Structural and magnetic domains characterization of magnetite nanoparticles

Origin of Magnetization in Silica-coated Fe3O4 Nanoparticles Revealed by Soft X-ray Magnetic Circular Dichroism

Abstract

Magnetite (Fe₃O₄) nanoparticles (NPs) and SiO₂-coated Fe₃O₄ nanoparticles have successfully been synthesized using co-precipitation and modified Stöber methods, respectively. The samples were characterized using X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy, high-resolution transmission electron microscopy (HRTEM), vibrating sample magnetometer (VSM) techniques, X-ray absorption spectroscopy (XAS), and X-ray magnetic circular dichroism (XMCD). XRD and FTIR data confirmed the structural configuration of a single-phase Fe₃O₄ and the successful formation of SiO₂-coated Fe₃O₄ NPs. XRD also confirmed that we have succeeded to synthesize nano-meter size of Fe₃O₄ NPs. HRTEM images showed the increasing thickness of SiO₂-coated Fe₃O₄ with the addition of the Tetraethyl Orthosilicate (TEOS). Room temperature VSM analysis showed the magnetic behaviour of Fe₃O₄ and its variations that occurred after SiO₂ coating. The magnetic behaviour is further authenticated by XAS spectra analysis which cleared about the existence of SiO₂ shells that have transformed the crystal as well as the local structures of the magnetite NPs. We have performed XMCD measurements, which is a powerful element-specific technique to find out the origin of magnetization in SiO₂-coated Fe₃O₄ NPs, that verified a decrease in magnetization with increasing thickness of the SiO₂ coating.

Graphical Abstract

Magnetite (Fe₃O₄) nanoparticles (NPs) and SiO₂-coated Fe₃O₄ nanoparticles have successfully been synthesized using co-precipitation and modified Stöber methods, respectively. The samples were characterized using X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy, high-resolution transmission electron microscopy (HRTEM), vibrating sample magnetometer (VSM) techniques, X-ray absorption spectroscopy (XAS), and X-ray magnetic circular dichroism (XMCD). XRD and FTIR data confirmed the structural configuration of a single-phase Fe₃O₄ and the successful formation of SiO₂-coated Fe₃O₄ NPs. XRD also confirmed that we have succeeded to synthesize nano-meter size of Fe₃O₄ NPs. HRTEM images showed the increasing thickness of SiO₂-coated Fe₃O₄ with the addition of the Tetraethyl Orthosilicate (TEOS). Room temperature VSM analysis showed the magnetic behaviour of Fe₃O₄ and its variations that occurred after SiO₂ coating. The magnetic behaviour is further authenticated by XAS spectra analysis which cleared about the existence of SiO₂ shells that have transformed the crystal as well as the local structures of the magnetite NPs. We have performed XMCD measurements, which is a powerful element-specific technique to find out the origin of magnetization in SiO₂-coated Fe₃O₄ NPs, that verified a decrease in magnetization with increasing thickness of the SiO₂ coating.

Field gradient imaging of nanoparticle systems: analysis of geometry and surface coating effects

In this work we compare the standard imaging of various types of nanoparticles deposited on surfaces by atomic force microscopy (AFM) with a complementary analysis of the same samples by either electrostatic force microscopy (EFM) or magnetic force microscopy (MFM). Experiments were carried out on gold nanoparticles (decahedrons and stars) and two different iron oxide systems: goethite (alpha-FeOOH) and hematite (alpha-Fe(2)O(3)). Regardless of the particular geometry, the EFM signal appears to be stronger on edges or tips of pure gold nanoparticles. Both EFM and MFM experiments were also carried out on iron oxide particles. Apart from the structural analysis, we analyzed the influence of a shell layer deposited on the gold and iron oxide particles, the shell being amorphous SiO(2). Although the silica layer was found to have an insulating effect around the particles, in all cases EFM/MFM measurements could still be performed by the proper choice of the scan lift height (with an eventual slight increase of the sample bias, where applicable).