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For: Rigo S, Cohen C, L'hoir A, Backelandt E. Precision absolute thin film standard reference targets for Rutherford backscattering microanalysis. ACTA ACUST UNITED AC 1978. [DOI: 10.1016/0029-554x(78)90958-8] [Citation(s) in RCA: 26] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Number Cited by Other Article(s)
1
Cohen C, Siejka J, Berti M, Drigo AV, Croset M, Tosic MM. Study of ytterbium implanted calcia stabilized zirconia thin films and yttria stabilized zirconia single crystals. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/00337578208223016] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
2
Cohen C, Benyagoub A, Bernas H, Chaumont J, Thomé L, Berti M, Drigo AV. Transformation to amorphous state of metals by ion implantation: P in Ni. PHYSICAL REVIEW. B, CONDENSED MATTER 1985;31:5-14. [PMID: 9935392 DOI: 10.1103/physrevb.31.5] [Citation(s) in RCA: 50] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
3
Amsel G, Davies J. Precision standard reference targets for microanalysis by nuclear reactions. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0167-5087(83)90976-6] [Citation(s) in RCA: 17] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
4
Cohen C, Davies J, Drigo A, Jackman T. Intercomparison of absolute standards for RBS studies. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0167-5087(83)90970-5] [Citation(s) in RCA: 54] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
5
Pribat D, Dieumegard D, Croset M, Cohen C, Nipoti R, Siejka J, Bentini G, Correra L, Servidori M. Ion implantation of silicon in gallium arsenide: Damage and annealing characterizations. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0167-5087(83)90876-1] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
6
Evidence for implantation-induced impurity diffusion in metals. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0167-5087(83)90917-1] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
7
Multiple scattering of MeV light ions transmitted through thin Al2O3 films: Detailed analysis of angular distributions. ACTA ACUST UNITED AC 1982. [DOI: 10.1016/0029-554x(82)90493-1] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
8
Tošić M, Drigo A, Cohen C, Thome L, Chaumont J, Bernas H, Carnera A. Formation of epitaxial NiO by Oxygen implantation in [100] Ni. ACTA ACUST UNITED AC 1981. [DOI: 10.1016/0029-554x(81)90704-7] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
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