Reference Citation Analysis: Find an Article, Find a Category, Find a Journal, Find a Scholar

For: Liu J, Cheng Y, Cowley J, Stearns M. High-angle annular dark-field microscopy of Mo/Si multilayer structures. Ultramicroscopy 1992. [DOI: 10.1016/0304-3991(92)90132-4] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]

For:	Liu J, Cheng Y, Cowley J, Stearns M. High-angle annular dark-field microscopy of Mo/Si multilayer structures. Ultramicroscopy 1992. [DOI: 10.1016/0304-3991(92)90132-4] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]

Number	Cited by Other Article(s)
1	Gajdardziska-Josifovska M, Weiss J, Cowley J. Studies of Mo/Si multilayers with coherent electron beams. Ultramicroscopy 1995. [DOI: 10.1016/0304-3991(94)00179-q] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/17/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse

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Cited by Other Article(s)

Gajdardziska-Josifovska M, Weiss J, Cowley J. Studies of Mo/Si multilayers with coherent electron beams. Ultramicroscopy 1995. [DOI: 10.1016/0304-3991(94)00179-q] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/17/2022]