Investigation on structural, linear, nonlinear and optical limiting properties of sol-gel derived nanocrystalline Mg doped ZnO thin films for optoelectronic applications

Deposition of Sol-Gel ZnO:Mg Films and Investigation of Their Structural and Optical Properties

This work presents a facile sol-gel method for the deposition of ZnO and ZnO:Mg films. The films are spin coated on silicon and quartz substrates. The impact of magnesium concentrations (0, 0.5, 1, 2 and 3 wt%) and post-annealing treatments (300-600 °C) on the film's structural, vibrational and optical properties is investigated. Undoped ZnO films crystallize in the wurtzite phase, with crystallite sizes ranging from 9.1 nm (300 °C) to 29.7 nm (600 °C). Mg doping deteriorates the film crystallization and shifting of 002 peak towards higher diffraction angles is observed, indicating the successful incorporation of Mg into the ZnO matrix. ZnO:Mg films (2 wt%) possess the smallest crystallite size, ranging from 6.2 nm (300 °C) to 25.2 nm (600 °C). The highest Mg concentration (3 wt%) results into a segregation of the MgO phase. Lattice constants, texture coefficients and Zn-O bond lengths are discussed. The diminution of the c lattice parameter is related to the replacement of Zn²⁺ by Mg²⁺ in the ZnO host lattice. The vibrational properties are studied by Fourier transform infrared (FTIR) spectroscopy. IR lines related to Mg-O bonds are found for ZnO:Mg films with dopant concentrations of 2 and 3 wt%. The optical characterization showed that the transmittance of ZnO:Mg thin films increased from 74.5% (undoped ZnO) to about 89.1% and the optical band gap energy from 3.24 to 3.56 eV. Mg doping leads to a higher refractive index compared to undoped ZnO films. The FESEM (field emission scanning electron microscopy) technique is used for observation of the surface morphology modification of ZnO:Mg films. The doped ZnO films possess a smoother grained surface structure, opposite to the wrinkle-type morphology of undoped sol-gel ZnO films. The smoother surface leads to improved transparency of ZnO:Mg films.

Dual-Axis MEMS Resonant Scanner Using 128∘Y Lithium Niobate Thin-Film

The micro-electro-mechanical systems (MEMS) resonant scanners are in great demand for numerous light scanning applications. Recently, the development of LiDAR in micro-robotics and mobile devices has led to the requirement of ultra-small systems with low driving voltage, low power, compact size and high performance. We have first proposed the dual-axis MEMS scanner using the lithium niobate (LN) thin-film platform, which is expected to fulfill the requirement. This paper describes the actuation principle and scanner structure, meanwhile develops the analytical model for the scanner. The analytical model is later validated by the finite element analysis. The performance of the proposed scanner is improved with the optimization of the orientation of LN and layer thickness. The proposed scanner achieves the θopt·D·f up to 937.8∘·mm·kHz in simulation. The simulated optical angle in the x-axis and y-axis are 50∘ and 42∘ at 1 V, corresponding to resonant frequencies of 79.9 kHz and 558.2 kHz, respectively. With the superior performance of large deflection, high scanning frequency, high figure of merit and low voltage, the proposed MEMS scanner is a promising candidate for fast scanner applications (e.g., wavelength-selective switches and submicron biomedical system), especially the application of LiDAR in mobile devices or micro-robotics.