Application of 2D correlation methods to the analysis of XPS spectra of ion irradiated poly (ether ether ketone)

Wide angle X-ray diffraction patterns and 2D-correlation spectroscopy of crystallization in proton irradiated poly(ether ether ketone)

Proton irradiated poly (ether ether ketone) (PEEK) films were crystallized to different extents, and subsequently characterized by wide angle X-ray diffraction technique. The data were analyzed by two-dimensional correlation mapping (2D-CM), in particular: Generalized, hybrid and multiple perturbations correlation approaches. Two asynchronous correlation peaks at (19.1, 18.7) ^o and at (22.5, 19.1) ^o were utilized as a measure the crystal perfection and the preferred process; orientation/crystal growth respectively. Proton irradiation not only favored the formation of crystal form II, but also changed the type of orientation within the irradiated films. Differential scanning calorimetry and Raman spectroscopic analysis confirmed the contribution of the previous two factors. Raman spectra indicated that the intensity of both bands at 1595 and 1608 cm⁻¹ decreased on samples crystallized from the melt, but increased on cold crystallized samples. 2D-CM combined with other suitable techniques is a promising in evaluating the structure of polymers and revealing the effect of proton irradiation.

Influence of 25 MeV Si ions and 25 MeV O ions on the chemical and structural properties of PEEK films

Poly (ether ether ketone) (PEEK) material can be used in a wide variety of fields, such as the aerospace, automotive, electronics, and nuclear industries. In this research, the irradiation effect of 25 MeV Si ions and 25 MeV O ions on the PEEK films was studied, focusing on the changes in chemical and structural properties. By analyzing surface morphology and microstructure evolution of the PEEK films after 25 MeV Si ion and 25 MeV O ion irradiation, particles were generated on surface of the PEEK after 25 MeV Si ion irradiation and black dots were generated on surface of the PEEK after 25 MeV O ion irradiation. The irradiation reduced the surface roughness of the PEEK films from the atomic force microscopy (AFM) results. The Fourier transform infrared (FTIR) results indicated that the groups and structure of the material were not changed by irradiation. The X-ray photoelectron spectroscopy (XPS) results showed that the contents of the chemical bonds C–C, C=O increased first and then decreased with the increasing of the fluences. The generated free radicals were observed by the electron paramagnetic resonance spectroscopy (EPR) at room temperature and the irradiation degradation mechanisms were analyzed. Thermal properties of the PEEK irradiated by 25 MeV O ions, indicating that a new secondary crystallization peak was found during the cooling stage. Consequently, the low fluences irradiation improves in the viscoelasticity and mechanical properties of PEEK films, while the high fluences irradiation reduces its performance.