Shakoury R, Talebani N, Zelati A, Ţălu Ş, Arman A, Mirzaei S, Jafari A. The effect of thickness and film homogeneity on the optical and microstructures of the ZrO2 thin films prepared by electron beam evaporation method.
OPTICAL AND QUANTUM ELECTRONICS 2021;
53:441. [DOI:
10.1007/s11082-021-03079-4]
[Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/03/2020] [Accepted: 06/16/2021] [Indexed: 02/07/2023]