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Li SX, Huang GY, Xia H, Fu T, Wang XJ, Zeng X, Liu X, Yu YH, Chen QD, Lin L, Sun HB. Nanoimprint crystalithography for organic semiconductors. Nat Commun 2025; 16:3636. [PMID: 40240411 PMCID: PMC12003769 DOI: 10.1038/s41467-025-58934-9] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/07/2023] [Accepted: 04/07/2025] [Indexed: 04/18/2025] Open
Abstract
Organic semiconductor crystals (OSCs) offer mechanical flexibility, high carrier mobility, and tunable electronic structures, making them promising for optoelectronic and photonic applications. However, traditional lithographic techniques damage OSCs due to high-energy beams or solvents, leading to high defect densities, poor uniformity, and significant device-to-device variation. Existing methods also struggle to eliminate residual layers while forming independent, complex two-dimensional patterns. A chemical-free nanoimprint crystallography (NICL) method is introduced to overcome these challenges by balancing residual-layer-free nanoimprinting with the fabrication of independent, complex 2D patterns. In situ control of crystallization kinetics via temperature gradient adjustment yields OSC nanostructures with low defect densities and good uniformity. Patterning of various OSCs over a range of feature sizes is demonstrated. The patterned OSCs exhibit good lasing performance and low device-to-device variation (as low as 2%), indicating that NICL is a promising approach for fabricating high-performance, uniform OSC-based devices.
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Affiliation(s)
- Shun-Xin Li
- State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, China
- College of Physics, Jilin University, Changchun, China
| | - Guan-Yao Huang
- Beijing Institute of Technology Zhuhai, Zhuhai, China
- MIIT Key Laboratory of Complex-field Intelligent Exploration, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China
- Key Laboratory for Thermal Science and Power Engineering of Ministry of Education, Beijing Key Laboratory of CO2 Utilization and Reduction Technology, Department of Energy and Power Engineering, Tsinghua University, Beijing, China
| | - Hong Xia
- State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, China.
| | - Tairan Fu
- Key Laboratory for Thermal Science and Power Engineering of Ministry of Education, Beijing Key Laboratory of CO2 Utilization and Reduction Technology, Department of Energy and Power Engineering, Tsinghua University, Beijing, China
| | - Xiao-Jie Wang
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, China
| | - Xin Zeng
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing, China
- University of Chinese Academy of Sciences, Beijing, China
| | - Xinfeng Liu
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing, China
- University of Chinese Academy of Sciences, Beijing, China
| | - Yan-Hao Yu
- State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, China
| | - Qi-Dai Chen
- State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, China
| | - Linhan Lin
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, China.
| | - Hong-Bo Sun
- State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, China.
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, China.
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Azuma K, Son D, Marumoto K, Kijima M, Shimoi Y. Electron Spin Resonance of Thin Films of N,N′-Di(1-naphthyl)-N,N′-diphenylbenzidine (NPB) Doped by Iodine Vapor. CHEM LETT 2012. [DOI: 10.1246/cl.2012.191] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
Affiliation(s)
- Kenta Azuma
- Institute of Materials Science, University of Tsukuba
| | - Donghyun Son
- Institute of Materials Science, University of Tsukuba
| | - Kazuhiro Marumoto
- Institute of Materials Science, University of Tsukuba
- Japan Science and Technology Agency (JST), PRESTO
| | | | - Yukihiro Shimoi
- Nanosystem Research Institute (NRI), National Institute of Advanced Industrial Science and Technology (AIST)
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Muraki N, Miyamoto T, Yoshikawa M. Depth profile analysis of organic multi-layer device with nanometer resolution using surface-enhanced Raman spectroscopy. Chem Phys Lett 2010. [DOI: 10.1016/j.cplett.2010.09.040] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/19/2022]
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Jankus V, Winscom C, Monkman AP. Dynamics of triplet migration in films of N, N'-diphenyl-N, N'-bis(1-naphthyl)-1, 1'-biphenyl-4, 4''-diamine. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2010; 22:185802. [PMID: 21393693 DOI: 10.1088/0953-8984/22/18/185802] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/22/2023]
Abstract
We study triplet migration properties in NPB (N, N'-diphenyl-N, N'-bis(1-naphthyl)-1, 1'-biphenyl-4, 4''-diamine) films using time resolved gated spectroscopy and dispersive migration theory as our main tools of analysis. We show that in NPB, a well-known hole transporter in organic light emitting diodes, at high excitation densities triplet migration follows two regimes--a dispersive non-equilibrium regime (distinguished by exciton energetical relaxation within the distribution of hopping sites and as a consequence the hopping frequency being time dependent) that evolves into a second, non-dispersive equilibrium regime. Further, we observe a third region, which we term acceleration. From the turning over time between dispersive and non-dispersive dynamics, we deduce the width of the triplet density of states (DOS). We observe how the DOS variance changes when one decreases the thickness of the NPB film and note how surface effects are becoming important. Furthermore, the DOS variance of NPB changes when another organic layer is evaporated on top, namely Ir(piq)3 (tris(1-phenylisoquinoline)iridium(III)). We believe that these changes are due to the different polarizable media in contact with the NPB film, either vacuum or Ir(piq)3. We also show in this paper that the triplet level when time approaches zero is much higher in energy than the relaxed triplet levels, as quoted in most published papers; these values are thus incorrect for NPB. Lastly, it is possible that even at room temperature, the dispersive regime might be important for triplet migration at high initial triplet concentrations and might affect the diffusion length of triplets to a certain extent. However, more experimentation needs to be performed in order to address this question. Overall, we have characterized the triplet migration dynamics of NPB fully and shown that it agrees with previously published observations for other organic semiconductors and theoretical considerations.
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Affiliation(s)
- Vygintas Jankus
- OEM Research Group, Department of Physics, University of Durham, Durham DH1 3LE, UK
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