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For: Lin HH, Cheng SL, Chen LJ, Chen WC, Liou Y, Chien HC. Randomization of heavily damaged regions in annealed low energy Ge+-implanted (0 0 1)Si. Ultramicroscopy 2004;98:265-9. [PMID: 15046807 DOI: 10.1016/j.ultramic.2003.08.020] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/06/2003] [Revised: 07/10/2003] [Indexed: 11/18/2022]

For:	Lin HH, Cheng SL, Chen LJ, Chen WC, Liou Y, Chien HC. Randomization of heavily damaged regions in annealed low energy Ge+-implanted (0 0 1)Si. Ultramicroscopy 2004;98:265-9. [PMID: 15046807 DOI: 10.1016/j.ultramic.2003.08.020] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/06/2003] [Revised: 07/10/2003] [Indexed: 11/18/2022]

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