Micromorphology and microtexture evaluation of poly(o-ethoxyaniline) films using atomic force microscopy and fractal analysis

Investigation of deposition temperature effect on spatial patterns of MgF2 thin films

In this work, the atomic force microscopy (AFM) technique was used to characterize 3D MgF₂ thin film surfaces through advanced analysis involving morphological, fractal, multifractal, succolarity, lacunarity and surface entropy (SE) parameters, consistent with ISO 25178-2: 2012. Samples were synthesized by electron beam deposition, grown in three different temperatures. Three different temperatures of 25°C (laboratory temperature), 150 and 300°C were chosen. The temperature of 300°C is usually the highest temperature that can be deposited with the electron beam evaporation coating system. The substrates were made of glass (diameter 16 mm, thickness 3 mm), and the samples were prepared at a pressure of 5 × 10^-5  Torr. The statistical results from the AFM images indicate that topographic asperities decrease with increasing deposition temperature, showing a decrease in roughness values. Regardless of the deposition temperature, all surfaces have a self-similar behavior, presenting a very linear PSD distribution, and, according to our results, the sample deposited at 300° had the highest spatial complexity. On the other hand, surface percolation is increasing when temperature increases, indicating that its low roughness and high spatial complexity play an important role on the formation of their most percolating surface microtexture. Our results demonstrate that the lower deposition temperature promoted the formation of less discontinuous height distributions in the MgF₂ films.

Vapor Barrier Properties of Cold Plasma Treated Corn Starch Films

The development and efficient production of effective bioplastics is a hot topic, required to face up to the issue of the difficult disposal of plastics derived from oil. Among the different natural sources of bioplastics, starch is one of the most promising. However, for most applications, the proper mastering of the surface properties of bioplastic is necessary. We report about the surface modification of extruded corn starch films by means of cold plasma based on helium (He) and hexamethyldisiloxane (HMDSO). The differently treated surfaces were functionally characterized in wettability and water absorption. The nanoscale morphology was assessed by scanning electron microscopy and atomic force microscopy. The obtained images were analyzed by advanced figures describing both texture and amplitude parameters, including fractal behavior. The combined treatment (He/HMDSO) resulted in more homogeneous films with smaller, better-distributed grains compared to the case wherein He was not used. Despite the different morphologies observed, starch coated by HMDSO alone and by He/HMDSO presented similar hydrophobic character, with contact angles higher than 110°. Plasma treatment with HMDSO and He/HMDSO resulted in a significant reduction of absorbed water content without reduction of water vapor permeability. The nanotexture of the films did not present statistically significant differences, in terms of spatial complexities, dominant spatial frequencies, homogeneous void distribution, and surface percolation.

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

Dinizia excelsa Ducke under three different cut conditions were carefully analyzed. The morphology and stereometry of different wood cutting surfaces (longitudinal radial, longitudinal tangential, and transversal) were studied by SEM and AFM. The results obtained in this study suggest that both the height parameters and the advanced stereometric parameters of the surfaces did not reveal a significant difference, indicating that the spatial patterns do not change according to the type of cut. In this way, the surface microtexture does not vary depending on the cut type. Similarly, the Hurst's coefficients did not show any significant difference in the spectrum of the PSD fractal region. On the other hand, Minkowski functionals presented a morphological difference between the samples. These results showed that the microtexture of the wood surface does not change as a function of the type of cut submitted to the same polishing process.

Investigation of Stereometric and Fractal Patterns of Spin-Coated LuMnO3 Thin Films

In this paper, we have performed qualitative and quantitative analysis of LuMnO3 thin films surfaces, deposited by spin coating over Pt(111)/TiO2/SiO2/Si substrates, to evaluate their spatial patterns as a function of the film’s sintering temperature. Atomic force microscopy was employed to obtain topographic maps that were extensively analyzed via image processing techniques and mathematical tools. 3D (three-dimensional) topographical images revealed that films sintered at 650°C and 750°C presented the formation of smoother surfaces, while the film sintered at 850°C displayed a rougher surface with a root mean square roughness of ∼2.5 nm. On the other direction, the height distribution of the surface for all films has similar asymmetries and shape, although the film sintered using the highest temperature showed the lower density of rough peaks and a sharper peak shape. The advanced fractal parameters revealed that the film sintered at 850°C is dominated by low spatial frequencies, showing less spatial complexity, higher microtexture homogeneity, and uniform height distribution. These results suggest that the combination of stereometric and fractal parameters can be especially useful for identification of unique topographic spatial patterns in LuMnO3 thin films, helping in their implementation in technological applications, such as photovoltaic solar cells and information magnetic date storage and spintronic devices.

Fractal-Stereometric Correlation of Nanoscale Spatial Patterns of GdMnO3 Thin Films Deposited by Spin Coating

Multiferroic systems are of great interest for technological applications. To improve the fabrication of thin films, stereometric and fractal analysis of surface morphology have been extensively performed to understand the influence of physical parameters on the quality of spatial patterns. In this work, GaMnO3 was synthesized and thin films were deposited on Pt(111)/TiO2/SiO2/Si substrates using a spin coating apparatus to study the correlation between their stereometric and fractal parameters. All films were studied by X-ray diffraction (XRD), where the structure and microstructure of the film sintered at 850 °C was investigated by Rietveld refinement. Topographic maps of the films were obtained using an atomic force microscope (AFM) in tapping mode. The results show that the film sintered at 850 °C exhibited a clear formation of a GdMnO3 orthorhombic structure with crystallite size of ~14 nm and a microstrain higher than other values reported in the literature. Its surface morphology presented a rougher topography, which was confirmed by the height parameters. Topographic differences due to different asymmetries and shapes of the height distributions between the films were observed. Specific stereometric parameters also showed differences in the morphology and microtexture of the films. Qualitative rendering obtained by commercial image processing software revealed substantial differences between the microtextures of the films. Fractal and advanced fractal parameters showed that the film sintered at 850 °C had greater spatial complexity, which was due to their higher topographic roughness, lower surface percolation and greater topographic uniformity, being dominated by low dominant special frequencies. Our combination of stereometric and fractal measurements can be useful to improve the fabrication process by optimizing spatial patterns as a function of the sintering temperature of the film.