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For: Winiarski B, Gholinia A, Mingard K, Gee M, Thompson G, Withers P. Broad ion beam serial section tomography. Ultramicroscopy 2017;172:52-64. [DOI: 10.1016/j.ultramic.2016.10.014] [Citation(s) in RCA: 38] [Impact Index Per Article: 4.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/29/2016] [Revised: 10/15/2016] [Accepted: 10/25/2016] [Indexed: 11/22/2022]

For:	Winiarski B, Gholinia A, Mingard K, Gee M, Thompson G, Withers P. Broad ion beam serial section tomography. Ultramicroscopy 2017;172:52-64. [DOI: 10.1016/j.ultramic.2016.10.014] [Citation(s) in RCA: 38] [Impact Index Per Article: 4.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/29/2016] [Revised: 10/15/2016] [Accepted: 10/25/2016] [Indexed: 11/22/2022]

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