Integrated correction of optical distortions for global HR-EBSD techniques

Weighted Burgers Vector analysis of orientation fields from high-angular resolution electron backscatter diffraction

The Weighted Burgers Vector (WBV) method can extract information about dislocation types and densities present in distorted crystalline materials from electron backscatter diffraction (EBSD) maps, using no assumptions about which slip systems might be present. Furthermore, high-angular resolution EBSD (HR-EBSD) uses a cross-correlation procedure to increase the angular precision of EBSD measurements by an order of magnitude compared to conventional EBSD. However, the WBV technique has not previously been applied to HR-EBSD data and therefore it remains unclear as to which low-angle substructures can be reliably characterised by WBV analysis of conventional EBSD data and which require additional HR-EBSD processing. To establish some practical examples that can be used to guide future data-acquisition strategies, we compare the output of the WBV method when applied to conventional EBSD data and HR-EBSD data collected from the most common minerals in Earth's lower crust (plagioclase feldspar) and upper mantle (olivine). The results demonstrate that HR-EBSD and WBV processing are complementary techniques. The increase in angular precision achieved with HR-EBSD processing allows low-angle (on the order of 0.1°) structures, which are obscured by noise in conventional EBSD data, to be analyzed quantitatively using the WBV method. Combining the WBV and HR-EBSD methods increases the precision of calculated WBV directions, which is essential when using information about active slip systems to infer likely deformation mechanisms from naturally deformed microstructures. This increase in precision is particularly important for low-symmetry crystals, such as plagioclase, that have a wide range of available slip systems that vary in relative activity with changing pressure, temperature and differential stress. Because WBV directions are calculated using no assumptions about which slip systems may be present, combining this technique with HR-EBSD to refine the precision of lattice orientation gradients is ideal for investigating complex natural materials with unknown deformation histories.

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)

For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP₀) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated in plastically deformed body-centred cubic and face-centred cubic ductile metals (ferrite and austenite grains in duplex stainless steel) and brittle single-crystal silicon, which showed that the effect is not only limited to measurement magnitude but also spatial distribution. An empirical relationship was then identified between the cross-correlation parameter and angular error, which was used in an iterative algorithm to identify the optimal reference pattern that maximises the precision of HR-EBSD.

Line-rotated remapping for high-resolution electron backscatter diffraction

A novel approach, termed line-rotated remapping (LRR), for high resolution electron backscatter diffraction is proposed to remap patterns with large rotation. In LRR, the displacements during the first-pass cross-correlation is modified to a function of the corresponding Kikuchi lines and the points on the reference pattern. Then, the finite rotation matrix to remap the test pattern to a similar orientation of the reference pattern is determined using the parameters of the Kikuchi lines. We apply LRR to simulated Si patterns with random orientations, and obtain measurement errors below ∼1.0 × 10^-3 for lattice rotations up to ∼26°. The maximum angle that may be remapped by LRR decreases with the distance between the specimen and the screen, which in turn reduces the number of matched Kikuchi lines. We also employ LRR in experiments to quantitatively characterize rotations and elastic strains of a Ni single crystal subject to nanoindentation and tension measurements. Although more experimental data on pattern center and image contrast are required to properly assess the performance of LRR, our method is a promising technique to improve strain measurements in the presence of large rotations.

A Comparative Investigation of the Effect of Microstructure and Crystallographic Data on Stress-Oriented Hydrogen Induced Cracking Susceptibility of API 5L X70 Pipeline Steel

In this research, stress-oriented hydrogen induced cracking (SOHIC) test was carried out on a 50 mm thickness of a commercial API 5L X70 steel plate. The evolution of microscopic features such as phase, boundary, interface, grain, and crystallographic data was analyzed before and after SOHIC, in order to comprehend the effect of crystallographic orientation on SOHIC propagation. Chemical composition and previous thermomechanical processing even finish rolling temperature and cooling rate determine the ferrite matrix microstructure. A recrystallized ultrafine ferrite grain with about 3−5% degenerated pearlite dispersed in the microstructure was characterized, called as-received specimen. The average lattice strain and dislocation density was calculated first using multiple Gaussian peak-fitting method from XRD pattern. Electrochemically charged combination mixed H2S-CO2 solution, constant hydrogen injection, and external loading were applied to tensile specimen, in order to simulate the H2S and CO2 environment. The results show that local misorientation and Taylor factor analyses predicted the possibility of hydrogen crack nucleation especially at boundaries and interfaces. Moreover, SOHIC crack propagation occurred along the mid-thickness of the cross section of steel plate along the ferritic boundaries, pearlitic colonies, and ferrite-cementite interfaces. Moreover, the crack propagated along distorted {110} and {001} grains, indicating a strong strain gradient towards the boundaries. The analysis of XRD patterns of SOHIC tested specimen by multiple Gaussian peak-fitting method estimated about 68% increment in micro-deformation and approximately 170% increase in dislocation density.