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For: Harris SB, Camata RP. X-ray diffraction data and analysis to support phase identification in FeSe and Fe7Se8 epitaxial thin films. Data Brief 2019;27:104778. [PMID: 31763420 PMCID: PMC6864172 DOI: 10.1016/j.dib.2019.104778] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/02/2019] [Revised: 10/30/2019] [Accepted: 10/31/2019] [Indexed: 10/31/2022]  Open
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