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For: Di Mascio S, Menicucci A, Furano G, Szewczyk T, Campajola L, Di Capua F, Lucaroni A, Ottavi M. Towards defining a simplified procedure for COTS system-on-chip TID testing. Nuclear Engineering and Technology 2018. [DOI: 10.1016/j.net.2018.07.010] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/28/2022]
Number Cited by Other Article(s)
1
Fried T, Di Buono A, Cheneler D, Cockbain N, Dodds JM, Green PR, Lennox B, Taylor CJ, Monk SD. Radiation testing of low cost, commercial off the shelf microcontroller board. NUCLEAR ENGINEERING AND TECHNOLOGY 2021. [DOI: 10.1016/j.net.2021.05.005] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/21/2022]
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