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For: Kim K, Yoon JC, Kim J, Kim JH, Lee SW, Yoon A, Lee Z. Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene. Appl Microsc 2019;49:3. [PMID: 33580404 PMCID: PMC7818284 DOI: 10.1007/s42649-019-0005-5] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/17/2019] [Accepted: 02/12/2019] [Indexed: 12/02/2022] Open

For:	Kim K, Yoon JC, Kim J, Kim JH, Lee SW, Yoon A, Lee Z. Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene. Appl Microsc 2019;49:3. [PMID: 33580404 PMCID: PMC7818284 DOI: 10.1007/s42649-019-0005-5] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/17/2019] [Accepted: 02/12/2019] [Indexed: 12/02/2022] Open

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(The first 100,000 artilces are displayed in RCA.)