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For: Hu J, Wang X, Zhang G, Jiang P, Chen W, Hao Y, Ma X, Xu S, Jia J, Kong L, Wang H. QTL mapping for yield-related traits in wheat based on four RIL populations. Theor Appl Genet 2020;133:917-933. [PMID: 31897512 DOI: 10.1007/s00122-019-03515-w] [Citation(s) in RCA: 37] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/19/2019] [Accepted: 12/17/2019] [Indexed: 05/24/2023]

For:	Hu J, Wang X, Zhang G, Jiang P, Chen W, Hao Y, Ma X, Xu S, Jia J, Kong L, Wang H. QTL mapping for yield-related traits in wheat based on four RIL populations. Theor Appl Genet 2020;133:917-933. [PMID: 31897512 DOI: 10.1007/s00122-019-03515-w] [Citation(s) in RCA: 37] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/19/2019] [Accepted: 12/17/2019] [Indexed: 05/24/2023]

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(The first 100,000 artilces are displayed in RCA.)