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For: Chen S, McMullan G, Faruqi AR, Murshudov GN, Short JM, Scheres SH, Henderson R. High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy. Ultramicroscopy 2013;135:24-35. [PMID: 23872039 PMCID: PMC3834153 DOI: 10.1016/j.ultramic.2013.06.004] [Citation(s) in RCA: 749] [Impact Index Per Article: 62.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/03/2013] [Revised: 06/04/2013] [Accepted: 06/08/2013] [Indexed: 12/03/2022]
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