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For: Pabst W. Depth profile determination by ion-induced X-ray spectroscopy. ACTA ACUST UNITED AC 1974. [DOI: 10.1016/0029-554x(74)90028-7] [Citation(s) in RCA: 30] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
Number Cited by Other Article(s)
1
Overview of methods for determining the depth distribution of elements in X-ray fluorescence analysis. Radiat Phys Chem Oxf Engl 1993 2022. [DOI: 10.1016/j.radphyschem.2022.110388] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022]
2
Folkmann F. Analytical use of ion-induced X-rays. ACTA ACUST UNITED AC 2001. [DOI: 10.1088/0022-3735/8/6/001] [Citation(s) in RCA: 66] [Impact Index Per Article: 2.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
3
The angle-resolved self-ratio technique for surface depth profile investigations by XFS, EMA, XPS and AES. Mikrochim Acta 1992. [DOI: 10.1007/bf01244466] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
4
Regnier P, Brissaud I. On depth profiling from PIXE yields. J Radioanal Nucl Chem 1987. [DOI: 10.1007/bf02165319] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
5
Geretschlàger M. Determination of three parameters of a depth profile of foreign atoms in bulk material using pixe analysis. ACTA ACUST UNITED AC 1982. [DOI: 10.1016/0167-5087(82)90477-x] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
6
Clayton E. Sample characterization by proton induced x-ray emission analysis. ACTA ACUST UNITED AC 1982. [DOI: 10.1016/0378-5963(82)90022-8] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
7
Gries WH, Wybenga FT. Determination of the centroid depths of shallow impurity profiles by X-ray fluorescence spectrometry. SURF INTERFACE ANAL 1981. [DOI: 10.1002/sia.740030605] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
8
The production and use of a nuclear microprobe of ions at MeV energies. ACTA ACUST UNITED AC 1979. [DOI: 10.1016/0029-554x(79)90631-1] [Citation(s) in RCA: 138] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
9
Concentration profile determination by pixe analysis utilizing the variation of beam energy. ACTA ACUST UNITED AC 1978. [DOI: 10.1016/0029-554x(78)91005-4] [Citation(s) in RCA: 30] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
10
Benka O, Geretschläger M, Kropf A. Using proton-induced X-rays to determine three parameters of the depth profile of foreign atoms in bulk material. ACTA ACUST UNITED AC 1978. [DOI: 10.1016/0029-554x(78)90905-9] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
11
A method of determining the depth of impurities by proton-induced X-rays. ACTA ACUST UNITED AC 1977. [DOI: 10.1016/0029-554x(77)90812-6] [Citation(s) in RCA: 17] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
12
Analytical application of particle induced X-ray emission. ACTA ACUST UNITED AC 1976. [DOI: 10.1016/0029-554x(76)90470-5] [Citation(s) in RCA: 572] [Impact Index Per Article: 11.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
13
Simple depth profile determination by proton-induced x-ray emission. ACTA ACUST UNITED AC 1975. [DOI: 10.1016/0029-554x(75)90345-6] [Citation(s) in RCA: 34] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
14
Ion-induced X-ray spectroscopy as a method to determine the depth distribution of trace elements. ACTA ACUST UNITED AC 1975. [DOI: 10.1016/0029-554x(75)90395-x] [Citation(s) in RCA: 43] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
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