/2022] [Revised: 01/02/2023] [Indexed: 06/17/2023]
4
Tseng YT, Lu LS, Shen FC, Wang CH, Sung HY, Chang WH, Wu WW. In Situ Atomic-Scale Observation of Monolayer MoS2 Devices under High-Voltage Biasing via Transmission Electron Microscopy. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022;18:e2106411. [PMID: 34995002 DOI: 10.1002/smll.202106411] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/21/2021] [Revised: 11/27/2021] [Indexed: 06/14/2023]
5
Growth Mechanism of Periodic-Structured MoS2 by Transmission Electron Microscopy. NANOMATERIALS 2021;12:nano12010135. [PMID: 35010085 PMCID: PMC8796029 DOI: 10.3390/nano12010135] [Citation(s) in RCA: 10] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/18/2021] [Revised: 12/17/2021] [Accepted: 12/30/2021] [Indexed: 12/28/2022]
6
Ta HQ, Mendes RG, Liu Y, Yang X, Luo J, Bachmatiuk A, Gemming T, Zeng M, Fu L, Liu L, Rümmeli MH. In Situ Fabrication of Freestanding Single-Atom-Thick 2D Metal/Metallene and 2D Metal/ Metallene Oxide Membranes: Recent Developments. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2021;8:e2100619. [PMID: 34459155 PMCID: PMC8529443 DOI: 10.1002/advs.202100619] [Citation(s) in RCA: 11] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/16/2021] [Revised: 06/23/2021] [Indexed: 05/13/2023]
7
Tan S. Transmission Electron Microscopy: Applications in Nanotechnology. IEEE NANOTECHNOLOGY MAGAZINE 2021. [DOI: 10.1109/mnano.2020.3037432] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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