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For: Grosse P. Fourier transform IR analysis of thin solid films. Trends Analyt Chem 1989. [DOI: 10.1016/0165-9936(89)87006-2] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/17/2022]
Number Cited by Other Article(s)
1
Boltar K, Fedirko V. Modeling and experimental FTS investigation of IR reflectance spectra from multilayered semiconductor structures. J Mol Struct 1995. [DOI: 10.1016/0022-2860(95)08767-p] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
2
The challenge of microelectronics for analytical chemistry. ACTA ACUST UNITED AC 1990. [DOI: 10.1007/bf00323103] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
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