McCartney MR, Dunin-Borkowski RE, Smith DJ. Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunities.
Ultramicroscopy 2019;
203:105-118. [PMID:
30772077 DOI:
10.1016/j.ultramic.2019.01.008]
[Citation(s) in RCA: 16] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/30/2018] [Revised: 12/27/2018] [Accepted: 01/21/2019] [Indexed: 12/01/2022]
Abstract
Off-axis electron holography has evolved into a powerful electron-microscopy-based technique for characterizing electromagnetic fields with nanometer-scale resolution. In this paper, we present a review of the application of off-axis electron holography to the quantitative measurement of electrostatic potentials and charge density distributions. We begin with a short overview of the theoretical and experimental basis of the technique. Practical aspects of phase imaging, sample preparation and microscope operation are outlined briefly. Applications of off-axis electron holography to a wide range of materials are then described in more detail. Finally, challenges and future opportunities for electron holography investigations of electrostatic fields and charge density distributions are presented.
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